CSD87312Q3E [TI]

Dual 30-V N-Channel NexFET Power MOSFETs; 双30 -V N通道NexFET功率MOSFET
CSD87312Q3E
型号: CSD87312Q3E
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

Dual 30-V N-Channel NexFET Power MOSFETs
双30 -V N通道NexFET功率MOSFET

晶体 晶体管 功率场效应晶体管 开关 脉冲 光电二极管 局域网
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中文:  中文翻译
下载:  下载PDF数据表文档文件
CSD87312Q3E  
www.ti.com  
SLPS333 NOVEMBER 2012  
Dual 30-V N-Channel NexFET™ Power MOSFETs  
.
1
FEATURES  
PRODUCT SUMMARY  
Common Source Connection  
TA = 25°C  
VDS  
TYPICAL VALUE  
UNIT  
V
Ultra Low Drain to Drain On-Resistance  
Drain to Source Voltage  
Gate Charge Total (4.5V)  
Gate Charge Gate to Drain  
30  
6.3  
0.7  
Space Saving SON 3.3 x 3.3mm Plastic  
Package  
Qg  
nC  
nC  
m  
mΩ  
V
Qgd  
VGS = 4.5V  
VGS = 8V  
31  
27  
Optimized for 5V Gate Drive  
Low Thermal Resistance  
Avalanche Rated  
Drain to Drain On Resistance  
(Q1+Q2)  
RDD(on)  
VGS(th)  
Threshold Voltage  
1.0  
Pb Free Terminal Plating  
RoHS Compliant  
ORDERING INFORMATION  
Device  
Package  
Media  
Qty  
Ship  
Halogen Free  
SON 3.3 x 3.3mm  
Plastic Package  
13-Inch  
Reel  
Tape and  
Reel  
CSD87312Q3E  
2500  
APPLICATIONS  
ABSOLUTE MAXIMUM RATINGS  
Adaptor/USB Input Protection for Notebook  
PCs and Tablets  
TA = 25°C  
VALUE  
UNIT  
V
VDS  
VGS  
ID  
Drain to Source Voltage  
30  
+10/-8  
27  
Gate to Source Voltage  
V
DESCRIPTION  
Continuous Drain Current, TC = 25°C(1)  
Pulsed Drain Current (2)  
A
The CSD87312Q3E is a 30V common-source, dual  
N-channel device designed for adaptor/USB input  
protection. This SON 3.3 x 3.3mm device has low  
drain to drain on-resistance that minimizes losses and  
offers low component count for space constrained  
multi-cell battery charging applications.  
IDM  
PD  
45  
A
Power Dissipation  
2.5  
W
TJ,  
Operating Junction and Storage  
TSTG Temperature Range  
–55 to 150  
29  
°C  
Avalanche Energy, single pulse  
ID = 24A, L = 0.1mH, RG = 25Ω  
EAS  
mJ  
(1) Typical R =63°C/W on 1in² (2 oz.) on 0.060" thick FR4PCB  
TEXT ADDED FOR SPACING  
Top View  
(2) Pulse duration 300μs, duty cycle 2%  
TEXT ADDED FOR SPACING  
VGS vs. RDDon  
D1  
D2  
D2  
D2  
G
D1  
D1  
D1  
S
60  
TC = 25°C Id = 7A  
TC = 125ºC Id = 7A  
55  
50  
45  
40  
35  
30  
25  
20  
TEXT ADDED FOR SPACING  
Circuit Image  
0
2
4
6
8
10  
VGS - Gate-to- Source Voltage (V)  
G001  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2012, Texas Instruments Incorporated  
 
 
CSD87312Q3E  
SLPS333 NOVEMBER 2012  
www.ti.com  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
ELECTRICAL CHARACTERISTICS  
(TA = 25°C unless otherwise stated)  
PARAMETER  
Static Characteristics  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
BVDSS  
IDSS  
Drain to Source Voltage  
VGS = 0V, ID = 250μA  
30  
V
Drain to Source Leakage Current  
Gate to Source Leakage Current  
Gate to Source Threshold Voltage  
VGS = 0V, VDS = 24V  
VDS = 0V, VGS = +10/-8V  
VDS = VGS, ID = 250μA  
VGS = 4.5V, ID = 7A  
VGS = 8V, ID = 7A  
1
100  
1.3  
38  
μA  
nA  
V
IGSS  
VGS(th)  
0.8  
1.0  
31  
27  
39  
mΩ  
mΩ  
S
Drain to Drain On Resistance (Q1 +  
Q2)  
RDD(on)  
33  
gfs  
Transconductance  
VDS = 15V, ID = 7A  
Dynamic Characteristics(1)  
Ciss  
Coss  
Crss  
RG  
Input Capacitance  
960  
190  
12  
1250  
247  
16  
pF  
pF  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
Series Gate Resistance  
Gate Charge Total (4.5V)  
Gate Charge Gate to Drain  
Gate Charge Gate to Source  
Gate Charge at Vth  
Output Charge  
VGS = 0V, VDS = 15V, f = 1MHz  
5
10  
Qg  
6.3  
0.7  
1.9  
1.0  
4.0  
7.8  
16  
8.2  
nC  
nC  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
Qgd  
Qgs  
Qg(th)  
Qoss  
td(on)  
tr  
VDS = 15V, ID = 7A  
VDS = 15V, VGS = 0V  
Turn On Delay Time  
Rise Time  
VDS = 15V, VGS = 4.5V, IDS = 7A, RG = 2Ω  
td(off)  
tf  
Turn Off Delay Time  
Fall Time  
17  
2.9  
Diode Characteristics(1)  
VSD  
Qrr  
trr  
Diode Forward Voltage  
ISD = 7A, VGS = 0V  
0.8  
5.3  
1
V
Reverse Recovery Charge  
Reverse Recovery Time  
nC  
ns  
VDS= 15V, IF = 7A, di/dt = 300A/μs  
12.2  
(1) All Dynamic and Diode Characteristics were measured with respect to one of the two drains, with the other left floating.  
THERMAL CHARACTERISTICS  
(TA = 25°C unless otherwise stated)  
PARAMETER  
Thermal Resistance Junction to Case(1)  
Thermal Resistance Junction to Ambient(1)(2)  
MIN  
TYP  
MAX  
UNIT  
°C/W  
°C/W  
RθJC  
RθJA  
4.2  
63  
(1)  
R
θJC is determined with the device mounted on a 1-inch2 (6.45-cm2), 2-oz. (0.071-mm thick) Cu pad on a 1.5-inch × 1.5-inch (3.81-cm ×  
3.81-cm), 0.06-inch (1.52-mm) thick FR4 PCB. RθJC is specified by design, whereas RθJA is determined by the user’s board design.  
(2) Device mounted on FR4 material with 1-inch2 (6.45-cm2), 2-oz. (0.071-mm thick) Cu.  
2
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Copyright © 2012, Texas Instruments Incorporated  
CSD87312Q3E  
www.ti.com  
SLPS333 NOVEMBER 2012  
GATE  
DRAIN  
GATE  
DRAIN  
Max RθJA = 63°C/W  
when mounted on  
1 inch2 (6.45 cm2) of 2-  
oz. (0.071-mm thick)  
Cu.  
Max RθJA = 165°C/W  
when mounted on a  
minimum pad area of  
2-oz. (0.071-mm thick)  
Cu.  
SOURCE  
SOURCE  
M0137-02  
M0137-01  
TYPICAL MOSFET CHARACTERISTICS  
(TA = 25°C unless otherwise stated)  
Figure 1. Transient Thermal Impedance  
TEXT ADDED FOR SPACING  
TEXT ADDED FOR SPACING  
100  
60  
40  
20  
0
VDS = 5V  
80  
60  
40  
20  
0
VGS =8V  
VGS =6V  
VGS =4.5V  
TC = 125°C  
TC = 25°C  
TC = −55°C  
0
1
2
3
4
5
0
1
2
3
4
5
VDS - Drain-to-Source Voltage (V)  
VGS - Gate-to-Source Voltage (V)  
G001  
G001  
Figure 2. Saturation Characteristics  
Figure 3. Transfer Characteristics  
Copyright © 2012, Texas Instruments Incorporated  
Submit Documentation Feedback  
3
CSD87312Q3E  
SLPS333 NOVEMBER 2012  
www.ti.com  
TYPICAL MOSFET CHARACTERISTICS (continued)  
(TA = 25°C unless otherwise stated)  
TEXT ADDED FOR SPACING  
TEXT ADDED FOR SPACING  
10  
8
10000  
1000  
100  
10  
ID = 7A  
VDS =15V  
6
4
Ciss = Cgd + Cgs  
Coss = Cds + Cgd  
Crss = Cgd  
2
0
1
0
2
4
6
8
10  
12  
14  
0
3
6
9
12  
15  
18  
21  
24  
27  
30  
Qg - Gate Charge (nC)  
VDS - Drain-to-Source Voltage (V)  
G001  
G001  
Figure 4. Gate Charge  
Figure 5. Capacitance  
TEXT ADDED FOR SPACING  
TEXT ADDED FOR SPACING  
1.5  
1.25  
1
60  
55  
50  
45  
40  
35  
30  
25  
20  
ID = 250uA  
TC = 25°C Id = 7A  
TC = 125ºC Id = 7A  
0.75  
0.5  
0.25  
0
−75  
−25  
25  
75  
125  
175  
0
2
4
6
8
10  
TC - Case Temperature (ºC)  
VGS - Gate-to- Source Voltage (V)  
G001  
G001  
Figure 6. Threshold Voltage vs. Temperature  
TEXT ADDED FOR SPACING  
Figure 7. On-State Resistance vs. Gate-to-Source Voltage  
TEXT ADDED FOR SPACING  
2
1.75  
1.5  
100  
VGS = 4.5V  
VGS = 8V  
ID =7A  
TC = 25°C  
TC = 125°C  
10  
1
0.1  
1.25  
1
0.01  
0.75  
0.5  
0.001  
0.0001  
0.25  
−75  
−25  
25  
75  
125  
175  
0
0.2  
0.4  
0.6  
0.8  
1
TC - Case Temperature (ºC)  
VSD − Source-to-Drain Voltage (V)  
G001  
G001  
Figure 8. Normalized On-State Resistance vs. Temperature  
Figure 9. Typical Diode Forward Voltage  
4
Submit Documentation Feedback  
Copyright © 2012, Texas Instruments Incorporated  
CSD87312Q3E  
www.ti.com  
SLPS333 NOVEMBER 2012  
TYPICAL MOSFET CHARACTERISTICS (continued)  
(TA = 25°C unless otherwise stated)  
TEXT ADDED FOR SPACING  
TEXT ADDED FOR SPACING  
1000  
100  
10  
100  
10  
1
TC = 25ºC  
TC = 125ºC  
1ms  
10ms  
100ms  
1s  
DC  
1
0.1  
0.01  
Single Pulse  
TypicalRthetaJA =130ºC/W(min Cu)  
0.01  
0.1  
1
10  
50  
0.01  
0.1  
1
VDS - Drain-to-Source Voltage (V)  
TAV - Time in Avalanche (mS)  
G001  
G001  
Figure 10. Maximum Safe Operating Area  
Figure 11. Single Pulse Unclamped Inductive Switching  
TEXT ADDED FOR SPACING  
40.0  
35.0  
30.0  
25.0  
20.0  
15.0  
10.0  
5.0  
0.0  
−50 −25  
0
25  
50  
75  
100 125 150 175  
TC - Case Temperature (ºC)  
G001  
Figure 12. Maximum Drain Current vs. Temperature  
Copyright © 2012, Texas Instruments Incorporated  
Submit Documentation Feedback  
5
CSD87312Q3E  
SLPS333 NOVEMBER 2012  
www.ti.com  
MECHANICAL DATA  
Q3E Package Dimensions  
MILLIMETERS  
DIM  
MIN  
MAX  
1.050  
0.400  
0.250  
0.250  
1.040  
0.260  
0.250  
0.350  
3.400  
2.750  
3.400  
3.400  
1.850  
A
b
0.850  
0.280  
0.150  
0.150  
0.940  
0.160  
0.150  
0.250  
3.200  
2.650  
3.200  
3.200  
1.750  
c
c1  
d
d1  
d2  
d3  
D1  
D2  
E
E1  
E2  
e
0.650 TYP  
0.300 Typ  
L
0.400  
0°  
0.500  
-
θ
K
Notes:  
1. Pin 1-4: Drain 1  
2. Pin 5: Gate  
3. Pin 6-8: Drain 2  
4. Pin 9: Source  
6
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Copyright © 2012, Texas Instruments Incorporated  
CSD87312Q3E  
www.ti.com  
SLPS333 NOVEMBER 2012  
Recommended PCB Pattern  
Recommended Stencil Opening  
For recommended circuit layout for PCB designs, see application note SLPA005 Reducing Ringing Through  
PCB Layout Techniques.  
Copyright © 2012, Texas Instruments Incorporated  
Submit Documentation Feedback  
7
CSD87312Q3E  
SLPS333 NOVEMBER 2012  
www.ti.com  
Q3E Tape and Reel Information  
4.00 0.ꢀ0 ꢁ(SS ꢂNoS ꢀ1  
8.00 0.ꢀ0  
2.00 0.0ꢃ  
Ø ꢀ.ꢃ0  
+0.ꢀ0  
–0.00  
3.60  
M0ꢀ44-0ꢀ  
Notes:  
1. 10 sprocket hole pitch cumulative tolerance ±0.2  
2. Camber not to exceed 1mm IN 100mm, noncumulative over 250mm  
3. Material:black static dissipative polystyrene  
4. All dimensions are in mm (unless otherwise specified)  
5. Thickness: 0.30 ±0.05mm  
6. MSL1 260°C (IR and Convection) PbF Reflow Compatible  
8
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Copyright © 2012, Texas Instruments Incorporated  
PACKAGE OPTION ADDENDUM  
www.ti.com  
24-Jan-2013  
PACKAGING INFORMATION  
Orderable Device  
CSD87312Q3E  
Status Package Type Package Pins Package Qty  
Eco Plan Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
Top-Side Markings  
Samples  
Drawing  
(1)  
(2)  
(3)  
(4)  
ACTIVE  
VSON  
VSON  
DPB  
8
8
2500  
Pb-Free (RoHS CU NIPDAU  
Exempt)  
Level-1-260C-UNLIM  
-55 to 150 87312E  
-55 to 150  
CSD87312Q3E-ASY  
PREVIEW  
DPB  
TBD  
Call TI  
Call TI  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) Only one of markings shown within the brackets will appear on the physical device.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
5-Feb-2013  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
CSD87312Q3E  
VSON  
DPB  
8
2500  
330.0  
16.4  
3.6  
3.6  
1.2  
4.0  
16.0  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
5-Feb-2013  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
VSON DPB  
SPQ  
Length (mm) Width (mm) Height (mm)  
367.0 367.0 38.0  
CSD87312Q3E  
8
2500  
Pack Materials-Page 2  
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TI

CSD87335Q3DT

采用 3mm x 3mm SON 封装的 25A、30V、N 沟道同步降压 NexFET™ 功率 MOSFET 电源块 | DQZ | 8 | -55 to 150
TI