SSM9977GJ [SSC]

N-CHANNEL ENHANCEMENT-MODE POWER MOSFET; N沟道增强模式功率MOSFET
SSM9977GJ
型号: SSM9977GJ
厂家: SILICON STANDARD CORP.    SILICON STANDARD CORP.
描述:

N-CHANNEL ENHANCEMENT-MODE POWER MOSFET
N沟道增强模式功率MOSFET

文件: 总5页 (文件大小:262K)
中文:  中文翻译
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SSM9977GH,J  
N-CHANNEL ENHANCEMENT-MODE POWER MOSFET  
Low gate-charge  
BVDSS  
R DS(ON)  
ID  
60V  
90mW  
11A  
D
S
Simple drive requirement  
Fast switching  
G
Description  
G
The SSM9977GH is in a TO-252 package, which is widely used for  
commercial and industrial surface mount applications, and is well suited  
for low voltage applications such as DC/DC converters. The through-hole  
version, the SSM9977GJ in TO-251, is available for low-footprint vertical  
mounting. These devices are manufactured with an advanced process,  
providing improved on-resistance and switching performance.  
D
S
TO-252 (H)  
TO-251 (J)  
G
D
S
Pb-free lead finish (second-level interconnect)  
Absolute Maximum Ratings  
Symbol  
Parameter  
Rating  
60  
Units  
V
VDS  
VGS  
Drain-Source Voltage  
Gate-Source Voltage  
±25  
V
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current1  
ID @ TC=25°C  
ID @ TC=100°C  
IDM  
11  
A
7.1  
A
45  
A
PD @ TC=25°C  
Total Power Dissipation  
21  
W
Linear Derating Factor  
0.17  
W/°C  
°C  
°C  
TSTG  
TJ  
Storage Temperature Range  
Operating Junction Temperature Range  
-55 to 150  
-55 to 150  
Thermal Data  
Symbol  
Parameter  
Value  
6
Units  
°C/W  
°C/W  
Rthj-c  
Thermal Resistance Junction-case  
Thermal Resistance Junction-ambient  
Max.  
Max.  
Rthj-a  
110  
2/16/2005 Rev.2.2  
www.SiliconStandard.com  
1 of 5  
SSM9977GH,J  
Electrical Characteristics @ Tj=25oC (unless otherwise specified)  
Symbol  
BVDSS  
Parameter  
Test Conditions  
VGS=0V, ID=250uA  
Min. Typ. Max. Units  
Drain-Source Breakdown Voltage  
60  
-
-
0.04  
-
-
V
BVDSS/Tj  
Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=1mA  
Static Drain-Source On-Resistance2 VGS=10V, ID=5A  
VGS=4.5V, ID=4A  
-
V/°C  
m  
RDS(ON)  
-
90  
-
1
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
120 mΩ  
VGS(th)  
gfs  
Gate Threshold Voltage  
VDS=VGS, ID=250uA  
VDS=10V, ID=5A  
VDS=60V, VGS=0V  
VDS=48V ,VGS=0V  
VGS=±25V  
3
V
Forward Transconductance  
Drain-Source Leakage Current (T=25oC)  
7
-
S
IDSS  
uA  
uA  
nA  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
pF  
pF  
pF  
-
10  
j
Drain-Source Leakage Current (T=150oC)  
-
25  
j
IGSS  
Qg  
Gate-Source Leakage  
Total Gate Charge2  
Gate-Source Charge  
Gate-Drain ("Miller") Charge  
Turn-on Delay Time2  
Rise Time  
-
±100  
ID=5A  
6
10  
Qgs  
Qgd  
td(on)  
tr  
VDS=48V  
2
-
VGS=4.5V  
3
-
VDS=30V  
6
-
ID=5A  
11  
14  
2
-
td(off)  
tf  
Turn-off Delay Time  
Fall Time  
RG=3.3,VGS=10V  
RD=6Ω  
-
-
Ciss  
Coss  
Crss  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
VGS=0V  
485  
55  
40  
780  
VDS=25V  
-
-
f=1.0MHz  
Source-Drain Diode  
Symbol  
Parameter  
Test Conditions  
Min. Typ. Max. Units  
VSD  
trr  
Forward On Voltage2  
IS=5A, VGS=0V  
IS=5A, VGS=0V,  
dI/dt=100A/µs  
-
-
-
-
1.2  
V
Reverse Recovery Time  
Reverse Recovery Charge  
23  
28  
-
-
ns  
nC  
Qrr  
Notes:  
1.Pulse width limited by Max. junction temperature.  
2.Pulse width <300us , duty cycle <2%.  
2/16/2005 Rev.2.2  
www.SiliconStandard.com  
2 of 5  
SSM9977GH,J  
25  
20  
15  
10  
5
25  
20  
15  
10  
5
10V  
7.0V  
5.0V  
4.5V  
T C =25 o C  
10V  
7.0V  
T C = 150 o  
C
5.0V  
4.5V  
V G =3.0V  
V
G =3.0V  
0
0
0
2
4
6
8
0
2
4
6
8
V DS , Drain-to-Source Voltage (V)  
V DS , Drain-to-Source Voltage (V)  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
105  
2.0  
1.6  
1.2  
0.8  
0.4  
I D = 4 A  
I D =5A  
T
C =25 o C  
V
G =10V  
95  
85  
75  
-50  
0
50  
100  
150  
2
4
6
8
10  
V GS , Gate-to-Source Voltage (V)  
T j , Junction Temperature ( o C)  
Fig 3. On-Resistance vs. Gate Voltage  
Fig 4. Normalized On-Resistance  
vs. Junction Temperature  
6
1.5  
1.1  
0.7  
0.3  
5
4
3
2
1
0
T j =150 o C  
T j =25 o C  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
-50  
0
50  
100  
150  
T j , Junction Temperature ( o C)  
V SD , Source-to-Drain Voltage (V)  
Fig 5. Forward Characteristic of the  
Reverse Diode  
Fig 6. Gate Threshold Voltage vs.  
Junction Temperature  
2/16/2005 Rev.2.2  
www.SiliconStandard.com  
3 of 5  
SSM9977GH,J  
f=1.0MHz  
1000  
100  
10  
12  
10  
8
I D = 5 A  
C iss  
V DS =48V  
V DS =38V  
V
DS =30V  
6
C oss  
C rss  
4
2
0
0
4
8
12  
1
5
9
13  
17  
21  
25  
29  
Q G , Total Gate Charge (nC)  
V DS , Drain-to-Source Voltage (V)  
Fig 7. Gate Charge Characteristics  
Fig 8. Typical Capacitance Characteristics  
100  
1
Duty factor=0.5  
100us  
0.2  
10  
0.1  
0.1  
0.05  
1ms  
PDM  
0.02  
1
t
10ms  
0.01  
T
T C =25 o C  
100ms  
Single Pulse  
Duty factor = t/T  
DC  
Single Pulse  
Peak Tj = PDM x Rthjc + TC  
0.1  
0.01  
0.00001  
0.1  
1
10  
100  
1000  
0.0001  
0.001  
0.01  
0.1  
1
V DS , Drain-to-Source Voltage (V)  
t , Pulse Width (s)  
Fig 9. Maximum Safe Operating Area  
Fig 10. Effective Transient Thermal Impedance  
VG  
VDS  
90%  
QG  
4.5V  
QGD  
QGS  
10%  
VGS  
tr  
td(on)  
td(off) tf  
Q
Charge  
Fig 11. Switching Time Waveform  
Fig 12. Gate Charge Waveform  
2/16/2005 Rev.2.2  
www.SiliconStandard.com  
4 of 5  
SSM9977GH,J  
Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no  
guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no  
responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its  
use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including  
without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to  
the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of  
Silicon Standard Corporation or any third parties.  
2/16/2005 Rev.2.2  
www.SiliconStandard.com  
5 of 5  

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