CSD18536KTTT [TI]
采用 D2PAK 封装的单路、1.6mΩ、60V、N 沟道 NexFET™ 功率 MOSFET | KTT | 3 | -55 to 175;型号: | CSD18536KTTT |
厂家: | TEXAS INSTRUMENTS |
描述: | 采用 D2PAK 封装的单路、1.6mΩ、60V、N 沟道 NexFET™ 功率 MOSFET | KTT | 3 | -55 to 175 |
文件: | 总38页 (文件大小:909K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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TPS25810-Q1
ZHCSF05 –NOVEMBER 2016
TPS25810-Q1 具有负载检测功能的 USB Type-C DFP 控制器和电源开关
1 特性
3 说明
1
•
兼容 USB Type-C 版本 1.2 的下行数据端口 (DFP)
控制器
TPS25810-Q1 是一款 USB Type-C 下行数据端口
(DFP) 控制器,集成了一个额定电流为 3A 的 USB 电
源开关。TPS25810-Q1 器件监测 Type-C 配置通道
(CC) 线路,确定 USB 设备何时与其相连。如果连接
与上行数据端口 (UFP) 器件 相连,TPS25810-Q1 可
将电源应用于 VBUS 并将可选 VBUS 拉电流能力通过
CC 线路传输至 UFP。如果使用以电气方式标记的电
缆连接 UFP,TPS25810‑Q1 器件也可以将 VCONN 电
源应用于电缆的 CC 引脚。TPS25810-Q1 器件还会识
别何时连接了 Type-C 音频或调试附件。
•
•
•
•
•
•
•
•
连接器连接或断开检测
配置通道 (CC) STD、1.5A、3A 电流能力通告
超高速极性确定
VBUS 应用和放电
VCONN 应用于电子标记电缆
音频和调试附件识别
端口未连接时,IDDQ 的典型值为 0.7µA
三个输入电源选项
–
–
–
IN1:USB 充电电源
IN2:VCONN 电源
AUX:器件电源
TPS25810-Q1 器件在未连接器件时的电流消耗低于
0.7µA(典型值)。在未连接 UFP 时,S4 和 S5 系统
电源使用 UFP 输出禁用 5V 高功率电源,从而进一步
实现系统节能。在此模式下,器件能够由电压较低
(3.3V) 的辅助电源 (AUX) 供电运行,该电源通常在低
功耗状态(S4 和 S5)下为系统微控制器供电。
•
•
电源唤醒可保证系统冬眠 (S4) 和关闭 (S5) 功耗状
态下的低功耗
34mΩ(典型值)高侧金属氧化物半导体场效应晶
体管 (MOSFET)
•
•
•
1.7A 或 3.4A 可编程 ILIM (±7.1%)
TPS25810-Q1 34mΩ 电源开关具备两种固定电流限值
可供选择,对应于 Type-C 电流水平。FAULT 输出在
开关处于过流和过热条件时发出信号。在所有端口无法
同时提供高电流 (3A) 的环境下,LD_DET 输出可针对
多个高电流 Type-C 端口的功率管理进行控制。
端口功率管理可实现多端口功率资源优化
封装:20 引脚晶圆级四方扁平无引线 (WQFN) 封
(1)
装 (3mm x 4mm)
2 应用
器件信息(1)
•
•
汽车信息娱乐系统
汽车后座 USB 充电
器件型号
封装
封装尺寸(标称值)
超薄四方扁平无引线
(WQFN) (20)
TPS25810-Q1
3.00mm x 4.00mm
(1) 要了解所有可用封装,请参见数据表末尾的可订购产品附录。
(1) CC 引脚符合 IEC-61000-4-2 标准
简化电路原理图
6 ´ 100 kΩ
(Optional)
TPS25810-Q1
VBUS
Bus Power
CC Power
4.5 V–6.5 V
4.5 V–5.5 V
2.9 V–5.5 V
120 µF
OUT
IN1
FAULT
LD_DET
CC1
IN2
Power Switch
Status Signals
Auxiliary Power
AUX
EN
CC2
Control Signals
CHG
CHG_HI
REF
UFP
POL
10 µF
Type-C DFP
Status Signals
AUDIO
DEBUG
Thermal Pad
100 kΩ (1%)
REF_RTN
GND
Copyright © 2016, Texas Instruments Incorporated
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
English Data Sheet: SLVSD95
TPS25810-Q1
ZHCSF05 –NOVEMBER 2016
www.ti.com.cn
目录
7.4 Device Functional Modes........................................ 23
Application and Implementation ........................ 25
8.1 Application Information............................................ 25
8.2 Typical Applications ................................................ 25
Power Supply Recommendations...................... 30
1
2
3
4
5
6
特性.......................................................................... 1
8
9
应用.......................................................................... 1
说明.......................................................................... 1
修订历史记录 ........................................................... 2
Pin Configuration and Functions......................... 3
Specifications......................................................... 5
6.1 Absolute Maximum Ratings ...................................... 5
6.2 ESD Ratings ............................................................ 5
6.3 Recommended Operating Conditions....................... 5
6.4 Thermal Information.................................................. 6
6.5 Electrical Characteristics........................................... 6
6.6 Switching Characteristics.......................................... 8
6.7 Typical Characteristics............................................ 10
Detailed Description ............................................ 12
7.1 Overview ................................................................. 12
7.2 Functional Block Diagram ....................................... 14
7.3 Feature Description................................................. 14
10 Layout................................................................... 31
10.1 Layout Guidelines ................................................. 31
10.2 Layout Example .................................................... 32
11 器件和文档支持 ..................................................... 33
11.1 器件支持 ............................................................... 33
11.2 文档支持 ............................................................... 33
11.3 接收文档更新通知 ................................................. 33
11.4 社区资源................................................................ 33
11.5 商标....................................................................... 33
11.6 静电放电警告......................................................... 33
11.7 Glossary................................................................ 33
12 机械、封装和可订购信息....................................... 33
7
4 修订历史记录
日期
修订版本
注
2016 年 11 月
*
最初发布版本
2
Copyright © 2016, Texas Instruments Incorporated
TPS25810-Q1
www.ti.com.cn
ZHCSF05 –NOVEMBER 2016
5 Pin Configuration and Functions
RVC Package
20-Pin WQFN With Exposed Thermal Pad
Top View
FAULT
IN1
1
2
3
4
5
6
16
15
14
13
12
11
DEBUG
OUT
Thermal
Pad
IN1
OUT
IN2
CC2
AUX
EN
GND
CC1
Not to scale
Pin Functions
PIN
I/O
DESCRIPTION
NO.
NAME
Fault event indicator. Open-drain logic output that asserts low to indicate a current-limit or thermal-
shutdown event due to overtemperature.
1
FAULT
O
2
3
IN1
IN1
I
I
VBUS input supply. Internal power switch connects IN1 to OUT.
VBUS input supply. Internal power switch connects IN1 to OUT.
VCONN input supply. Internal power switch connects IN2 to CC1 or CC2. Short to IN1 if only one
supply is used.
4
IN2
I
Auxiliary input supply. Connect to an always-alive system rail to use the power-wake feature. Short
to IN1 and IN2 if only one supply is used.
5
6
AUX
EN
I
I
Enable logic input. Turns the device on and off
Charge-logic input to select between standard USB (500 mA for a Type-C receptacle supporting
only USB 2.0, and 900 mA for Type-C receptacle supporting USB 3.1) or a Type-C current-sourcing
ability.
7
CHG
I
High-charge logic input to select between 1.5-A and 3-A Type-C current sourcing capability. Valid
when CHG is set to Type-C current.
8
9
CHG_HI
REF_RTN
REF
I
I
I
Precision signal-reference return. Connect to the REF pin via a 100-kΩ, 1% resistor.
Analog input used to generate the internal current reference. Connect a 1% or better, 100-ppm,
100-kΩ resistor between this pin and REF_RTN.
10
11
12
13
14
15
16
17
CC1
GND
I/O
—
I/O
O
Analog input/output that connects to the Type-C receptacle CC1 pin
Power ground
CC2
Analog input/output that connects to the Type-C receptacle CC2 pin.
Power switch output
OUT
OUT
O
Power switch output
DEBUG
AUDIO
O
Open-drain logic output that asserts when a Type-C debug accessory is identified on the CC lines.
Open-drain logic output that asserts when a Type-C audio accessory is identified on the CC lines.
O
Copyright © 2016, Texas Instruments Incorporated
3
TPS25810-Q1
ZHCSF05 –NOVEMBER 2016
www.ti.com.cn
Pin Functions (continued)
PIN
I/O
DESCRIPTION
NO.
NAME
Polarity open-drain logic output that signals which Type-C CC pin is connected to the CC line. This
gives the information needed to multiplex the super-speed lines. Asserted when the CC2 pin is
connected to the CC line in the cable.
18
POL
O
19
20
UFP
O
O
Open-drain logic output that asserts when a Type-C UFP is identified on the CC lines.
Load-detect open-drain logic output that signals when a device set to source Type-C 3-A current is
sourcing over 1.95 A, nominal.
LD_DET
Thermal pad on the bottom of the package. The thermal pad is internally connected to GND and is
used to heat-sink the device to the circuit board. Connect the thermal pad to the GND plane.
—
Thermal pad
—
4
Copyright © 2016, Texas Instruments Incorporated
TPS25810-Q1
www.ti.com.cn
ZHCSF05 –NOVEMBER 2016
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range, voltages are respect to GND (unless otherwise noted)
(1)
MIN
MAX
UNIT
IN1, IN2, AUX, EN, CHG, CHG_HI, REF, OUT, LD_DET,
FAULT, CC1, CC2, UFP, POL, AUDIO, DEBUG
–0.3
7
V
Pin voltage, V
Internally
connected
to GND
REF_RTN
V
Internally
limited
Pin positive source current, ISRC
Pin positive sink current, ISNK
OUT, REF, CC1, CC2
A
OUT (while applying VBUS
)
5
1
A
A
CC1, CC2 (while applying VCONN
)
Internally
limited
LD_DET, FAULT, UFP, POL, AUDIO, DEBUG
mA
Operating junction temperature, TJ
Storage temperature range, Tstg
–40
–65
180
150
°C
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
6.2 ESD Ratings
VALUE
±2 000
±500
UNIT
Human-body model (HBM), per per AEC Q100-002(2)
Charged-device model (CDM), per per AEC Q100-011
61000-4-2 contact discharge, CC1 and CC2(3) IEC
IEC 61000-4-2 air discharge, CC1 and CC2(3)
Electrostatic
discharge
(1)
V(ESD)
V
±8 000
±15 000
(1) Electrostatic discharge (ESD) to measure device sensitivity and immunity to damage caused by assembly line electrostatic discharges
into the device.
(2) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
(3) Surges per IEC61000-402, 1999 applied between CC1/CC2 and output ground of the TPS25810EVM-745.
6.3 Recommended Operating Conditions
Voltages are with respect to GND (unless otherwise noted)
MIN NOM
MAX UNIT
IN1
4.5
4.5
2.9
0
6.5
VIN
Supply voltage
IN2
5.5
5.5
5.5
V
AUX
VI
Input voltage
EN, CHG, CHG_HI
EN, CHG, CHG_HI
EN, CHG, CHG_HI
V
V
V
VIH
VIL
High-level input voltage
Low-level voltage
1.17
0.63
5.5
Used on LD_DET, FAULT, UFP, POL, AUDIO,
DEBUG
VPU
ISRC
ISNK
Pullup voltage
0
V
OUT
3
A
Positive source current
CC1 or CC2 when supplying VCONN
250
mA
Positive sink current (10 ms moving
average)
LD_DET, FAULT, UFP, POL, AUDIO, DEBUG
10
mA
mA
Internally
limited
ISNK_PULSE Positive repetitive pulse sink current LD_DET, FAULT, UFP, POL, AUDIO, DEBUG
RREF
TJ
Reference resistor
98
100
102
125
kΩ
Operating junction temperature
–40
°C
Copyright © 2016, Texas Instruments Incorporated
5
TPS25810-Q1
ZHCSF05 –NOVEMBER 2016
www.ti.com.cn
6.4 Thermal Information
TPS25810-Q1
THERMAL METRIC(1)
RVC (WQFN)
UNIT
20 PINS
39.3
43.4
13
RθJA
Junction-to-ambient thermal resistance
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
RθJC(top)
RθJB
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
ψJT
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
0.7
ψJB
13
RθJC(bot)
4.2
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
6.5 Electrical Characteristics
–40°C ≤ TJ ≤ 125°C, 4.5 V ≤ VIN1 ≤ 6.5 V, 4.5 V ≤ VIN2 ≤ 5.5 V, 2.9 V ≤ VAUX ≤ 5.5 V; VEN = VCHG = VCHG_HI = VAUX, RREF
=
100 kΩ. Typical values are at 25°C. All voltages are with respect to GND. IOUT and IOS defined positive out of the indicated pin
(unless otherwise noted)
PARAMETER
OUT – POWER SWITCH
TEST CONDITIONS
MIN
TYP
MAX
UNIT
TJ = 25°C, IOUT = 3 A
34
34
34
37
46
55
rDS(on)
On-resistance(1)
–40°C ≤ TJ ≤ 85°C, IOUT = 3 A
–40°C ≤ TJ ≤ 125°C, IOUT = 3 A
VOUT = 6.5 V, VIN1 = VEN = 0 V,
mΩ
IREV
OUT to IN reverse leakage current –40°C ≤ TJ ≤ 85°C,
0
3
µA
IREV is current out of IN1 pin
OUT – CURRENT LIMIT
VCHG = 0 V or VCHG = VAUX and VCHG_HI
0 V
=
1.58
3.16
1.7
3.4
1.82
(1)
IOS
Short circuit current limit
A
3.64
7
RREF = 10 Ω
OUT – DISCHARGE
VOUT = 4 V, UFP signature removed from
CC lines, time < tw_DCHG
Discharge resistance
400
100
500
150
600
250
Ω
VOUT = 4 V, No UFP signature on CC lines,
time > tw_DCHG
Bleed discharge resistance
kΩ
REF
VO
Output voltage
0.78
9.5
0.8
0.82
15.3
V
IOS
Short circuit current
RREF = 10 Ω
µA
FAULT
VOL
Output low voltage
Off-state leakage
IFAULT = 1 mA
VFAULT = 5.5 V
350
1
mV
µA
IOFF
LD_DET
VOL
Output low voltage
Off-state leakage
ILD_DET = 1 mA
VLD_DET = 5.5 V
350
1
mV
µA
IOFF
OUT sourcing, rising threshold
current for load detect
Hysteresis(2)
ITH
1.8
1.95
125
2.1
A
mA
(1) Pulse-testing techniques maintain junction temperature close to ambient temperature; thermal effects must be taken into account
separately.
(2) These parameters are provided for reference only and do not constitute part of TI’s published specifications for purposes of TI’s product
warranty.
6
Copyright © 2016, Texas Instruments Incorporated
TPS25810-Q1
www.ti.com.cn
ZHCSF05 –NOVEMBER 2016
Electrical Characteristics (continued)
–40°C ≤ TJ ≤ 125°C, 4.5 V ≤ VIN1 ≤ 6.5 V, 4.5 V ≤ VIN2 ≤ 5.5 V, 2.9 V ≤ VAUX ≤ 5.5 V; VEN = VCHG = VCHG_HI = VAUX, RREF
=
100 kΩ. Typical values are at 25°C. All voltages are with respect to GND. IOUT and IOS defined positive out of the indicated pin
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
CC1, CC2 – VCONN POWER SWITCH
TJ = 25°C, IOUT = 250 mA
365
365
365
420
530
600
rDS(on)
On-resistance
–40°C ≤ TJ ≤ 85°C, IOUT = 250 mA
–40°C ≤ TJ ≤ 125°C, IOUT = 250 mA
mΩ
CC1, CC2 – VCONN POWER SWITCH – CURRENT LIMIT
300
355
410
800
IOS
Short-circuit current limit(1)
mA
µA
RREF = 10 Ω
CC1, CC2 – CONNECT MANAGEMENT – DANGLING ELECTRONICALLY MARKED CABLE MODE
Sourcing current on the pass-
0 V ≤ VCCx ≤ 1.5 V
64
64
80
80
96
96
through CC Line
ISRC
Sourcing current on the Ra CC
0 V ≤ VCCx ≤ 1.5 V
line
CC1, CC2 – CONNECT MANAGEMENT – ACCESSORY MODE
CCx sourcing current
0 V ≤ VCCx ≤ 1.5 V
64
80
0
96
(CC2 – audio, CC1-debug)
ISRC
µA
µA
µA
CCx sourcing current
0 V ≤ VCCx ≤ 1.5 V
(2)
(CC1 – audio, CC2-debug)
CC1, CC2 – CONNECT MANAGEMENT – UFP MODE
0 V ≤ VCCx ≤ 1.5 V
VIN1 < VTH_UVLO_IN1 or VIN2 < VTH_UVLO_IN2
Sourcing current with either IN1 or
IN2 in UVLO
ISRC
64
75
80
80
96
85
VCHG = 0 V and VCHG_HI = 0 V
0 V ≤ VCCx ≤ 1.5 V
VCHG = VAUX and VCHG_HI = 0 V
0 V ≤ VCCx ≤ 1.5 V
ISRC
Sourcing current
170
312
180
330
190
348
VCHG = VAUX and VCHG_HI = VAUX
0 V ≤ VCCx ≤ 2.45 V
UFP, POL, AUDIO, DEBUG
VOL
IOFF
Output low voltage
Off-state leakage
ISNK_PIN = 1 mA
VPIN = 5.5 V
250
1
mV
µA
EN, CHG, CHG_HI – LOGIC INPUTS
VTH
VTH
Rising threshold voltage
Falling threshold voltage
Hysteresis(2)
0.925
0.875
50
1.15
0.5
V
V
0.65
–0.5
mV
µA
IIN
Input current
VEN = 0 V or 6.5 V
OVERTEMPERATURE SHUTDOWN
Rising threshold temperature for
device shutdown
Hysteresis(2)
TTH_OTSD2
155
135
°C
°C
20
20
Rising threshold temperature for
OUT/ VCONN switch shutdown in
current limit
Hysteresis(2)
TTH_OTSD1
°C
°C
IN1
VTH_UVLO_IN1 Rising threshold voltage for UVLO
Hysteresis(2)
3.9
4.1
4.3
V
100
mV
µA
IIN1(DIS)
Disabled supply current
VEN = 0 V, –40°C ≤ TJ ≤ 85°C
–40°C ≤ TJ ≤ 85°C
1
1
Enabled supply current with CC
lines open
IIN1(CC_OPEN)
µA
Copyright © 2016, Texas Instruments Incorporated
7
TPS25810-Q1
ZHCSF05 –NOVEMBER 2016
www.ti.com.cn
Electrical Characteristics (continued)
–40°C ≤ TJ ≤ 125°C, 4.5 V ≤ VIN1 ≤ 6.5 V, 4.5 V ≤ VIN2 ≤ 5.5 V, 2.9 V ≤ VAUX ≤ 5.5 V; VEN = VCHG = VCHG_HI = VAUX, RREF
=
100 kΩ. Typical values are at 25°C. All voltages are with respect to GND. IOUT and IOS defined positive out of the indicated pin
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Enabled supply current with
accessory or dangling
electronically marked cable
signature on CC lines
IIN1(Ra)
2
µA
VCHG = 0 V, or VCHG = VAUX and VCHG_HI
0 V
=
75
85
100
110
Enabled supply current with UFP
attached
IIN1(Rd)
µA
IN2
VTH_UVLO_IN2 Rising threshold voltage for UVLO
Hysteresis(2)
3.9
4.1
4.3
V
100
mV
µA
IIN2(DIS)
Disabled supply current
VEN = 0 V, –40°C ≤ TJ ≤ 85°C
–40°C ≤ TJ ≤ 85°C
1
1
IIN2(CC_OPEN) Enabled supply current with CC
lines open
µA
Enabled supply current with
accessory or dangling
electronically marked cable
IIN2(Ra)
2
µA
signature on CC lines
Enabled supply current with UFP
signature on CC lines
(Includes IN current that provides
the CC output current to the UFP
Rd resistor)
VCHG = 0 V, 0 V ≤ VCCx ≤ 1.5 V
98
198
348
110
215
373
VCHG = VIN and VCHG_HI = 0 V, 0 V ≤ VCCx
1.5 V
≤
IIN2(Rd)
µA
0 V ≤ VCCx ≤ 2.45 V
AUX
VTH_UVLO_AUX Rising threshold voltage for UVLO
Hysteresis(2)
2.65
2.75
100
2.85
V
mV
µA
IAUX(DIS)
Disabled supply current
VEN = 0 V, –40°C ≤ TJ ≤ 85°C
–40°C ≤ TJ ≤ 85°C
1
3
Enabled internal supply current
with CC lines open
IAUX(CC_OPEN)
0.7
µA
Enabled supply current with
accessory or dangling active cable
signature on CC lines
IAUX(Ra)
140
185
µA
Enabled supply current with UFP
termination on CC lines and with
either IN1 or IN2 in UVLO
IAUX(Rd_noIN)
VIN1 < VTH_UVLO_IN1 or VIN2 < VTH_UVLO_IN2
145
55
190
82
µA
µA
Enabled supply current with UFP
termination on CC lines
IAUX(Rd)
6.6 Switching Characteristics
–40°C ≤ TJ ≤ 125°C, 4.5 V ≤ VIN1 ≤ 6.5 V, 4.5 V ≤ VIN2 ≤ 5.5 V, 2.9 V ≤ VAUX ≤ 5.5 V; VEN = VCHG = VCHG_HI = VAUX, RREF
=
100 kΩ. Typical values are at 25°C. All voltages are with respect to GND. IOUT and IOS defined positive out of the indicated pin
(unless otherwise noted)
PARAMETER
OUT – POWER SWITCH
TEST CONDITIONS
MIN
TYP
MAX
UNIT
tr
tf
Output-voltage rise time
Output-voltage fall time
VIN1 = 5 V, CL = 1 µF, RL = 100 Ω
(measured from 10% to 90% of final
value)
1.2
1.8
2.5
ms
ms
0.35
0.55
0.75
ton
toff
Output-voltage turnon time
Output-voltage turnoff time
2.5
2
3.5
3
5
ms
ms
VIN1 = 5 V, CL = 1 µF, RL = 100 Ω
4.5
OUT – CURRENT LIMIT
Current-limit response time to short VIN1 – VOUT = 1 V, RL = 10 mΩ, see
circuit Figure 1
tios
1.5
4
µs
8
Copyright © 2016, Texas Instruments Incorporated
TPS25810-Q1
www.ti.com.cn
ZHCSF05 –NOVEMBER 2016
Switching Characteristics (continued)
–40°C ≤ TJ ≤ 125°C, 4.5 V ≤ VIN1 ≤ 6.5 V, 4.5 V ≤ VIN2 ≤ 5.5 V, 2.9 V ≤ VAUX ≤ 5.5 V; VEN = VCHG = VCHG_HI = VAUX, RREF
=
100 kΩ. Typical values are at 25°C. All voltages are with respect to GND. IOUT and IOS defined positive out of the indicated pin
(unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
FAULT
tDEGA
Asserting deglitch due to overcurrent
5.5
8.2
0
10.7
ms
ms
ms
Asserting deglitch due to
tDEGA(OC)
overtemperature in current limit(1)
tDEGA(OT)
LD_DET
tDEGA
Deasserting deglitch
5.5
8.2
10.7
Asserting deglitch
45
65
85
ms
s
tDEGD
Deasserting deglitch
1.45
2.15
2.9
OUT – DISCHARGE
RDCHG discharge time
CC1, CC2 - VCONN POWER SWITCH
VOUT = 1 V, time ISNK_OUT > 1 mA
after UFP signature removed from
CC lines
39
65
96
ms
tr
tf
Output voltage rise time
Output voltage fall time
VIN2 = 5 V, CL = 1 µF, RL = 100 Ω
(measured from 10% to 90% of final
value)
0.15
0.18
0.25
0.22
0.35
0.26
ms
ms
ton
toff
Output voltage turnon time
Output voltage turnoff time
1
1.5
0.4
2
ms
ms
VIN2 = 5 V, CL = 1 µF, RL = 100 Ω
0.3
0.55
CC1, CC2 – VCONN POWER SWITCH – CURRENT LIMIT
Current limit response time to short
circuit
VIN2 – VCONN = 1 V, R = 10 mΩ, see
Figure 1
tres
1
3
µs
UFP, POL, AUDIO, DEBUG
tDEGR
tDEGF
Asserting deglitch
100
7.9
150
200
ms
ms
Deasserting deglitch
12.5
17.7
(1) These parameters are provided for reference only and do not constitute part of TI’s published specifications for purposes of TI’s product
warranty.
IOS
IOUT
tios
Figure 1. Output Short-Circuit Timing Diagram
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ZHCSF05 –NOVEMBER 2016
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6.7 Typical Characteristics
50
500
450
400
350
300
250
40
30
20
10
0
-40 -25 -10
5
20 35 50 65 80 95 110 125
-40 -25 -10
5
20 35 50 65 80 95 110 125
TJ - Junction Temperature (oC)
TJ - Junction Temperature (oC)
D001
D001
Figure 2. VBUS Current-Limiting Switch On-Resistance vs
Temperature
Figure 3. VCONN Current-Limiting Switch On-Resistance vs
Temperature
0.25
0.2
0.15
0.1
0.05
0
4000
3500
3000
VBUS ILIM 3 A
VBUS ILIM 1.5 A
VCONN_ILIM
2500
2000
1500
1000
500
0
-40 -25 -10
5
20 35 50 65 80 95 110 125
-40 -25 -10
5
20 35 50 65 80 95 110 125
TJ - Junction Temperature (oC)
TJ - Junction Temperature (oC)
D001
D001
Device = Disabled; (VOUT – VIN) = 6. 5V
Figure 4. OUT Reverse Leakage Current vs Temperature
Figure 5. ILIM for VBUS and VCONN vs Temperature
2010
350
300
250
200
150
100
50
LD_DET Threshold Rising
LD_DET Threshold Falling
1990
1970
1950
1930
1910
1890
1870
1850
1830
1810
1790
1770
1750
UFP 3 A
UFP 1.5 A
UFP 0.5 A/0.9 A
-40 -25 -10
5
20 35 50 65 80 95 110 125
-40 -25 -10
5
20 35 50 65 80 95 110 125
TJ - Junction Temperature (oC)
TJ - Junction Temperature (oC)
D001
D001
Figure 6. LD_DET Threshold vs Temperature
Figure 7. CC Sourcing Current to UFP vs Temperature
10
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Typical Characteristics (continued)
100
400
350
300
250
200
150
100
50
IN1 UFP 3 A
IN1 UFP 0.5 A/1.5 A
95
IN2 UFP 3 A
IN2 UFP 1.5 A
IN2 UFP 0.5 A
90
85
80
75
70
-40 -25 -10
5
20 35 50 65 80 95 110 125
-40 -25 -10
5
20 35 50 65 80 95 110 125
TJ - Junction Temperature (oC)
TJ - Junction Temperature (oC)
D001
D001
Figure 8. IN1 Current With UFP vs Temperature
Figure 9. IN2 Current With UFP vs Temperature
70
65
60
55
50
45
40
-40 -25 -10
5
20 35 50 65 80 95 110 125
TJ - Junction Temperature (oC)
D001
VAUX = 5 V
Figure 10. AUX Current With UFP vs Temperature
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7 Detailed Description
7.1 Overview
The TPS25810-Q1 device is a highly integrated USB Type-C™ downstream-facing port (DFP) controller with
built-in power switch developed for the new USB Type-C connector and cable. The device provides all of the
functionality needed to support a USB Type-C DFP in a system where USB power delivery (PD) source
capabilities (for example, VBUS > 5 V) are not implemented. The device is designed to be compliant with the
Type‑C specification, revision 1.1.
7.1.1 USB Type-C Basic
For a detailed description of the Type-C specification, see the USB-IF Web site to download the latest released
version. Some of the basic concepts of the Type-C specification that pertain to understanding the operation of
the TPS25810-Q1 device (a DFP device) are described as follows.
USB Type-C removes the need for different plug and receptacle types for host and device functionality. The
Type-C receptacle replaces both Type-A and Type-B receptacles because the Type-C cable is pluggable in
either direction between host and device. A host-to-device logical relationship is maintained via the configuration
channel (CC). Optionally, hosts and devices can be either providers or consumers of power when USB PD
communication is used to swap roles.
All USB Type-C ports operate in one of the following three data modes:
•
•
•
Host mode: the port can only be host (provider of power).
Device mode: the port can only be device (consumer of power).
Dual-role mode: the port can be either host or device.
Port types:
•
•
•
DFP (downstream facing port): Host
UFP (upstream facing port): Device
DRP (dual-role port): Host or device
Valid DFP-to-UFP connections:
•
•
Table 1 describes valid DFP-to-UFP connections.
Host-to-host and device-to-device have no functions.
Table 1. DFP-to-UFP Connections
DEVICE-MODE
PORT
HOST-MODE PORT
DUAL-ROLE PORT
Host-mode port
Device-mode port
Dual-role port
No function
Works
Works
No function
Works
Works
Works
Works(1)
Works
(1) This may be automatic or manually driven.
7.1.2 Configuration Channel
The function of the configuration channel (CC) is to detect connections and configure the interface across the
USB Type-C cables and connectors.
Functionally, the configuration channel serves the following purposes:
•
•
•
•
•
•
Detect connection to the USB ports
Resolve cable orientation and twist connections to establish USB data bus routing
Establish DFP and UFP roles between two connected ports
Discover and configure power: USB Type-C current modes or USB power delivery
Discover and configure optional alternate and accessory modes
Enhance flexibility and ease of use
Typical flow of DFP to UFP configuration is shown in Figure 11:
12
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Detect Valid
Connection
Establish USB
Power Method
USB Device
Enumeration
Figure 11. Flow of DFP to UFP Configuration
7.1.3 Detecting a Connection
DFPs and DRPs fulfill the role of detecting a valid connection over USB Type-C. Figure 12 shows a DFP-to-UFP
connection made with Type-C cable. As shown in Figure 12, the detection concept is based on being able to
detect terminations in the product that has been attached. A pullup and pulldown termination model is used. A
pullup termination can be replaced by a current source.
•
In the DFP-UFP connection, the DFP monitors both CC pins for a voltage lower than the unterminated
voltage.
•
•
A UFP advertises Rd on both its CC pins (CC1 and CC2).
A powered cable advertises Ra on only one of the CC pins of the plug. Ra is used to inform the source to
apply VCONN
.
•
An analog audio device advertises Ra on both CC pins of the plug, which identifies it as an analog audio
device. VCONN is not applied on either CC pin in this case.
UFP monitors for
connection
DFP monitors for
connection
Cable
CC
Rp
Rp
Rds
Rds
Ra
Ra
DFP monitors for
connection
UFP monitors for
connection
Figure 12. DFP-UFP Connection
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7.2 Functional Block Diagram
7.3 Feature Description
The TPS25810-Q1 device is a DFP Type-C port controller with integrated power switches for VCONN and VBUS
.
The TPS25810-Q1 device does not support BC1.2 charging modes, because it does not interact with USB D+
and D– data lines. The TPS25810-Q1 device can be used in conjunction with a BC 1.2 device like the
TPS2514A-Q1 to support BC1.2 and Type-C charging modes in a single Type-C DFP port. See the TPS25810
EVM user's guide (SLVUAI0) and Application and Implementation section of this data sheet for more details. The
TPS25810-Q1 device can be used in a USB 2.0 only or in a USB 3.1 port implementation. When used in a USB
3.1 port, the TPS25810-Q1 device can control an external super-speed MUX to handle the Type-C flippable
feature.
14
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Feature Description (continued)
7.3.1 Configuration Channel Pins CC1 and CC2
The TPS25810-Q1 device has two pins, CC1 and CC2, that serve to detect an attachment to the port and to
resolve cable orientation. These pins are also used to establish the current broadcast to a valid UFP, configure
VCONN, and detect attachment of a debug or audio-adapter accessory.
Table 2 lists the TPS25810-Q1 response to various attachments to its port.
Table 2. TPS25810-Q1 Response
TPS25810-Q1 RESPONSE(1)
VCONN
on CC1 or
CC2
TPS25810-Q1 TYPE-C PORT
CC1
CC2
OUT
POL
UFP
AUDIO
DEBUG
Nothing attached
UFP connected
UFP connected
OPEN
Rd
OPEN
OPEN
Rd
OPEN
IN1
NO
NO
NO
Hi-Z
Hi-Z
Hi-Z
LOW
LOW
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
OPEN
IN1
LOW
Powered cable, no UFP
connected
OPEN
Ra
Ra
OPEN
Ra
OPEN
OPEN
IN1
NO
NO
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Powered cable, no UFP
connected
Powered cable, UFP
connected
Rd
CC2
LOW
Powered cable, UFP
connected
Ra
Rd
Ra
Rd
Rd
Ra
IN1
CC1
NO
LOW
Hi-Z
Hi-Z
LOW
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
LOW
Hi-Z
Debug accessory connected
OPEN
OPEN
Audio-adapter accessory
connected
NO
LOW
(1) POL, UFP, AUDIO, and DEBUG are open-drain outputs; pull high with 100 kΩ to AUX when used. Tie to GND or leave open when not
used.
7.3.2 Current Capability Advertisement and Overload Protection
The TPS25810-Q1 device supports all three Type-C current advertisements as defined by the USB Type-C
standard. Current broadcast to a connected UFP is controlled by the CHG and CHG_HI pins. For each broadcast
level, the device protects itself from a UFP that draws current in excess of the USB Type-C current
advertisement of that port by setting the current limit as shown in Table 3.
Table 3. USB Type-C Current Advertisement
CC CAPABILITY
BROADCAST
LOAD DETECT
THRESHOLD (TYP)
CHG
CHG_HI
CURRENT LIMIT (TYP)
0
0
1
1
0
1
0
1
STD
STD
1.5 A
3 A
1.7 A
1.7 A
1.7 A
3.4 A
NA
NA
NA
1.95 A
Under OUT overload conditions, an internal OUT current-limit regulator limits the output current to the selected
ILIM based on CHG and CHG_HI selection. In applications where VCONN is supplied via CC1 or CC2, separate
fixed current-limit regulators protect these pins from overload at the level indicated in the Electrical
Characteristics table. When an overload condition is present, the device maintains a constant output current, with
the output voltage determined by (IOS × RLOAD). Two possible overload conditions can occur. The first overload
condition occurs when either: 1) input voltage is first applied, enable is true, and a short circuit is present (load
which draws IOUT > IOS), or 2) input voltage is present and the TPS25810-Q1 device is enabled into a short
circuit. The output voltage is held near zero potential with respect to ground and the TPS25810-Q1 device ramps
the output current to IOS. The TPS25810-Q1 device limits the current to IOS until the overload condition is
removed or the device begins to thermal cycle. This is demonstrated in Figure 24 where the device was enabled
into a short, and subsequently cycles current off and on as the thermal protection engages.
Copyright © 2016, Texas Instruments Incorporated
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The second condition is when an overload occurs while the device is enabled and fully turned on. The device
responds to the overload condition within time tios (see Figure 1) when the specified overload (per Electrical
Characteristics) is applied. The response speed and shape vary with the overload level, input circuit, and rate of
application. The current-limit response varies between simply settling to IOS or turnoff and controlled return to IOS
.
Similar to the previous case, the TPS25810-Q1 device limits the current to IOS until the overload condition is
removed or the device begins to thermal cycle.
The TPS25810-Q1 device thermal cycles if an overload condition is present long enough to activate thermal
limiting in any of the above cases. This is due to the relatively large power dissipation [(VIN – VOUT) × IOS] driving
the junction temperature up. The device turns off when the junction temperature exceeds 135°C (min) while in
current limit. The device remains off until the junction temperature cools 20°C and then restarts. The
TPS25810‑Q1 current-limit profile is shown in Figure 13.
VOUT
Slope = -r DS(on)
0 V
IOUT
0 A
IOS
Figure 13. Current Limit Profile
7.3.3 Undervoltage Lockout (UVLO)
The undervoltage lockout (UVLO) circuit disables the power switch until the input voltage reaches the UVLO
turnon threshold. Built-in hysteresis prevents unwanted on-off cycling due to input voltage droop during turnon.
7.3.3.1 Device Power Pins (IN1, IN2, AUX, OUT, and GND)
The device has multiple input power pins: IN1, IN2 and AUX. IN1 is connected to OUT by the internal power FET
and serves the supply for the Type-C charging current. IN2 is the supply for VCONN and ties directly between the
VCONN power switch on its input and CC1 or CC2 on its output. AUX, the auxiliary input supply, provides power to
the device. See the Functional Block Diagram.
In the simplest implementation where multiple supplies are not available; IN1, IN2, and AUX can be tied together.
However, in mobile systems (battery powered) where system power savings is paramount, IN1 and IN2 can be
powered by the high-power dc-dc supply (>3-A capability), and AUX can be connected to the low-power supply
that typically powers the system microcontroller when the system is in the hibernate or sleep power state. Unlike
IN1 and IN2, AUX can operate directly from a 3.3-V supply commonly used to power the microcontroller when
the system is put in low-power mode. Ceramic bypass capacitors close to the device from the INx and AUX pins
to GND are recommended to alleviate bus transients.
The recommended operating voltage range for IN1 and IN2 is 4.5 V to 5.5 V, whereas AUX can be operated
from 2.9 V to 5.5 V. However IN1, the high-power supply, can operate up to 6.5 V. This higher input voltage
affords a larger IR loss budget in systems where a long cable harness is used, and results in high IR losses with
3-A charging current. Increasing IN1 beyond 5.5 V enables longer cable and board trace lengths between the
device and the Type-C receptacle while meeting the USB specification for VBUS ≥ 4.75 V at the connector.
Figure 14 illustrates the point. In this example IN1 is at 5 V, which restricts the IR loss budget from the dc-dc
converter to the connector to 250 mV.
16
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ZHCSF05 –NOVEMBER 2016
Total IR Drop Budget = 250 mV
Trace IR Drop Budget at 3 A
= 250 – 165 = 85 mV
V_Trace1
V_Trace2
V_TPS25810-Q1
V_DC-DC = 5 V
V_Connector
= 4.75 V (MIN)
IN1
OUT
5-V DC-DC
MaxRds_On = 55 mΩ
165-mV Drop at 3 A
82.5-mV Drop at 1.5 A
Figure 14. Total IR Loss Budget
7.3.3.2 FAULT Response
The FAULT pin is an open-drain output asserted low when the device OUT current exceeds its programmed
value and the overtemperature threshold (TTH_OTSD1) is crossed. See the Electrical Characteristics for overcurrent
and overtemperature values. The FAULT signal remains asserted until the fault condition is removed and the
device resumes normal operation. The TPS25810-Q1 device is designed to eliminate false overcurrent fault
reporting by using an internal deglitch circuit.
Connect FAULT with a pullup resistor to AUX. FAULT can be left open or tied to GND when not used.
7.3.3.3 Thermal Shutdown
The device has two internal overtemperature shutdown thresholds, TTH_OTSD1 and TTH_OTSD2, to protect the
internal FET from damage and assist with overall safety of the system. TTH_OTSD2 is greater than TTH_OTSD1
.
FAULT is asserted low to signal a fault condition when the device temperature exceeds TTH_OTSD1 and the
current-limit switch is disabled. However when TTH_OTSD2 is exceeded, all open-drain outputs are left open and
the device is disabled such that minimum power and heat are dissipated. The device attempts to power up when
the die temperature decreases by 20°C.
7.3.3.4 REF
A 100-kΩ (1% or better recommended) resistor is connected from this pin to REF_RTN. The REF pin sets the
reference current required to bias the internal circuitry of the device. The overload current-limit tolerance and CC
currents depend upon the accuracy of this resistor. Using a ±1% or better low-temperature-coefficient resistor
yields the best current-limit accuracy and overall device performance.
7.3.3.5 Audio Accessory Detection
The USB Type-C specification defines an audio-adapter decode state which allows implementation of an analog
USB Type-C to 3.5-mm headset adapter. The TPS25810-Q1 device detects an audio accessory device when
both CC1 and CC2 pins detect VRa voltage (when pulled to ground by an Ra resistor). The device asserts the
open-drain AUDIO pin low to indicate the detection of such a device.
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Table 4. Audio Accessory Detection
CC1
CC2
AUDIO
STATE
Audio-adapter accessory connected
Ra
Ra
Asserted (pulled low)
Platforms supporting the audio accessory function can be triggered by the AUDIO pin to enable accessory mode
circuits to support the audio function. When the Ra pulldown is removed from the CC2 pin, AUDIO is deasserted
or pulled high. The TPS25810-Q1 device monitors the CC2 pin for audio device detach. When this function is not
needed (for example in a data-less port), AUDIO can be tied to GND or left open.
7.3.3.6 Debug Accessory Detection
The Type-C spec supports an optional debug-accessory mode, used for debug only and not to be used for
communicating with commercial products. When the TPS25810-Q1 device detects VRd voltage on both CC1 and
CC2 pins (when pulled to ground by an Rd resistor), it asserts DEBUG low. With DEBUG asserted, the system
can enter debug mode for factory testing or a similar functional mode. DEBUG deasserts or pulls high when Rd
is removed from CC1. The TPS25810-Q1 device monitors the CC1 pin for debug-accessory detach.
If the debug-accessory mode is not used, tie DEBUG to GND or leave it open.
Table 5. Debug Accessory Detection
CC1
CC2
POL
STATE
Rd
Rd
Asserted (pulled low)
Debug accessory connected
7.3.3.7 Plug Polarity Detection
Reversible Type-C plug orientation is reported by the POL pin when a UFP is connected. However, when no
UFP is attached POL remains deasserted, irrespective of cable plug orientation. Table 6 describes the POL state
based on which of the device CC pins detects VRd from an attached UFP pulldown.
Table 6. Plug Polarity Detection
CC1
Rd
CC2
Open
Rd
POL
Hi-Z
STATE
UFP connected
Open
Asserted (pulled low)
UFP connected with reverse plug orientation
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Figure 15 shows an example implementation which uses the POL terminal to control the SEL terminal on the
HD3SS3212 device. The HD3SS3212 device provides switching on the differential channels between Port B and
Port C to Port A, depending on cable orientation. For details on the HD3SS3212 device, see the HD3SS3212
data sheet (SLASE74).
3.3 V
HD3SS3212
USB C
SSTXp2
0.1 µF
0.1 µF
0.1 µF
0.1 µF
B0+
Dp1
Dp2
USB Host
SSTXp
VCC
Dp
B0–
C0+
C0–
B1+
B1–
C1+
C1–
SSTXn2
SSTXp1
SSTXn1
SSRXp2
SSRXn2
SSRXp1
SSRXn1
A0+
A0–
Dm
Dm1
Dm2
SSTXn
SSRXp
A1+
A1–
SSRXn
Dp
GND
GND
GND
GND
Dp
Dm
Dm
OEn
SEL
3.3 V
GND
GND
GND
TPS25810-Q1
OUT
5 V
POL
OUT
UFP
CC1
CC2
IN1
IN1
5 V
IN2
CHG
AUX
EN
CHG H_I
FAULT
LD_DET
AUDIO
REF
REF_RTN
GND
DEBUG
Thermal Pad
Copyright © 2016, Texas Instruments Incorporated
Figure 15. Example Implementation
7.3.3.8 Device Enable Control
The logic enable pin (EN) controls the power switch and device supply current. The supply current is reduced to
less than 1 μA when a logic low is present on EN. The EN pin provides a convenient way to turn on or turn off
the device while it is powered. The enable input threshold has built-in hysteresis. When this pin is pulled high, the
device is turned on or enabled. When the device is disabled (EN pulled low) the internal FETs tied to IN1 and
IN2 are disconnected, all open-drain outputs are left open (Hi-Z), and the monitor block for CC1 and CC2 is
turned off. The EN terminal should not be left floating.
7.3.3.9 Load Detect
The load-detect function in the device is enabled when the device is set to broadcast high-current VBUS charging
(CHG = CHG_HI = High) on the CC pin. In this mode, the device monitors the OUT current to a UFP; if the
current exceeds 1.95 A (typ), the LD_DET pin asserts. Because LD_DET is an open-drain output, pull it high with
100 kΩ to AUX when used; tie it to GND or leave it open when not used.
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7.3.3.10 Power Wake
The power-wake feature supported in the TPS25810-Q1 device offers the mobile-systems designer a way to
save on system power when no UFP is attached to the Type-C port. See Figure 16. To enable power wake, the
UFP pins from device No. 1 and No. 2 are tied together (each with its own 100-kΩ pullup) to the enable pin of a
5-V, 6-A dc-dc buck converter. When no UFP is detected on both Type-C ports, the EN pin of the dc-dc
converter is pulled high, thereby disabling it. Because both TPS25810-Q1 devices are powered by an always-on
3.3-V LDO, turning off the supply to IN1 and IN2 does not affect its operation in detach state. Anytime a UFP is
detected on either port, the corresponding TPS25810-Q1 UFP pin is pulled low, enabling the dc-dc converter to
provide charging current to the attached UFP. Turning off the high-power dc-dc converter when ports are
unattached saves on system power. This method can save a significant amount of power, because the
TPS25810-Q1 device only requires < 5 µA when no UFP device is connected.
20
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Both UFP High
Converters
Disabled
OUT
CC1
CC2
IN1
TPS54620
Buck
Converter
No UFP
Attached
I
IN2
AUX
TPS25810-Q1
No. 1
EN
CHG
UFP_1
CHG_HI
12 V
UFP_1
(High)
UFP_2
(High)
OUT
CC1
CC2
IN1
No UFP
Attached
IN2
LP2950-33
LDO
AUX
TPS25810-Q1
No. 2
CHG
UFP_2
CHG_HI
One UFP Low
Converter
Enabled
OUT
CC1
CC2
IN1
TPS54620
Buck
Converter
UFP
IN2
Attached
AUX
TPS25810-Q1
No. 1
EN
CHG
UFP_1
-
CHG_HI
12 V
UFP_1
(High)
UFP_2
(High)
IN1
OUT
CC1
CC2
No UFP
Attached
IN2
LP2950-33
LDO
AUX
TPS25810-Q1
No. 2
CHG
UFP_2
CHG_HI
Copyright © 2016, Texas Instruments Incorporated
Figure 16. Power-Wake Implementation
7.3.3.11 Port Power Management (PPM)
PPM is the intelligent and dynamic allocation of power made possible with the use of the LD_DET pin. PPM is for
systems that have multiple charging ports but cannot power them all at their maximum charging current
simultaneously.
Goals of PPM are:
•
•
Enhanced user experience, because the user needs not to search for a high-current charging port.
Lowered cost and size of the power supply needed for implementing high-current charging in a multiport
system.
Copyright © 2016, Texas Instruments Incorporated
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7.3.3.12 Implementing PPM in a System With Two Type-C Ports
Figure 17 shows PPM and power wake implemented in a system with two Type-C ports, both initially set to
broadcast high-current charging (3 A, CHG and CHG_HI pulled high via 100-kΩ resistors to AUX). To enable
PPM, tie the LD_DET pin from TPS25810-Q1 device No. 1 to CHG_HI of TPS25810-Q1 device No. 2 and vice
versa, as shown in Figure 17. Each device independently monitors the charging current drawn by its attached
UFP.
IN1 and IN2 are connected to a TPS54620, a 6-A synchronous step-down converter. AUX is powered by an
LP2950-33, a low-quiescent-current 3.3-V LDO. With no UFP attached to either Type-C port, the TPS25810-Q1
device is powered by the LP2950-33. This method saves a significant amount of power, because the
TPS25810‑Q1 device requires less than 2 µA when no USB device is connected.
TPS54620
Buck
Converter
OUT
CC1
CC2
IN1
IN2
3-A Broadcast
EN
AUX TPS25810-Q1
No. 1
LD_DET_1
UFP_1
CHG
CHG_HI
12 V
UFP_1 UFP_2
OUT
CC1
CC2
IN1
IN2
3-A Broadcast
LP2950-33
LDO
AUX TPS25810-Q1
No. 2
CHG
LD_DET_2
CHG_HI
UFP_2
Copyright © 2016, Texas Instruments Incorporated
Figure 17. PPM and Power Wake Implemented
7.3.3.13 PPM Operation
When no UFP is attached, or either of the two attached UFPs is drawing current less than the LD_DET threshold
(1.95 A typical), the LD_DET output for both devices is high (shown in blue in Figure 18). Now when a UFP is
attached to device No. 1 that draws a charging current higher than the LD_DET threshold (1.95 A), this causes
LD_DET to assert or pull low (shown in red in Figure 18). Because the LD-DET pins of the No. 1 and No. 2
devices are connected to the CHG_HI pins of each other, a high-current detection on device No. 1 forces device
No. 2 to broadcast 1.5 A or medium charging-current capability on its CC pin. The Type-C specification requires
a UFP to monitor the CC pins continuously and adjust its current consumption (within 60 ms) to remain within the
value advertised by the DFP.
Figure 19 shows the case when a UFP attached to device No. 1 reduces its charging current below the LD_DET
threshold, which causes LD-DET to de-assert, thereby toggling the device No. 2 CH_HI pin from low to high.
This scheme:
•
Delivers a better user experience, as the user has no worry about the maximum charging current rating of the
host ports. Both ports initially advertise high-current charging.
•
Enables a smaller and lower-cost power supply, as the loading is controlled and never allowed to exceed 5 A.
22
Copyright © 2016, Texas Instruments Incorporated
TPS25810-Q1
www.ti.com.cn
ZHCSF05 –NOVEMBER 2016
TPS54620
Buck
Converter
OUT
CC1
CC2
IN1
IN2
3-A USB Device Connected
EN
AUX TPS25810-Q1
No. 1
LD_DET_1
UFP_1
CHG
CHG_HI
12 V
UFP_1 UFP_2
OUT
CC1
CC2
IN1
IN2
1.5-A Broadcast
LP2950-33
LDO
AUX TPS25810-Q1
No. 2
CHG
LD_DET_2
UFP_2
CHG_HI
Copyright © 2016, Texas Instruments Incorporated
Figure 18. 3-A USB Device Connected
TPS54620
Buck
Converter
OUT
CC1
CC2
IN1
IN2
1.5-A USB Device Connected
EN
AUX TPS25810-Q1
No. 1
LD_DET_1
UFP_1
CHG
CHG_HI
12 V
UFP_1 UFP_2
OUT
CC1
CC2
IN1
IN2
3-A Broadcast
LP2950-33
LDO
AUX TPS25810-Q1
No. 2
CHG
LD_DET_2
UFP_2
CHG_HI
Copyright © 2016, Texas Instruments Incorporated
Figure 19. 1.5-A USB Device Connected
7.4 Device Functional Modes
The TPS25810-Q1 device is a Type-C controller with integrated power switch that supports all Type-C functions
in a downstream facing port. The device is also used to manage current advertisement and protection for a
connected UFP and active cable. The device starts its operation by monitoring the AUX bus. When VAUX exceeds
the undervoltage-lockout threshold, the device samples the EN pin. A high level on this pin enables the device,
and normal operation begins. Having successfully completed its start-up sequence, the device now actively
Copyright © 2016, Texas Instruments Incorporated
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TPS25810-Q1
ZHCSF05 –NOVEMBER 2016
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Device Functional Modes (continued)
monitors its CC1 and CC2 pins for attachment to a UFP. When a UFP is detected on either the CC1 or CC2 pin,
the internal MOSFET starts to turn on after the required debounce time is met. The internal MOSFET starts
conducting and allows current to flow from IN1 to OUT. If Ra is detected on the other CC pin (not connected to
the UFP), VCONN is applied to allow current to flow from IN2 to the CC pin connected to Ra. For a complete listing
of various device operational modes, see Table 2.
24
Copyright © 2016, Texas Instruments Incorporated
TPS25810-Q1
www.ti.com.cn
ZHCSF05 –NOVEMBER 2016
8 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
8.1 Application Information
The TPS25810-Q1 device is a Type-C DFP controller that supports all Type-C DFP required functions. The
TPS25810-Q1 device only applies power to VBUS when it detects that a UFP is attached and removes power
when it detects the UFP is detached. The device exposes its identity via its CC pin, advertising its current
capability based on CHG and CHG_HI pin settings. The TPS25810-Q1 device also limits its advertised current
internally and provides robust protection to a fault on the system VBUS power rail.
After a connection is established by the TPS25810-Q1 device, the device is capable of providing VCONN to power
circuits in the cable plug on the CC pin that is not connected to the CC wire in the cable. VCONN is internally
current limited and has its own supply pin IN2. Apart from providing charging current to a UFP, the
TPS25810‑Q1 device also supports audio and debug accessory modes.
The following design procedure can be used to implement a full-featured Type-C DFP.
NOTE
BC 1.2 is not supported in the TPS25810-Q1 device. To support BC1.2 with Type-C
charging modes in a single Type-C connector, a device like a TPS2514A-Q1 must be
used.
8.2 Typical Applications
8.2.1 Type-C DFP Port Implementation Without BC 1.2 Support
Figure 20 shows a minimal Type-C DFP implementation capable of supporting 5-V and 3-A charging.
USB Type-C
Receptacle
TPS25810-Q1
5 V
2
3
4
5
6
7
8
VBUS
IN1
14
15
13
11
1
OUT
IN1
OUT
CC2
CC1
IN2
AUX
EN
FAULT
20
19
18
17
16
10 µF
CHG
CHG_HI
LD_DET
UFP
POL
AUDIO
DEBUG
10
9
REF
100 kW
(1%)
12
GND
REF_RTN
Copyright © 2016, Texas Instruments Incorporated
Figure 20. Type-C DFP Port Implementation Without BC 1.2 Support
Copyright © 2016, Texas Instruments Incorporated
25
TPS25810-Q1
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Typical Applications (continued)
8.2.1.1 Design Requirements
8.2.1.1.1 Input and Output Capacitance
Input and output capacitance improves the performance of the device. The actual capacitance should be
optimized for the particular application. For all applications, a 0.1-μF or greater ceramic bypass capacitor
between INx and GND is recommended as close to the device as possible for local noise decoupling.
All protection circuits, such as the TPS25810-Q1 device, have the potential for input voltage overshoots and
output voltage undershoots. Input voltage overshoots can be caused by either of two effects. The first cause is
an abrupt application of input voltage in conjunction with input power-bus inductance and input capacitance when
the INx pin is high-impedance (before turnon). Theoretically, the peak voltage is 2 times the applied voltage. The
second cause is due to the abrupt reduction of output short-circuit current when the TPS25810-Q1 device turns
off and energy stored in the input inductance drives the input voltage high. Input voltage droops may also occur
with large load steps and as the TPS25810-Q1 output is shorted. Applications with large input inductance (for
instance, connecting the evaluation board to the bench power supply through long cables) may require large
input capacitance to prevent the voltage overshoot from exceeding the absolute maximum voltage of the device.
The fast current-limit speed of the TPS25810-Q1 device to hard output short circuits isolates the input bus from
faults. However, ceramic input capacitance in the range of 1 μF to 22 μF adjacent to the TPS25810-Q1 input aids
in both response time and limiting the transient seen on the input power bus. Momentary input transients to 6.5 V
are permitted. Output voltage undershoot is caused by the inductance of the output power bus just after a short
has occurred and the TPS25810-Q1 device has abruptly reduced the OUT current. Energy stored in the
inductance drives the OUT voltage down, and potentially negative, as it discharges. An application with large
output inductance (such as from a cable) benefits from the use of a high-value output capacitor to control voltage
undershoot.
When implementing a USB-standard application, 120-μF minimum output capacitance is required. Typically, a
150-μF electrolytic capacitor is used, which is sufficient to control voltage undershoots. Because in Type-C
applications, DFP is a cold socket when no UFP is attached, the output capacitance should be placed at the INx
pin versus the OUT pin, as is done in USB Type-A ports. It is also recommended to put a 10-μF ceramic
capacitor on the OUT pin for better voltage bypass.
8.2.1.2 Detailed Design Procedure
The TPS25810-Q1 device supports up to three different input voltages, based on the application. In the simplest
implementation, all input pins are tied to a single voltage source set to 5 V, as shown in Figure 20. However, it is
recommended to set a slightly higher (100 mV to 200 mV) input voltage, when possible, to compensate for IR
loss from the source to the Type-C connector.
Other design considerations are listed as follows:
•
•
•
•
Place at least 120 µF of bypass capacitance close to the INx pins versus the OUT pin, as Type-C is a cold-
socket connector.
A 10-µF bypass capacitor is recommended to be placed near a Type-C receptacle VBUS pin to handle load
transients.
Depending on the maximum current-level advertisement supported by the Type-C port in the system, set the
CHG and CHG_HI levels accordingly. Advertisement of 3 A is shown in Figure 20.
EN, CHG, and CHG_HI pins can be tied directly to GND or VAUX without a pullup resistor.
–
CHG and CHG_HI can also be dynamically controlled by a microcontroller to change the current
advertisement level to the UFP.
•
•
When an open-drain output of the TPS25810-Q1 device is not used, it can be left open or tied to GND.
Use a 1% 100-kΩ resistor to connect between the REF and REF_RTN pins, placing it close to the device pin
and isolated from switching noise on the board.
26
Copyright © 2016, Texas Instruments Incorporated
TPS25810-Q1
www.ti.com.cn
ZHCSF05 –NOVEMBER 2016
Typical Applications (continued)
8.2.1.3 Application Curves
VIN
CC1
VIN
VBUS
VBUS
CC2
CC1
IN
Time 20 ms/div
Basic start-up: IN1 = IN2 = AUX = EN = CHG = CHG_HI = 5 V,
CC1 = Rd, CC2 = open
Time 50 ms/div
IN1 = IN2 = AUX = EN = CHG = CHG_HI = 5 V, CC1 = open,
CC2 = open → Rd
Figure 21. Basic Start-Up
Figure 22. Start-Up
VBUS VIN
VIN
VBUS
IN
CC1
IN
CC1
Time 50 ms/div
IN1 = IN2 = AUX = EN = CHG = CHG_HI = 5 V, CC1 = Rd,
CC2 = open, OUT = shorted
Time 200 ms/div
IN1 = IN2 = AUX = EN = 5 V; CHG = CHG_HI = 0 V,
CC1 = open, CC2 = Rd, OUT = open → 5 Ω
Figure 24. Hot-Plug to Short
Figure 23. Load Step
VIN
VIN
VBUS
VOUT
CC1
IN
CC1
CC2
Time 20 ms/div
IN1 = IN2 = AUX = EN = CHG = CHG_HI = 5 V, CC1 = short,
CC2 = Rd
Time 20 ms/div
IN1 = IN2 = AUX = EN = CHG = CHG_HI = 5 V, CC1 = Rd →
open, CC2 = open
Figure 25. Short On CC1
Figure 26. Remove Rd
Copyright © 2016, Texas Instruments Incorporated
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TPS25810-Q1
ZHCSF05 –NOVEMBER 2016
www.ti.com.cn
Typical Applications (continued)
VIN
VBUS
CC2
CC1
Time 50 ms/div
VIN 5 V → 3.5 V (100 ms) → 5 V (1 V/ms),
IN1 = IN2 = AUX = EN = CHG = CHG_HI = 5 V,
CC1 = Rd, CC2 = Ra
Figure 27. Brown-Out Test
28
Copyright © 2016, Texas Instruments Incorporated
TPS25810-Q1
www.ti.com.cn
ZHCSF05 –NOVEMBER 2016
Typical Applications (continued)
8.2.2 Type-C DFP Port Implementation With BC 1.2 (DCP Mode) Support
Figure 28 shows a Type-C DFP implementation capable of supporting 5-V, 3-A charging in a Type-C port that is
also able to support charging of legacy devices when used with a Type-C µB cable assembly for charging
phones and handheld devices equipped with a µB connector.
This implementation requires the use of a TPS2514A-Q1, a USB dedicated charging-port (DCP) controller with
auto-detect feature to charge not only BC1.2 compliant handheld devices but also popular phones and tablets
that incorporate their own propriety charging algorithm. See the TPS2514A-Q1 datasheet for more details.
TPS2514A-Q1
IN
DM1
DP1
NC
0.1 µF
NC
GND
USB Type-C
Receptacle
TPS25810-Q1
5 V
2
3
4
5
6
7
8
VBUS
IN1
14
15
13
11
1
OUT
OUT
CC2
CC1
IN1
D–
D+
IN2
AUX
EN
FAULT
20
19
18
17
16
12
10 µF
CHG
CHG_HI
LD_DET
UFP
POL
10
REF
AUDIO
DEBUG
GND
100 kW
(1%)
9
REF_RTN
Copyright © 2016, Texas Instruments Incorporated
Figure 28. Type-C DFP Port Implementation With BC 1.2 (DCP Mode) Support
8.2.2.1 Design Requirements
See Design Requirements for the design requirements.
8.2.2.2 Detailed Design Procedure
See Detailed Design Procedure for the detailed design procedure.
8.2.2.3 Application Curves
See Application Curves for the application curves.
Copyright © 2016, Texas Instruments Incorporated
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TPS25810-Q1
ZHCSF05 –NOVEMBER 2016
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9 Power Supply Recommendations
The device has three power supply inputs. IN1, which is directly connected to OUT via the power MOSFET, is
tied to the VBUS pin in the Type-C receptacle. IN2 also has a current-limiting switch and is multiplexed either to
the CC1 or CC2 pin in the Type-C receptacle, depending on cable plug polarity. AUX is the device supply. In
most applications, all three supplies are tied together. In a special implementation like power wake, IN1 and IN2
are tied to a single supply, whereas AUX is powered by a supply that is always ON and can be as low as 2.9 V.
USB Specification Revisions 2.0 and 3.1 require VBUS voltage at the connector to be between 4.75 V and 5.5 V.
Depending on layout and routing from the supply to the connector, the voltage drop on VBUS must be tightly
controlled. Locate the input supply close to the device. For all applications, a 10-μF or greater ceramic bypass
capacitor between OUT and GND is recommended, located as close to the Type-C connector of the device as
possible for local noise decoupling. The power supply should be rated higher than the current limit setting to
avoid voltage droops during overcurrent and short-circuit conditions.
30
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TPS25810-Q1
www.ti.com.cn
ZHCSF05 –NOVEMBER 2016
10 Layout
10.1 Layout Guidelines
Layout best practices as they apply to the TPS25810-Q1 device are listed as follows.
•
For all applications, a 10-µF ceramic capacitor is recommended near the Type-C receptacle and another
120‑µF ceramic capacitor close to the IN1 pin.
–
–
The optimum placement of the 120-µF capacitor is closest to the IN1 and GND pins of the device.
Care must be taken to minimize the loop area formed by the bypass capacitor connection, the IN1 pin,
and the GND pin of the IC. See Figure 29 for a PCB layout example.
•
High-current-carrying power-path connections to the device should be as short as possible and should be
sized to carry at least twice the full-load current.
–
Have the input and output traces as short as possible. The most common cause of voltage loss failure in
USB power delivery is the resistance associated with the VBUS trace. Trace length, maximum current being
supplied for normal operation, and total resistance associated with the VBUS trace must be taken into
account while budgeting for voltage loss.
–
–
For example, a power-carrying trace that supplies 3 A, at a distance of 20 inches, 0.1-in. wide, with 2‑oz.
copper on the outer layer has a total resistance of approximately 0.046 Ω and voltage loss of 0.14 V. The
same trace at 0.05 in. wide has a total resistance of approximately 0.09 Ω and voltage loss of 0.28 V.
Make power traces as wide as possible.
•
•
The resistor attached to the REF pin of the device has several requirements:
–
–
–
–
It is recommended to use a 1% 100-kΩ low-temperature-cocoefficient resistor.
It should be connected to the REF and REF_RTN pins (pins 9 and pin 10, respectively).
The REF_RTN pin should be isolated from the GND plane. See Figure 29.
The trace routing between the REF and REF_RTN pins of the device should be as short as possible to
reduce parasitic effects on current-limit and current-advertisement accuracy. These traces should not have
any coupling to switching signals on the board.
Locate all TPS25810-Q1 pullup resistors for open-drain outputs close to their connection pin. Pullup resistors
should be 100 kΩ.
–
When a particular open-drain output is not used or needed in the system, leave the associated pin open or
tied to GND.
•
•
Keep the CC lines close to the same length.
Thermal considerations:
–
When properly mounted, the thermal-pad package provides significantly greater cooling ability than an
ordinary package. To operate at rated power, the thermal pad must be soldered to the board GND plane
directly under the device. The thermal pad is at GND potential and can be connected using multiple vias
to inner-layer GND. Other planes, such as the bottom side of the circuit board, can be used to increase
heat sinking in higher-current applications. See the PowerPad™ Thermally Enhanced Package technical
report (SLMA002) and PowerPAD™ Made Easy application brief (SLMA004) for more information on
using this thermal pad package.
–
–
The thermal via land pattern specific to the TPS25810-Q1 device can be downloaded from the device
Web page at www.ti.com.
Obtaining acceptable performance with alternate layout schemes is possible; however, the layout example
in the following section has been shown to produce good results and is intended as a guideline.
•
ESD considerations:
–
The TPS25810-Q1 device has built-in ESD protection for CC1 and CC2. Keep trace length to a minimum
from the Type-C receptacle to the TPS25810-Q1 device on CC1 and CC2.
–
–
A 10-µF output capacitor should be placed near the Type-C receptacle.
See the TPS25810EVM-745 evaluation module for an example of a double-layer board that passes
IEC61000-4-2 testing.
–
Do not create stubs or test points on the CC lines. Keep the traces short if possible, and use minimal vias
along the traces (1–2 inches or less).
–
–
See the ESD Protection Layout Guide application report (SLVA680) for additional information.
Have a dedicated ground plane layer, if possible, to avoid differential voltage buildup.
Copyright © 2016, Texas Instruments Incorporated
31
TPS25810-Q1
ZHCSF05 –NOVEMBER 2016
www.ti.com.cn
10.2 Layout Example
Top Layer Signal Trace
Top Layer Signal Ground Plane
Bottom Layer Signal Trace
Bottom Layer Signal Ground Plane
Via to Bottom Layer Signal Ground Plane
Via to Bottom Layer Signal
AUX
1
16
15
2
Thermal
Pad
IN1
OUT
3
14
13
12
11
4
5
6
IN2
CC2
GND
CC1
AUX
EN
Signal Ground
Bottom Layer
Signal Ground
Top Layer
Figure 29. Layout Example
32
版权 © 2016, Texas Instruments Incorporated
TPS25810-Q1
www.ti.com.cn
ZHCSF05 –NOVEMBER 2016
11 器件和文档支持
11.1 器件支持
11.1.1 Third-Party Products Disclaimer
TI'S PUBLICATION OF INFORMATION REGARDING THIRD-PARTY PRODUCTS OR SERVICES DOES NOT
CONSTITUTE AN ENDORSEMENT REGARDING THE SUITABILITY OF SUCH PRODUCTS OR SERVICES
OR A WARRANTY, REPRESENTATION OR ENDORSEMENT OF SUCH PRODUCTS OR SERVICES, EITHER
ALONE OR IN COMBINATION WITH ANY TI PRODUCT OR SERVICE.
11.2 文档支持
11.2.1 相关文档ꢀ
《PowerPAD™ 耐热增强型封装》(文献编号:SLMA002)
《PowerPAD™ 速成》(文献编号:SLMA004)
《TPS25810EVM-745 用户指南》(文献编号:SLVUA0)
《TPS25810 高压 DFP 保护》(文献编号:SLVA751)
11.3 接收文档更新通知
如需接收文档更新通知,请访问 www.ti.com.cn 网站上的器件产品文件夹。点击右上角的提醒我 (Alert me) 注册
后,即可每周定期收到已更改的产品信息。有关更改的详细信息,请查阅已修订文档中包含的修订历史记录。
11.4 社区资源
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
11.5 商标
E2E is a trademark of Texas Instruments.
USB Type-C is a trademark of USB Implementers Forum, Inc..
All other trademarks are the property of their respective owners.
11.6 静电放电警告
这些装置包含有限的内置 ESD 保护。 存储或装卸时,应将导线一起截短或将装置放置于导电泡棉中,以防止 MOS 门极遭受静电损
伤。
11.7 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
12 机械、封装和可订购信息
以下页中包括机械、封装和可订购信息。这些信息是针对指定器件提供的最新数据。本数据随时可能发生变更并且
不对本文档进行修订,恕不另行通知。要获得这份数据表的浏览器版本,请查阅左侧的导航窗格。
版权 © 2016, Texas Instruments Incorporated
33
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JESD48 最新标准中止提供任何产品和服务。客户在下订单前应获取最新的相关信息, 并验证这些信息是否完整且是最新的。所有产品的销售
都遵循在订单确认时所提供的TI 销售条款与条件。
TI 保证其所销售的组件的性能符合产品销售时 TI 半导体产品销售条件与条款的适用规范。仅在 TI 保证的范围内,且 TI 认为 有必要时才会使
用测试或其它质量控制技术。除非适用法律做出了硬性规定,否则没有必要对每种组件的所有参数进行测试。
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PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
Samples
Drawing
Qty
500
50
(1)
(2)
(3)
(4/5)
(6)
CSD18536KTT
CSD18536KTTT
ACTIVE
DDPAK/
TO-263
KTT
3
3
RoHS-Exempt
& Green
SN
Level-2-260C-1 YEAR
Level-2-260C-1 YEAR
-55 to 175
-55 to 175
CSD18536KTT
CSD18536KTT
ACTIVE
DDPAK/
TO-263
KTT
RoHS-Exempt
& Green
SN
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
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In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
Addendum-Page 2
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Copyright © 2020 德州仪器半导体技术(上海)有限公司
相关型号:
CSD18541F5T
采用 1.5mm x 0.8mm LGA 封装、具有栅极 ESD 保护的单路、65mΩ、60V、N 沟道 NexFET™ 功率 MOSFET | YJK | 3 | -55 to 150
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