AMC1311BQDWVRQ1 [TI]
汽车类 2V 输入、精密电压检测增强型隔离式放大器
| DWV | 8 | -40 to 125;
| 型号： | AMC1311BQDWVRQ1 |
| 厂家： | 
TEXAS INSTRUMENTS |
| 描述： | 汽车类 2V 输入、精密电压检测增强型隔离式放大器 | DWV | 8 | -40 to 125 放大器 分离技术 隔离技术 光电二极管 |
| 文件： | 总37页 (文件大小：1729K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
AMC1311-Q1
SBAS897C – MARCH 2018 – REVISED JUNE 2022
AMC1311x-Q1 Automotive, High-Impedance, 2-V Input, Reinforced Isolated Amplifiers
1 Features
3 Description
•
AEC-Q100 qualified for automotive applications:
– Temperature grade 1: –40°C to +125°C, TA
Functional Safety-Capable
– Documentation available to aid functional safety
system design
2-V, high-impedance input voltage range optimized
for isolated voltage measurement
Fixed gain: 1
The AMC1311-Q1 is a precision, isolated amplifier
with an output separated from the input circuitry by
a capacitive isolation barrier that is highly resistant
to magnetic interference. This barrier is certified to
provide reinforced galvanic isolation of up to 5 kVRMS
according to DIN EN IEC 60747-17 (VDE 0884-17)
and UL1577 and supports a working voltage of up to
•
•
1500 VRMS
.
•
•
Low DC errors:
– AMC1311-Q1:
The isolation barrier separates parts of the system
that operate on different common-mode voltage levels
and protects the low-voltage side from voltages that
can cause electrical damage or be harmful to an
operator.
•
•
•
•
Offset error: ±9.9 mV (maximum)
Offset drift: ±20 µV/°C (typical)
Gain error: ±1% (maximum)
Gain drift: ±30 ppm/°C (typical)
The high-impedance input of the AMC1311-Q1
is optimized for connection to high-impedance
resistive dividers or any other high-impedance voltage
signal source. The excellent DC accuracy and
low temperature drift support accurate, isolated
voltage sensing and control in closed-loop systems.
The integrated missing high-side supply voltage
detection feature simplifies system-level design and
diagnostics.
– AMC1311B-Q1:
•
•
•
•
Offset error: ±1.5 mV (maximum)
Offset drift: ±10 µV/°C (maximum)
Gain error: ±0.2% (maximum)
Gain drift: ±40 ppm/°C (maximum)
– Nonlinearity: 0.04% (maximum)
3.3-V operation on high-side (AMC1311B-Q1)
High CMTI: 100 kV/μs (AMC1311B-Q1)
Missing high-side supply indication
Safety-related certifications:
– 7000-VPK reinforced isolation per DIN EN IEC
60747-17 (VDE 0884-17)
– 5000-VRMS isolation for 1 minute per UL1577
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•
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•
The AMC1311-Q1 is offered with two performance
grade options: AMC1311-Q1 and AMC1311B-Q1.
Device Information(1)
PART NUMBER
AMC1311-Q1
PACKAGE
BODY SIZE (NOM)
2 Applications
SOIC (8)
5.85 mm × 7.50 mm
AMC1311B-Q1
•
Isolated voltage sensing in:
– Traction inverters
– Onboard chargers
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
– DC/DC converters
VDC
High-side supply
(3.3 V or 5 V)
Low-side supply
(3.3 V or 5 V)
R1
R2
AMC1311B-Q1
VDD1
VDD2
OUTP
IN
SHTDN
GND1
0..2V
RSNS
VCMout
2 V
ADC
OUTN
GND2
Simplified Schematic
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
AMC1311-Q1
SBAS897C – MARCH 2018 – REVISED JUNE 2022
www.ti.com
Table of Contents
1 Features............................................................................1
2 Applications.....................................................................1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Pin Configuration and Functions...................................4
6 Specifications.................................................................. 5
6.1 Absolute Maximum Ratings........................................ 5
6.2 ESD Ratings............................................................... 5
6.3 Recommended Operating Conditions.........................5
6.4 Thermal Information....................................................6
6.5 Power Ratings.............................................................6
6.6 Insulation Specifications ............................................ 7
6.7 Safety-Related Certifications ..................................... 8
6.8 Safety Limiting Values ................................................8
6.9 Electrical Characteristics.............................................9
6.10 Switching Characteristics........................................11
6.11 Timing Diagram....................................................... 11
6.12 Insulation Characteristics Curves........................... 12
6.13 Typical Characteristics............................................13
7 Detailed Description......................................................19
7.1 Overview...................................................................19
7.2 Functional Block Diagram.........................................19
7.3 Feature Description...................................................19
7.4 Device Functional Modes..........................................21
8 Application and Implementation..................................22
8.1 Application Information............................................. 22
8.2 Typical Application.................................................... 22
8.3 What To Do and What Not To Do..............................25
9 Power Supply Recommendations................................26
10 Layout...........................................................................27
10.1 Layout Guidelines................................................... 27
10.2 Layout Example...................................................... 27
11 Device and Documentation Support..........................28
11.1 Documentation Support.......................................... 28
11.2 Receiving Notification of Documentation Updates..28
11.3 Support Resources................................................. 28
11.4 Trademarks............................................................. 28
11.5 Electrostatic Discharge Caution..............................28
11.6 Glossary..................................................................28
12 Mechanical, Packaging, and Orderable
Information.................................................................... 28
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision B (May 2020) to Revision C (June 2022)
Page
•
•
Changed Features section..................................................................................................................................1
Changed isolation standard from DIN VDE V 0884-11 (VDE V 0884-11) to DIN EN IEC 60747-17 (VDE
0884-17) and updated the Insulation Specifications and Safety-Related Certifications tables accordingly....... 1
Changed pin names: VIN to IN, VOUTP to OUTP, and VOUTN to OUTN......................................................... 4
Merged VOS specs for 4.5V ≤ VDD1 ≤ 5.5 V and 3.0 V ≤ VDD1 ≤ 5.5 V ranges (AMC1311B-Q1 only).............9
Changed VDD1 DC PSRR from –65 dB (typical) to –80 dB (typical)................................................................. 9
Changed CMTI from 75 kV/µs (minimum), 140 kV/µs (typical) to 100 kV/µs (minimum), 150kV/µs
•
•
•
•
(typical) (AMC1311B-Q1 only)............................................................................................................................ 9
Changed VDD1UV (VDD1 falling) from 1.75 V / 2.53 V / 2.7 V to 2.4 V / 2.6 V / 2.8 V (minimum / typical /
maximum)...........................................................................................................................................................9
Changed Rise, Fall, and Delay Time Definition timing diagram........................................................................11
Changed Reinforced Isolation Capacitor Lifetime Projection figure ................................................................ 12
Changed functional block diagram................................................................................................................... 19
Deleted Fail-Safe Output section, added Analog Output section..................................................................... 21
Changed Typical Application section and subsections.....................................................................................22
Changed What To Do and What Not To Do section......................................................................................... 25
Changed Layout section...................................................................................................................................27
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•
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Changes from Revision A (June 2018) to Revision B (May 2020)
Page
•
•
•
•
Changed automotive-specific Features bullets ..................................................................................................1
Added Functional Safety-Capable bullets to Features list. ................................................................................1
Changed AMC1311B-Q1 offset drift from ±15 µV/°C (max) to 10 µV/°C (max) in Features section.................. 1
Changed AMC1311B-Q1 gain error from ±0.3% (max) to ±0.2% (max) and changed AMC1311B-Q1 gain drift
from ±45 ppm/°C (max) to ±40 ppm/°C (max) in Features section.....................................................................1
Changed AMC1311B-Q1 values for TCVOS, EG, and TCEG in Device Comparison Table ................................5
Added ESD classification levels to ESD Ratings table.......................................................................................5
Changed CLR and CPG values from 9 mm to 8.5 mm.......................................................................................5
Changed Insulation Specifications table per ISO standard................................................................................ 5
Changed Safety-Related Certification table per ISO standard........................................................................... 5
Changed Safety Limiting Values description as per ISO standard..................................................................... 5
Changed TCVOS parameter minimum value from –15 μV/°C to –10 μV/°C and maximum value from 15 μV/°C
to 10μV/°C for the AMC1311B-Q1 in the Electrical Characteristics table...........................................................5
Changed EG parameter minimum value from –0.3% to –0.2% and maximum value from 0.3% to 0.2% for the
AMC1311B-Q1 in the Electrical Characteristics table.........................................................................................5
Changed TCEG parameter minimum value from –45 ppm/°C to –40 ppm/°C and maximum value from 45
ppm/°C to 40 ppm/°C for the AMC1311B-Q1 in the Electrical Characteristics table.......................................... 5
Changed Step Response of the AMC1311B-Q1 figure.................................................................................... 25
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•
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5 Pin Configuration and Functions
VDD1
IN
1
2
3
4
8
7
6
5
VDD2
OUTP
OUTN
GND2
SHTDN
GND1
Not to scale
Figure 5-1. DWV Package, 8-Pin SOIC (Top View)
Table 5-1. Pin Functions
PIN
NAME
TYPE
DESCRIPTION
NO.
1
2
3
4
5
6
7
8
VDD1
IN
High-side power
Analog input
High-side power supply(1)
Analog input
SHTDN
GND1
GND2
OUTN
OUTP
VDD2
Digital input
Shutdown input, active high, with internal pullup resistor (typical value: 100 kΩ)
High-side analog ground
High-side ground
Low-side ground
Analog output
Analog output
Low-side power
Low-side analog ground
Inverting analog output
Noninverting analog output
Low-side power supply(1)
(1) See the Power Supply Recommendations section for power-supply decoupling recommendations.
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6 Specifications
6.1 Absolute Maximum Ratings
see(1)
MIN
–0.3
MAX
6.5
UNIT
High-side VDD1 to GND1
Power-supply voltage
Input voltage
V
Low-side VDD2 to GND2
–0.3
6.5
IN
GND1 – 6
GND1 – 0.5
GND2 – 0.5
–10
VDD1 + 0.5
VDD1 + 0.5
VDD2 + 0.5
10
V
SHTDN
Output voltage
Input current
OUTP, OUTN
V
Continuous, any pin except power-supply pins
mA
Junction, TJ
Storage, Tstg
150
Temperature
°C
–65
150
(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
6.2 ESD Ratings
VALUE
±2000
±1000
UNIT
Human-body model (HBM), per AEC Q100-002(1), HBM ESD classification Level 2
Charged-device model (CDM), per AEC Q100-011, CDM ESD classification Level C6
V(ESD)
Electrostatic discharge
V
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
6.3 Recommended Operating Conditions
over operating ambient temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
POWER SUPPLY
High-side power supply
VDD1 to GND1, AMC1311-Q1
VDD1 to GND1, AMC1311B-Q1
VDD2 to GND2
4.5
3
5
5
5.5
5.5
5.5
V
V
Low-side power supply
ANALOG INPUT
3
3.3
VClipping
VFSR
Input voltage before clipping output
Specified linear full-scale voltage
IN to GND1
IN to GND1
2.516
V
V
–0.1
2
ANALOG OUTPUT
On OUTP or OUTN to GND2
OUTP to OUTN
500
250
1
CLOAD Capacitive load
pF
kΩ
RLOAD
DIGITAL INPUT
Input voltage
TEMPERATURE RANGE
Resistive load
On OUTP or OUTN to GND2
10
SHTDN to GND1
0
VDD1
125
V
TA
Specified ambient temperature
–40
°C
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UNIT
SBAS897C – MARCH 2018 – REVISED JUNE 2022
6.4 Thermal Information
DWV (SOIC)
8 PINS
84.6
THERMAL METRIC(1)
RθJA
Junction-to-ambient thermal resistance
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
RθJC(top) Junction-to-case (top) thermal resistance
28.3
RθJB
ΨJT
ΨJB
Junction-to-board thermal resistance
41.1
Junction-to-top characterization parameter
Junction-to-board characterization parameter
4.9
39.1
RθJC(bot) Junction-to-case (bottom) thermal resistance
n/a
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
6.5 Power Ratings
PARAMETER
TEST CONDITIONS
VDD1 = VDD2 = 5.5 V
VALUE
UNIT
98
PD
Maximum power dissipation (both sides)
mW
VDD1 = VDD2 = 3.6V, AMC1311B-Q1
only
56
VDD1 = 5.5 V
53
30
45
26
PD1
Maximum power dissipation (high-side)
Maximum power dissipation (low-side)
mW
mW
VDD1 = 3.6 V, AMC1311B-Q1 only
VDD2 = 5.5 V
PD2
VDD2 = 3.6 V, AMC1311B-Q1 only
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6.6 Insulation Specifications
over operating ambient temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VALUE
UNIT
GENERAL
CLR
External clearance(1)
External creepage(1)
Shortest pin-to-pin distance through air
≥ 8.5
≥ 8.5
mm
mm
CPG
Shortest pin-to-pin distance across the package surface
Minimum internal gap (internal clearance) of the double
insulation
DTI
CTI
Distance through insulation
≥ 0.021
mm
V
Comparative tracking index
Material group
DIN EN 60112 (VDE 0303-11); IEC 60112
According to IEC 60664-1
≥ 600
I
Rated mains voltage ≤ 600 VRMS
Rated mains voltage ≤ 1000 VRMS
I-IV
I-III
Overvoltage category
per IEC 60664-1
DIN EN IEC 60747-17 (VDE 0884-17)(2)
Maximum repetitive peak
VIORM
At AC voltage
2120
VPK
isolation voltage
At AC voltage (sine wave)
1500
2120
7000
8400
9800
VRMS
VDC
Maximum-rated isolation
VIOWM
working voltage
At DC voltage
VTEST = VIOTM, t = 60 s (qualification test)
VTEST = 1.2 × VIOTM, t = 1 s (100% production test)
Tested in air, 1.2/50-µs waveform per IEC 62368-1
Maximum transient
VIOTM
VPK
isolation voltage
VIMP
Maximum impulse voltage(3)
VPK
VPK
Maximum surge
Tested in oil (qualification test),
1.2/50-µs waveform per IEC 62368-1
VIOSM
12800
≤ 5
isolation voltage(4)
Method a, after input/output safety test subgroups 2 and 3,
Vini = VIOTM, tini = 60 s, Vpd(m) = 1.2 × VIORM, tm = 10 s
Method a, after environmental tests subgroup 1,
Vini = VIOTM, tini = 60 s, Vpd(m) = 1.6 × VIORM, tm = 10 s
≤ 5
qpd
Apparent charge(5)
pC
Method b1, at routine test (100% production) and
preconditioning (type test), Vini = VIOTM, tini = 1 s, Vpd(m) = 1.875
× VIORM, tm = 1 s
≤ 5
Barrier capacitance,
input to output(6)
CIO
RIO
VIO = 0.5 VPP at 1 MHz
~1.5
pF
Ω
VIO = 500 V at TA = 25°C
> 1012
> 1011
> 109
Insulation resistance,
input to output(6)
VIO = 500 V at 100°C ≤ TA ≤ 125°C
VIO = 500 V at TS = 150°C
Pollution degree
Climatic category
2
55/125/21
UL1577
VTEST = VISO = 5000 VRMS, t = 60 s (qualification),
VTEST = 1.2 × VISO = 6000 VRMS, t = 1 s (100% production test)
VISO
Withstand isolation voltage
5000
VRMS
(1) Apply creepage and clearance requirements according to the specific equipment isolation standards of an application. Care must be
taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on the
printed circuit board (PCB) do not reduce this distance. Creepage and clearance on a PCB become equal in certain cases. Techniques
such as inserting grooves, ribs, or both on a PCB are used to help increase these specifications.
(2) This coupler is suitable for safe electrical insulation only within the safety ratings. Compliance with the safety ratings shall be ensured
by means of suitable protective circuits.
(3) Testing is carried out in air to determine the surge immunity of the package.
(4) Testing is carried in oil to determine the intrinsic surge immunity of the isolation barrier.
(5) Apparent charge is electrical discharge caused by a partial discharge (pd).
(6) All pins on each side of the barrier are tied together, creating a two-pin device.
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6.7 Safety-Related Certifications
VDE
UL
DIN EN IEC 60747-17 (VDE 0884-17),
EN IEC 60747-17,
DIN EN IEC 62368-1 (VDE 0868-1),
EN IEC 62368-1,
Recognized under 1577 component recognition
IEC 62368-1 Clause : 5.4.3 ; 5.4.4.4 ; 5.4.9
Reinforced insulation
Single protection
Certificate number: 40040142
File number: E181974
6.8 Safety Limiting Values
Safety limiting(1) intends to minimize potential damage to the isolation barrier upon failure of input or output circuitry. A
failure of the I/O can allow low resistance to ground or the supply and, without current limiting, dissipate sufficient power to
over-heat the die and damage the isolation barrier potentially leading to secondary system failures.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
RθJA = 84.6°C/W, VDDx = 5.5 V,
TJ = 150°C, TA = 25°C
268
IS
Safety input, output, or supply current
mA
RθJA = 84.6°C/W, VDDx = 3.6 V,
TJ = 150°C, TA = 25°C, AMC1311B-Q1
only
410
PS
TS
Safety input, output, or total power
Maximum safety temperature
RθJA = 84.6°C/W, TJ = 150°C, TA = 25°C
1477
150
mW
°C
(1) The maximum safety temperature, TS, has the same value as the maximum junction temperature, TJ, specified for the device. The IS
and PS parameters represent the safety current and safety power, respectively. Do not exceed the maximum limits of IS and PS. These
limits vary with the ambient temperature, TA.
The junction-to-air thermal resistance, RθJA, in the Thermal Information table is that of a device installed on a high-K test board for
leaded surface-mount packages. Use these equations to calculate the value for each parameter:
TJ = TA + RθJA × P, where P is the power dissipated in the device.
TJ(max) = TS = TA + RθJA × PS, where TJ(max) is the maximum junction temperature.
PS = IS × VDDmax, where VDDmax is the maximum supply voltage for high-side and low-side.
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6.9 Electrical Characteristics
minimum and maximum specifications of the AMC1311-Q1 apply from TA = –40°C to +125°C, VDD1 = 4.5 V to 5.5 V, VDD2
= 3.0 V to 5.5 V, VIN = –0.1 V to 2 V, and SHTDN = GND1 = 0 V; minimum and maximum specifications of the AMC1311B-Q1
apply from TA = –55°C to +125°C, VDD1 = 3.0 V to 5.5 V, VDD2 = 3.0 V to 5.5 V, VIN = –0.1 V to 2 V, and SHTDN = GND1 =
0 V (unless otherwise noted); typical specifications are at TA = 25°C, VDD1 = 5 V, and VDD2 = 3.3 V
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
ANALOG INPUT
TA = 25°C, 4.5 V ≤ VDD1 ≤ 5.5 V,
AMC1311-Q1
–9.9
–1.5
±0.4
9.9
mV
VOS
Input offset voltage(1) (2)
TA = 25°C, AMC1311B-Q1(3)
±0.4
±20
±3
1
1.5
AMC1311-Q1
TCVOS
Input offset thermal drift(1) (2) (5)
µV/°C
10
AMC1311B-Q1
–10
–15
RIN
IIB
Input resistance
Input bias current
Input capacitance
TA = 25℃
GΩ
IN = GND1, TA = 25℃
fIN = 275 kHz
3.5
7
15
nA
pF
CIN
ANALOG OUTPUT
Nominal gain
1
0.4%
V/V
TA = 25℃, AMC1311-Q1
TA = 25℃, AMC1311B-Q1
AMC1311-Q1
–1%
1%
EG
Gain error(1)
–0.2%
±0.05%
±30
0.2%
TCEG
Gain error drift(1) (6)
ppm/°C
dB
AMC1311B-Q1
–40
±5
40
Nonlineartity(1)
–0.04%
±0.01%
0.04%
VIN = 2 VPP, VIN > 0 V,
fIN = 10 kHz, BW = 10 kHz
THD
SNR
Total harmonic distortion(4)
–87
VIN = 2 VPP, fIN = 1 kHz, BW = 10 kHz
VIN = 2 VPP, fIN = 10 kHz, BW = 100 kHz
VIN = GND1, BW = 100 kHz
vs VDD1, at DC
79
82.6
70.9
220
–80
–85
–65
–70
1.44
Signal-to-noise ratio
Output noise
dB
µVrms
vs VDD2, at DC
PSRR
Power-supply rejection ratio(2)
dB
vs VDD1, 10 kHz / 100-mV ripple
vs VDD2, 10 kHz / 100-mV ripple
VCMout
Output common-mode voltage
1.39
1.49
–2.5
V
V
VOUT = (VOUTP – VOUTN);
VIN > VClipping
VCLIPout
Clipping differential output voltage
2.49
–2.6
SHTDN = high, or VDD1 undervoltage,
or VDD1 missing
VFAILSAFE Failsafe differential output voltage
V
AMC1311-Q1
100
220
220
275
BW
Output bandwidth
Output resistance
kHz
Ω
AMC1311B-Q1
On OUTP or OUTN
ROUT
<0.2
On OUTP or OUTN, sourcing or sinking,
IN = GND1, outputs shorted to
either GND or VDD2
Output short-circuit current
14
mA
AMC1311-Q1
15
30
CMTI
Common-mode transient immunity
kV/µs
AMC1311B-Q1
100
150
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6.9 Electrical Characteristics (continued)
minimum and maximum specifications of the AMC1311-Q1 apply from TA = –40°C to +125°C, VDD1 = 4.5 V to 5.5 V, VDD2
= 3.0 V to 5.5 V, VIN = –0.1 V to 2 V, and SHTDN = GND1 = 0 V; minimum and maximum specifications of the AMC1311B-Q1
apply from TA = –55°C to +125°C, VDD1 = 3.0 V to 5.5 V, VDD2 = 3.0 V to 5.5 V, VIN = –0.1 V to 2 V, and SHTDN = GND1 =
0 V (unless otherwise noted); typical specifications are at TA = 25°C, VDD1 = 5 V, and VDD2 = 3.3 V
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
DIGITAL INPUT
IIN
Input current
SHTDN pin, GND1 ≤ SHTDN ≤ VDD1
SHTDN pin
–70
1
µA
pF
CIN
Input capacitance
5
0.7 ×
VDD1
VIH
VIL
High-level input voltage
V
V
0.3 ×
VDD1
Low-level input voltage
POWER SUPPLY
VDD1 rising
VDD1 falling
VDD2 rising
VDD2 falling
2.5
2.4
2.7
2.6
2.9
2.8
VDD1 undervoltage detection
threshold
VDD1UV
VDD2UV
V
V
2.2
2.45
2.0
2.65
2.2
VDD2 undervoltage detection
threshold
1.85
3.0 V < VDD1 < 3.6 V, SHTDN = low,
AMC1311B-Q1 only
6.0
8.4
9.7
mA
IDD1
High-side supply current
Low-side supply current
4.5 V < VDD1 < 5.5 V, SHTDN = low
SHTDN = VDD1
7.1
1.3
5.3
5.9
µA
3.0 V < VDD2 < 3.6 V
7.2
8.1
IDD2
mA
4.5 V < VDD2 < 5.5 V
(1) The typical value includes one standard deviation (sigma) at nominal operating conditions.
(2) This parameter is input referred.
(3) The typical value is at VDD1 = 3.3 V.
(4) THD is the ratio of the rms sum of the amplitudes of first five higher harmonics to the amplitude of the fundamental.
(5) Offset error temperature drift is calculated using the box method, as described by the following equation:
TCVOS = (ValueMAX - ValueMIN) / TempRange
(6) Gain error temperature drift is calculated using the box method, as described by the following equation:
TCEG (ppm) = (ValueMAX - ValueMIN) / (Value(T=25℃) x TempRange) x 106
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6.10 Switching Characteristics
over operating ambient temperature range (unless otherwise noted)
PARAMETER
Output signal rise time
Output signal fall time
TEST CONDITIONS
MIN
TYP
1.3
1.3
1.5
1.0
2.1
1.6
3.0
2.5
MAX
UNIT
µs
tr
tf
µs
Unfiltered output, AMC1311-Q1
Unfiltered output, AMC1311B-Q1
Unfiltered output, AMC1311-Q1
Unfiltered output, AMC1311B-Q1
Unfiltered output, AMC1311-Q1
Unfiltered output, AMC1311B-Q1
2.5
1.5
3.1
2.1
4.0
3.0
IN to OUTx signal delay (50% – 10%)
IN to OUTx signal delay (50% – 50%)
µs
µs
IN to OUTx signal delay (50% – 90%)
Analog settling time
µs
µs
VDD1 step to 3.0 V with VDD2 ≥ 3.0 V, to
VOUTP, VOUTN valid, 0.1% settling
tAS
50
100
tEN
Device enable time
SHTDN high to low
SHTDN low to high
50
3
100
10
µs
µs
tSHTDN
Device shutdown time
6.11 Timing Diagram
2 V
IN
0 V
tf
tr
OUTN
OUTP
VCMout
50% - 10%
50% - 50%
50% - 90%
Figure 6-1. Rise, Fall, and Delay Time Definition
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6.12 Insulation Characteristics Curves
500
1600
1400
1200
1000
800
600
400
200
0
AVDD = DVDD = 3.6 V
AVDD = DVDD = 5.5 V
400
300
200
100
0
0
50
100
TA (°C)
150
200
0
50
100
TA (èC)
150
200
D001
D002
Figure 6-2. Thermal Derating Curve for Safety-
Limiting Current per VDE
Figure 6-3. Thermal Derating Curve for Safety-
Limiting Power per VDE
1.E+11
Safety Margin Zone: 1800 VRMS, 254 Years
Operating Zone: 1500 VRMS, 135 Years
TDDB Line (<1 PPM Fail Rate)
1.E+10
87.5%
1.E+9
1.E+8
1.E+7
1.E+6
1.E+5
1.E+4
1.E+3
20%
1.E+2
1.E+1
500 1500 2500 3500 4500 5500 6500 7500 8500 9500
Stress Voltage (VRMS
)
TA up to 150°C, stress-voltage frequency = 60 Hz, isolation working voltage = 1500 VRMS, operating lifetime = 135 years
Figure 6-4. Reinforced Isolation Capacitor Lifetime Projection
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6.13 Typical Characteristics
at VDD1 = 5 V, VDD2 = 3.3 V, SHTDN = 0 V, fIN = 10 kHz, and BW = 100 kHz (unless otherwise noted)
2.5
2
10
8
vs VDD1
vs VDD2
1.5
1
6
4
0.5
0
2
0
-0.5
-1
-2
-4
-6
-8
-10
-1.5
-2
Device 1
Device 2
Device 3
-2.5
3
3.25 3.5 3.75
4
4.25 4.5 4.75
VDDx (V)
5
5.25 5.5
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
D005
D019
3.0 V ≤ VDD1 < 4.5 V for the AMC1311B-Q1 only
AMC1311-Q1
Figure 6-6. Input Offset Voltage vs Temperature
Figure 6-5. Input Offset Voltage vs Supply Voltage
1.5
2.5
Device 1
Device 2
Device 3
2
1.5
1
1
0.5
0
0.5
0
-0.5
-1
-0.5
-1.5
-2
Device 1
Device 2
Device 3
-1
-1.5
-2.5
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
D006
D007
VDD1 = 5 V, AMC1311B-Q1
Figure 6-7. Input Offset Voltage vs Temperature
VDD1 = 3.3 V, AMC1311B-Q1
Figure 6-8. Input Offset Voltage vs Temperature
14
12
10
8
15
12
9
6
3
0
6
-3
-6
-9
-12
-15
4
2
0
3
3.25 3.5 3.75
4
4.25 4.5 4.75
VDD1 (V)
5
5.25 5.5
100
1000
fIN (kHz)
10000
D010
D009
3.0 V ≤ VDD1 < 4.5 V for the AMC1311B-Q1 only
Figure 6-10. Input Bias Current vs High-Side Supply Voltage
Figure 6-9. Input Capacitance vs Input Signal Frequency
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6.13 Typical Characteristics (continued)
at VDD1 = 5 V, VDD2 = 3.3 V, SHTDN = 0 V, fIN = 10 kHz, and BW = 100 kHz (unless otherwise noted)
15
12
9
1
0.8
0.6
0.4
0.2
0
6
3
0
-3
-6
-9
-12
-15
-0.2
-0.4
-0.6
-0.8
-1
AMC1311-Q1 vs VDD1
AMC1311-Q1 vs VDD2
AMC1311B-Q1 vs VDD1
AMC1311B-Q1 vs VDD2
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
3
3.25 3.5 3.75
4
4.25 4.5 4.75
VDDx (V)
5
5.25 5.5
D011
D014
3.0 V ≤ VDD1 < 4.5 V for the AMC1311B-Q1 only
Figure 6-11. Input Bias Current vs Temperature
Figure 6-12. Gain Error vs Supply Voltage
1
0.8
0.6
0.4
0.2
0
0.3
0.2
0.1
0
Device 1
Device 2
Device 3
-0.2
-0.4
-0.6
-0.8
-1
-0.1
-0.2
-0.3
Device 1
Device 2
Device 3
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
D016
D015
AMC1311B-Q1
AMC1311-Q1
Figure 6-14. Gain Error vs Temperature
Figure 6-13. Gain Error vs Temperature
5
0
50
0
-5
-50
-10
-15
-20
-25
-30
-35
-40
-100
-150
-200
-250
-300
-350
-400
AMC1311B-Q1
AMC1311-Q1
AMC1311B-Q1
AMC1311-Q1
1
10
100
1000
0.01
0.1
1
10
100
1000
fIN (kHz)
fIN (kHz)
D04034
D044
Figure 6-15. Normalized Gain vs Input Frequency
Figure 6-16. Output Phase vs Input Frequency
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6.13 Typical Characteristics (continued)
at VDD1 = 5 V, VDD2 = 3.3 V, SHTDN = 0 V, fIN = 10 kHz, and BW = 100 kHz (unless otherwise noted)
0.04
0.03
0.02
0.01
0
5
4.5
4
VOUTP
VOUTN
3.5
3
2.5
2
-0.01
-0.02
-0.03
-0.04
1.5
1
0.5
0
-0.2
0
0.2 0.4 0.6 0.8 1
VIN (V)
1.2 1.4 1.6 1.8
2
-0.1
0.3
0.7
1.1
1.5
1.9
2.3
2.7
D020
VIN (V)
D018
Figure 6-18. Nonlinearity vs Input Voltage
Figure 6-17. Output Voltage vs Input Voltage
0.04
0.03
0.02
0.01
0
0.04
0.03
0.02
0.01
0
vs VDD1
vs VDD2
-0.01
-0.02
-0.03
-0.04
-0.01
-0.02
-0.03
-0.04
Device 1
Device 2
Device 3
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
3
3.25 3.5 3.75
4
4.25 4.5 4.75
VDDx (V)
5
5.25 5.5
D022
D021
3.0 V ≤ VDD1 < 4.5 V for the AMC1311B-Q1 only
Figure 6-19. Nonlinearity vs Supply Voltage
Figure 6-20. Nonlinearity vs Temperature
-70
-75
-70
-75
vs VDD1
vs VDD2
-80
-80
-85
-85
-90
-90
Device 1
Device 2
Device 3
-95
-95
-100
-100
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
3
3.25 3.5 3.75
4
4.25 4.5 4.75
VDDx (V)
5
5.25 5.5
D024
D023
3.0 V ≤ VDD1 < 4.5 V for the AMC1311B-Q1 only
Figure 6-22. Total Harmonic Distortion vs Temperature
Figure 6-21. Total Harmonic Distortion vs Supply Voltage
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6.13 Typical Characteristics (continued)
at VDD1 = 5 V, VDD2 = 3.3 V, SHTDN = 0 V, fIN = 10 kHz, and BW = 100 kHz (unless otherwise noted)
1000
100
10
72.5
70
67.5
65
62.5
60
57.5
55
52.5
50
1
47.5
45
0.1
42.5
0.1
1
10
Frequency (kHz)
100
1000
0
0.2 0.4 0.6 0.8
1
VIN (V)
1.2 1.4 1.6 1.8
2
D025
D026
Figure 6-23. Input-Referred Noise Density vs Frequency
Figure 6-24. Signal-to-Noise Ratio vs Input Voltage
80
80
vs VDD1
vs VDD2
77.5
75
77.5
75
72.5
70
72.5
70
67.5
67.5
65
65
Device 1
Device 2
Device 3
62.5
60
62.5
60
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
3
3.25 3.5 3.75
4
4.25 4.5 4.75
VDDx (V)
5
5.25 5.5
D028
D027
3.0 V ≤ VDD1 < 4.5 V for the AMC1311B-Q1 only
Figure 6-26. Signal-to-Noise Ratio vs Temperature
Figure 6-25. Signal-to-Noise Ratio vs Supply Voltage
0
1.49
1.48
1.47
1.46
1.45
1.44
1.43
1.42
1.41
1.4
-20
-40
-60
-80
-100
VDD1
VDD2
-120
0.1
1.39
1
10
Ripple Frequency (kHz)
100
1000
3
3.25 3.5 3.75
4
4.25 4.5 4.75
VDD2 (V)
5
5.25 5.5
D029
D031
100-mV ripple
Figure 6-27. Power-Supply Rejection Ratio vs Ripple Frequency
Figure 6-28. Output Common-Mode Voltage vs Low-Side Supply
Voltage
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6.13 Typical Characteristics (continued)
at VDD1 = 5 V, VDD2 = 3.3 V, SHTDN = 0 V, fIN = 10 kHz, and BW = 100 kHz (unless otherwise noted)
300
290
280
270
260
250
240
230
220
210
200
1.49
1.48
1.47
1.46
1.45
1.44
1.43
1.42
1.41
1.4
AMC1311B-Q1
AMC1311-Q1
1.39
3
3.25 3.5 3.75
4
4.25 4.5 4.75
VDD2 (V)
5
5.25 5.5
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
D033
D032
Figure 6-30. Output Bandwidth vs Low-Side Supply Voltage
Figure 6-29. Output Common-Mode Voltage vs Temperature
300
8.5
8
AMC1311B-Q1
AMC1311-Q1
290
280
270
260
250
240
230
220
210
200
7.5
7
6.5
6
5.5
5
4.5
IDD1 vs VDD1
IDD2 vs VDD2
4
3.5
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
3
3.25 3.5 3.75
4
4.25 4.5 4.75
VDDx (V)
5
5.25 5.5
D034
D035
3.0 V ≤ VDD1 < 4.5 V for the AMC1311B-Q1 only
Figure 6-32. Supply Current vs Supply Voltage
Figure 6-31. Output Bandwidth vs Temperature
8.5
4
3.5
3
8
7.5
7
2.5
2
6.5
6
5.5
5
1.5
1
4.5
4
IDD1
IDD2
0.5
0
3.5
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
3
3.25 3.5 3.75
4
4.25 4.5 4.75
VDD2 (V)
5
5.25 5.5
D036
D037
Figure 6-33. Supply Current vs Temperature
Figure 6-34. Output Rise and Fall Time vs Low-Side Supply
Voltage
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6.13 Typical Characteristics (continued)
at VDD1 = 5 V, VDD2 = 3.3 V, SHTDN = 0 V, fIN = 10 kHz, and BW = 100 kHz (unless otherwise noted)
4
3.5
3
3.8
3.4
3
2.6
2.2
1.8
1.4
1
2.5
2
1.5
1
50% - 90%
50% - 50%
50% - 10%
0.5
0
0.6
0.2
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
3
3.25 3.5 3.75
4
4.25 4.5 4.75
VDD2 (V)
5
5.25 5.5
D038
D039
AMC1311-Q1
Figure 6-35. Output Rise and Fall Time vs Temperature
Figure 6-36. IN to OUTP, OUTN Signal Delay vs Low-Side
Supply Voltage
3.8
3.8
3.4
3
50% - 90%
50% - 50%
50% - 10%
3.4
3
2.6
2.2
1.8
1.4
1
2.6
2.2
1.8
1.4
1
50% - 90%
50% - 50%
50% - 10%
0.6
0.2
0.6
0.2
-40 -25 -10
3
3.25 3.5 3.75
4
4.25 4.5 4.75
VDD2 (V)
5
5.25 5.5
5
20 35 50 65 80 95 110 125
Temperature (°C)
D040
D041
AMC1311B-Q1
AMC1311-Q1
Figure 6-37. IN to OUTP, OUTN Signal Delay vs Low-Side
Supply Voltage
Figure 6-38. IN to OUTP, OUTN Signal Delay vs Temperature
3.8
3.4
3
50% - 90%
50% - 50%
50% - 10%
2.6
2.2
1.8
1.4
1
0.6
0.2
-40 -25 -10
5
20 35 50 65 80 95 110 125
Temperature (°C)
D042
AMC1311B-Q1
Figure 6-39. IN to OUTP, OUTN Signal Delay vs Temperature
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7 Detailed Description
7.1 Overview
The AMC1311-Q1 is a precision, single-ended input, isolated amplifier with a high input impedance and wide
input voltage range. The input stage of the device drives a second-order, delta-sigma (ΔΣ) modulator. The
modulator converts the analog input signal into a digital bitstream that is transferred across the isolation barrier
and separates the high-side from the low-side. On the low-side, the received bitstream is processed by a
fourth-order analog filter that outputs a differential signal at the OUTP and OUTN pins proportional to the input
signal.
The SiO2-based, capacitive isolation barrier supports a high level of magnetic field immunity, as described
in the ISO72x Digital Isolator Magnetic-Field Immunity application report. The digital modulation used in the
AMC1311-Q1 to transmit data across the isolation barrier, and the isolation barrier characteristics itself, result in
high reliability and high common-mode transient immunity.
7.2 Functional Block Diagram
VDD1
VDD2
OUTP
OUTN
GND2
AMC1311B-Q1
Analog Filter
IN
ΔΣ Modulator
SHTDN
GND1
7.3 Feature Description
7.3.1 Analog Input
The single-ended, high-impedance input stage of the AMC1311-Q1 feeds a second-order, switched-capacitor,
feed-forward ΔΣ modulator. The modulator converts the analog signal into a bitstream that is transferred across
the isolation barrier, as described in the Isolation Channel Signal Transmission section.
There are two restrictions on the analog input signal IN. First, if the input voltage VIN exceeds the range
specified in the Absolute Maximum Ratings table, the input current must be limited to the absolute maximum
value because the electrostatic discharge (ESD) protection turns on. Secondly, the linearity and parametric
performance of the device is ensured only when the analog input voltage remains within the linear full-scale
range (VFSR) as specified in the Recommended Operating Conditions table.
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7.3.2 Isolation Channel Signal Transmission
The AMC1311-Q1 uses an on-off keying (OOK) modulation scheme, as shown in Figure 7-1, to transmit the
modulator output bitstream across the SiO2-based isolation barrier. The transmit driver (TX) shown in the
Functional Block Diagram transmits an internally-generated, high-frequency carrier across the isolation barrier
to represent a digital one and does not send a signal to represent a digital zero. The nominal frequency of the
carrier used inside the AMC1311-Q1 is 480 MHz.
The receiver (RX) on the other side of the isolation barrier recovers and demodulates the signal and provides
the input to the fourth-order analog filter. The AMC1311-Q1 transmission channel is optimized to achieve the
highest level of common-mode transient immunity (CMTI) and lowest level of radiated emissions caused by the
high-frequency carrier and RX/TX buffer switching.
Internal Clock
Modulator Bitstream
on High-side
Signal Across Isolation Barrier
Recovered Sigal
on Low-side
Figure 7-1. OOK-Based Modulation Scheme
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7.3.3 Analog Output
The AMC1311-Q1 provides a differential analog output on the OUTP and OUTN pins. For input voltages of VIN in
the range from –0.1 V to +2 V, the device provides a linear response with a nominal gain of 1. For example, for
an input voltage of 2 V, the differential output voltage (VOUTP – VOUTN) is 2 V. At zero input (IN shorted to GND1),
both pins output the same common-mode output voltage VCMout, as specified in the Electrical Characteristics
table. For input voltages greater than 2 V but less than approximately 2.5 V, the differential output voltage
continues to increase but with reduced linearity performance. The outputs saturate at a differential output voltage
of VCLIPout, as shown in Figure 7-2, if the input voltage exceeds the VClipping value.
Maximum input range before clipping (VClipping
)
Linear input range (VFSR
)
VFail-safe
VOUTN
VCLIPout
VOUTP
VCMout
0
2.516 V
Input Voltage (VIN
)
2 V
Figure 7-2. Output Behavior of the AMC1311-Q1
The AMC1311-Q1 output offers a fail-safe feature that simplifies diagnostics on a system level. Figure 7-2 shows
the fail-safe mode, in which the AMC1311-Q1 outputs a negative differential output voltage that does not occur
under normal operating conditions. The fail-safe output is active in three cases:
•
•
•
When the high-side supply VDD1 of the AMC1311-Q1 device is missing
When the high-side supply VDD1 falls below the undervoltage threshold VDD1UV
When the SHTDN pin is pulled high
Use the maximum VFail-safe voltage specified in the Electrical Characteristics table as a reference value for
fail-safe detection on a system level.
7.4 Device Functional Modes
The AMC1311-Q1 is operational when the power supplies VDD1 and VDD2 are applied, as specified in the
Recommended Operating Conditions table.
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8 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.
8.1 Application Information
The high input impedance, low input bias current, low AC and DC errors, and low temperature drift make the
AMC1311-Q1 a high-performance solution for automotive applications where voltage sensing in the presence of
high common-mode voltage levels is required.
8.2 Typical Application
Figure 8-1 shows an OBC that uses the AMC1311-Q1 to monitor the DC bus voltage that can be as high as
600 V. The DC bus voltage is divided down to an approximate 2-V level across the bottom resistor (RSNS)
of a high-impedance resistive divider that is sensed by the AMC1311-Q1. The output of the AMC1311-Q1 is a
differential analog output voltage of the same value as the input voltage but is galvanically isolated from the
high-side by a reinforced isolation barrier.
The reinforced isolation barrier and high common-mode transient immunity (CMTI) of the AMC1311-Q1 ensure
reliable and accurate operation in harsh and high-noise environments.
+ DC-Bus
DC-Link
Number of unit resistors depends
on design requirements.
See design examples for details.
DC/DC
EMI
Filter
PFC
Contactor
SW
RX1
RX2
L1
L2
L3
High-side supply
(3.3 V or 5 V)
Low-side supply
(3.3 V or 5 V)
SW
SW
100 nF 1 uF
AMC1311B-Q1
VDD1
VDD2
10
10
10 nF
ICROSS
RSNS
IN
OUTP
OUTN
GND2
ADC
SHTDN
GND1
SW
N
1 uF 100 nF 100 pF
N
DC-Bus
Figure 8-1. Using the AMC1311-Q1 for DC Bus Voltage Sensing in an OBC
8.2.1 Design Requirements
Table 8-1 lists the parameters for this typical application.
Table 8-1. Design Requirements
PARAMETER
VALUE
600 V (maximum)
3.3 V or 5 V
3.3 V or 5 V
100 V
DC bus voltage
High-side supply voltage
Low-side supply voltage
Maximum resistor operating voltage
Voltage drop across the sense resistor (RSNS) for a linear response
Current through the resistive divider, ICROSS
2 V (maximum)
100 μA
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8.2.2 Detailed Design Procedure
The 100-μA, cross-current requirement at the maximum DC bus voltage (600 V) determines that the total
impedance of the resistive divider is 6 MΩ. The impedance of the resistive divider is dominated by the top
portion (shown exemplary as RX1 and RX2 in Figure 8-1) and the voltage drop across RSNS can be neglected
for a moment. The maximum allowed voltage drop per unit resistor is specified as 100 V; therefore, the minimum
number of unit resistors in the top portion of the resistive divider is 600 V / 100 V = 6. The calculated unit value is
6 MΩ / 6 = 1 MΩ and matches a value from the E96 series.
RSNS is sized such that the voltage drop across the resistor at the maximum DC-bus voltage (600 V) equals the
linear full-scale range input voltage (VFSR) of the AMC1311-Q1, which is 2 V. The value of RSNS is calculated as
RSNS = VFSR / (VDC-Bus, max – VFSR) × RTOP, where RTOP is the total value of the top resistor string (6 × 1 MΩ =
6 MΩ). RSNS is calculated as 20.07 kΩ. The next closest, lower value from the E96 series is 20 kΩ.
Table 8-2 summarizes the design of the resistive divider.
Table 8-2. Resistor Value Example
PARAMETER
VALUE
1 MΩ
Unit resistor value, RX
Number of unit resistors
Sense resistor value, RSNS
Total resistance value
6
20 kΩ
6.02 MΩ
99.7 μA
1.993 V
9.9 mW
59.8 mW
Resulting current through resistive divider, ICROSS
Resulting full-scale voltage drop across sense resistor RSNS
Power dissipated in unit resistor RX
Total power dissipated in resistive divider
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8.2.2.1 Input Filter Design
Placing an RC filter in front of the isolated amplifier improves signal-to-noise performance of the signal path. In
practice, however, the impedance of the resistor divider is high and only a small-value filter capacitor can be
used to not limit the signal bandwidth to an unacceptable low value. Design the input filter such that:
•
•
The cutoff frequency of the filter is at least one order of magnitude lower than the sampling frequency
(20 MHz) of the internal ΔΣ modulator
The input bias current does not generate significant voltage drop across the DC impedance of the input filter
Most voltage-sensing applications use high-impedance resistor dividers in front of the isolated amplifier to scale
down the input voltage. In this case, a single capacitor (as shown in Figure 8-2) is sufficient to filter the input
signal.
VDC
R1
AMC1311B-Q1
R2
VDD1
VDD2
OUTP
OUTN
GND2
100 pF
IN
RSNS
SHTDN
GND1
Figure 8-2. Input Filter
8.2.2.2 Differential to Single-Ended Output Conversion
Figure 8-3 shows an example of a TLV900x-Q1-based signal conversion and filter circuit for systems using
single-ended input ADCs to convert the analog output voltage into digital. With R1 = R2 = R3 = R4, the output
voltage equals (VOUTP – VOUTN) + VREF. Tailor the bandwidth of this filter stage to the bandwidth requirement
of the system and use NP0-type capacitors for best performance. For most applications, R1 = R2 = R3 = R4 =
3.3 kΩ and C1 = C2 = 330 pF yields good performance.
C1
AMC1311B-Q1
R2
VDD1
VDD2
OUTP
OUTN
GND2
R1
R3
IN
–
+
ADC
To MCU
SHTDN
GND1
TLV9001-Q1
C2
R4
VREF
Figure 8-3. Connecting the AMC1311-Q1 Output to a Single-Ended Input ADC
For more information on the general procedure to design the filtering and driving stages of SAR ADCs, see
the 18-Bit, 1MSPS Data Acquisition Block (DAQ) Optimized for Lowest Distortion and Noise and 18-Bit Data
Acquisition Block (DAQ) Optimized for Lowest Power reference guides, available for download at www.ti.com.
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8.2.3 Application Curve
One important aspect of system design is the effective detection of an overvoltage condition to protect switching
devices and passive components from damage. To power off the system quickly in the event of an overvoltage
condition, a low delay caused by the isolated amplifier is required. Figure 8-4 shows the typical full-scale step
response of the AMC1311-Q1.
VOUTP
VOUTN
VIN
Figure 8-4. Step Response of the AMC1311-Q1
8.3 What To Do and What Not To Do
Do not leave the analog input (IN pin) of the AMC1311-Q1 unconnected (floating) when the device is powered
up on the high-side. If the device input is left floating, the bias current may generate a negative input voltage that
exceeds the specified input voltage range, causing the output of the device to be invalid.
Do not connect protection diodes to the input (IN pin) of the AMC1311-Q1. Diode leakage current can introduce
significant measurement error especially at high temperatures. The input pin is protected against high voltages
by its ESD protection circuit and the high impedance of the external restive divider.
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9 Power Supply Recommendations
In a typical application, the high-side (VDD1) of the AMC1311-Q1 is powered from an already existing, high-
side, ground-referenced, 3.3-V or 5-V power supply in the system. Alternatively, the high-side supply can be
generated from the low-side supply (VDD2) by an isolated DC/DC converter. A low-cost solution is based on the
push-pull driver SN6501-Q1 and a transformer that supports the desired isolation voltage ratings.
The AMC1311-Q1 does not require any specific power-up sequencing. The high-side power supply (VDD1) is
decoupled with a low-ESR, 100-nF capacitor (C1) parallel to a low-ESR, 1-μF capacitor (C2). The low-side
power supply (VDD2) is equally decoupled with a low-ESR, 100-nF capacitor (C3) parallel to a low-ESR, 1-μF
capacitor (C4). Place all four capacitors (C1, C2, C3, and C4) as close to the device as possible. Figure 9-1
shows the proper decoupling layout for the AMC1311-Q1.
VDC
VDD1
VDD2
R1
R2
C2 1 µF
C4 1 µF
AMC1311B-Q1
C1 100 nF
C3 100 nF
VDD1
VDD2
OUTP
OUTN
GND2
IN
to RC filter / ADC
to RC filter / ADC
C5 100 pF
RSNS
SHTDN
GND1
Figure 9-1. Decoupling of the AMC1311-Q1
Capacitors must provide adequate effective capacitance under the applicable DC bias conditions they
experience in the application. Multilayer ceramic capacitors (MLCC) typically exhibit only a fraction of their
nominal capacitance under real-world conditions and this factor must be taken into consideration when selecting
these capacitors. This problem is especially acute in low-profile capacitors, in which the dielectric field strength is
higher than in taller components. Reputable capacitor manufacturers provide capacitance versus DC bias curves
that greatly simplify component selection.
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10 Layout
10.1 Layout Guidelines
Figure 10-1 shows a layout recommendation with the critical placement of the decoupling capacitors (as close as
possible to the AMC1311-Q1 supply pins) and placement of the other components required by the device. For
best performance, place the sense resistor close to the device input pin (IN).
10.2 Layout Example
Clearance area, to be
kept free of any
conductive materials.
C4
C3
C2
C1
to RC filter / ADC
to RC filter / ADC
OUTP
OUTN
GND2
INP
AMC1311B-Q1
Top Metal
Inner or Bottom Layer Metal
Via
Figure 10-1. Recommended Layout of the AMC1311-Q1
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11 Device and Documentation Support
11.1 Documentation Support
11.1.1 Related Documentation
For related documentation, see the following:
•
•
•
•
•
•
•
Texas Instruments, Isolation Glossary application report
Texas Instruments, Semiconductor and IC Package Thermal Metrics application report
Texas Instruments, ISO72x Digital Isolator Magnetic-Field Immunity application report
Texas Instruments, TLV900x-Q1 Low-Power, RRIO, 1-MHz Automotive Operational Amplifier data sheet
Texas Instruments, SN6501-Q1 Transformer Driver for Isolated Power Supplies data sheet
Texas Instruments, AMC1311EVM Users Guide
Texas Instruments, 18-Bit, 1-MSPS Data Acquisition Block (DAQ) Optimized for Lowest Distortion and Noise
reference guide
•
•
Texas Instruments, 18-Bit, 1-MSPS Data Acquisition Block (DAQ) Optimized for Lowest Power reference
guide
Texas Instruments, Isolated Amplifier Voltage Sensing Excel Calculator design tool
11.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
11.3 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
11.4 Trademarks
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
11.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
11.6 Glossary
TI Glossary
This glossary lists and explains terms, acronyms, and definitions.
12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
www.ti.com
27-Jan-2021
PACKAGING INFORMATION
Orderable Device
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
(6)
AMC1311BQDWVQ1
AMC1311BQDWVRQ1
AMC1311QDWVQ1
AMC1311QDWVRQ1
ACTIVE
ACTIVE
ACTIVE
ACTIVE
SOIC
SOIC
SOIC
SOIC
DWV
DWV
DWV
DWV
8
8
8
8
64
RoHS & Green
NIPDAU
Level-3-260C-168 HR
Level-3-260C-168 HR
Level-3-260C-168 HR
Level-3-260C-168 HR
-40 to 125
-40 to 125
-40 to 125
-40 to 125
1311BQ1
1000 RoHS & Green
64 RoHS & Green
1000 RoHS & Green
NIPDAU
NIPDAU
NIPDAU
1311BQ1
1311Q1
1311Q1
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
27-Jan-2021
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF AMC1311-Q1 :
Catalog: AMC1311
•
NOTE: Qualified Version Definitions:
Catalog - TI's standard catalog product
•
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
14-Jun-2023
TAPE AND REEL INFORMATION
REEL DIMENSIONS
TAPE DIMENSIONS
K0
P1
W
B0
Reel
Diameter
Cavity
A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
Overall width of the carrier tape
W
P1 Pitch between successive cavity centers
Reel Width (W1)
QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE
Sprocket Holes
Q1 Q2
Q3 Q4
Q1 Q2
Q3 Q4
User Direction of Feed
Pocket Quadrants
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
B0
K0
P1
W
Pin1
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
AMC1311BQDWVRQ1
AMC1311BQDWVRQ1
AMC1311QDWVRQ1
SOIC
SOIC
SOIC
DWV
DWV
DWV
8
8
8
1000
1000
1000
330.0
330.0
330.0
16.4
16.4
16.4
12.15
12.05 6.15
12.15 6.2
6.2
3.05
3.3
16.0
16.0
16.0
16.0
16.0
16.0
Q1
Q1
Q1
3.05
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
14-Jun-2023
TAPE AND REEL BOX DIMENSIONS
Width (mm)
H
W
L
*All dimensions are nominal
Device
Package Type Package Drawing Pins
SPQ
Length (mm) Width (mm) Height (mm)
AMC1311BQDWVRQ1
AMC1311BQDWVRQ1
AMC1311QDWVRQ1
SOIC
SOIC
SOIC
DWV
DWV
DWV
8
8
8
1000
1000
1000
356.0
350.0
356.0
356.0
350.0
356.0
35.0
43.0
35.0
Pack Materials-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
14-Jun-2023
TUBE
T - Tube
height
L - Tube length
W - Tube
width
B - Alignment groove width
*All dimensions are nominal
Device
Package Name Package Type
Pins
SPQ
L (mm)
W (mm)
T (µm)
B (mm)
AMC1311BQDWVQ1
AMC1311QDWVQ1
DWV
DWV
SOIC
SOIC
8
8
64
64
505.46
505.46
13.94
13.94
4826
4826
6.6
6.6
Pack Materials-Page 3
PACKAGE OUTLINE
DWV0008A
SOIC - 2.8 mm max height
S
C
A
L
E
2
.
0
0
0
SOIC
C
SEATING PLANE
11.5 0.25
TYP
PIN 1 ID
AREA
0.1 C
6X 1.27
8
1
2X
5.95
5.75
NOTE 3
3.81
4
5
0.51
0.31
8X
7.6
7.4
0.25
C A
B
A
B
2.8 MAX
NOTE 4
0.33
0.13
TYP
SEE DETAIL A
(2.286)
0.25
GAGE PLANE
0.46
0.36
0 -8
1.0
0.5
DETAIL A
TYPICAL
(2)
4218796/A 09/2013
NOTES:
1. All linear dimensions are in millimeters. Dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm, per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm, per side.
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EXAMPLE BOARD LAYOUT
DWV0008A
SOIC - 2.8 mm max height
SOIC
8X (1.8)
SEE DETAILS
SYMM
SYMM
8X (0.6)
6X (1.27)
(10.9)
LAND PATTERN EXAMPLE
9.1 mm NOMINAL CLEARANCE/CREEPAGE
SCALE:6X
SOLDER MASK
OPENING
SOLDER MASK
OPENING
METAL
METAL
0.07 MAX
ALL AROUND
0.07 MIN
ALL AROUND
SOLDER MASK
DEFINED
NON SOLDER MASK
DEFINED
SOLDER MASK DETAILS
4218796/A 09/2013
NOTES: (continued)
5. Publication IPC-7351 may have alternate designs.
6. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
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EXAMPLE STENCIL DESIGN
DWV0008A
SOIC - 2.8 mm max height
SOIC
SYMM
8X (1.8)
8X (0.6)
SYMM
6X (1.27)
(10.9)
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
SCALE:6X
4218796/A 09/2013
NOTES: (continued)
7. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
8. Board assembly site may have different recommendations for stencil design.
www.ti.com
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