GT50J121_06 [TOSHIBA]
Silicon N Channel IGBT High Power Switching Applications; 硅N沟道IGBT高功率开关应用型号: | GT50J121_06 |
厂家: | TOSHIBA |
描述: | Silicon N Channel IGBT High Power Switching Applications |
文件: | 总6页 (文件大小:191K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
GT50J121
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT
GT50J121
High Power Switching Applications
Unit: mm
Fast Switching Applications
•
•
•
Fourth-generation IGBT
Enhancement mode type
Fast switching (FS): Operating frequency up to 50 kHz (reference)
• High speed: t = 0.05 μs (typ.)
f
• Low switching loss: E = 1.30 mJ (typ.)
on
: E = 1.34 mJ (typ.)
off
•
Low saturation Voltage: V
= 2.0 V (typ.)
CE (sat)
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Rating
Unit
Collector-emitter voltage
Gate-emitter voltage
V
V
600
±20
50
V
V
CES
GES
DC
I
C
JEDEC
―
―
Collector current
A
1 ms
I
100
CP
JEITA
Collector power dissipation
(Tc = 25°C)
P
240
W
C
TOSHIBA
Weight: 9.75 g
2-21F2C
Junction temperature
T
150
°C
°C
j
Storage temperature range
T
stg
−55 to 150
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Thermal Characteristics
Characteristics
Thermal resistance
Symbol
Max
Unit
R
0.521
°C/W
th (j-c)
Marking
Part No. (or abbreviation code)
Lot No.
TOSHIBA
GT50J121
JAPAN
A line indicates
lead (Pb)-free package or
lead (Pb)-free finish.
1
2006-11-01
GT50J121
Electrical Characteristics (Ta = 25°C)
Characteristics
Gate leakage current
Symbol
Test Condition
Min
Typ.
Max
Unit
I
V
V
= ±20 V, V
= 600 V, V
= 0
= 0
⎯
⎯
⎯
⎯
±500
1.0
nA
mA
V
GES
GE
CE
CE
Collector cut-off current
I
CES
GE
Gate-emitter cut-off voltage
Collector-emitter saturation voltage
Input capacitance
V
I
I
= 5 mA, V = 5 V
CE
3.5
⎯
⎯
6.5
GE (OFF)
C
C
V
= 50 A, V
= 15 V
2.0
7900
2.45
⎯
V
CE (sat)
GE
= 10 V, V = 0, f = 1 MHz
GE
C
V
⎯
pF
ies
CE
Turn-on delay time
Rise time
t
t
⎯
⎯
⎯
⎯
⎯
⎯
0.09
0.07
0.24
0.30
0.05
0.43
⎯
⎯
⎯
d (on)
t
r
Turn-on time
t
on
Inductive load
Switching time
μs
V
V
= 300 V, I = 50 A
C
Turn-off delay time
Fall time
⎯
⎯
⎯
CC
GG
d (off)
= +15 V, R = 13 Ω
G
t
f
(Note 1)
(Note 2)
Turn-off time
t
off
Turn-on switching
loss
E
⎯
⎯
1.30
1.34
⎯
⎯
on
Switching loss
mJ
Turn-off switching
loss
E
off
Note 1: Switching time measurement circuit and input/output waveforms
V
GE
GT50J325
90%
10%
0
0
−V
GE
I
L
C
I
V
CC
C
90%
10%
90%
R
G
V
CE
10%
10%
10%
V
CE
t
t
d (on)
d (off)
t
f
t
r
t
t
on
off
Note 2: Switching loss measurement waveforms
V
GE
90%
10%
0
0
I
C
V
5%
CE
E
E
on
off
2
2006-11-01
GT50J121
I
– V
V
– V
GE
C
CE
15
CE
100
80
60
40
20
0
20
16
12
8
Common emitter
Common emitter
Tc = 25°C
Tc = −40°C
20
10
100
50
8
30
4
V
= 7 V
GE
I
= 10 A
C
4
0
0
0
1
2
3
4
5
8
12
16
20
Collector-emitter voltage
V
(V)
Gate-emitter voltage
V
GE
(V)
CE
V
– V
V
– V
GE
CE
GE
CE
20
16
12
8
20
16
12
8
Common emitter
Tc = 25°C
Common emitter
Tc = 125°C
100
100
50
30
50
30
4
4
I
= 10 A
I
= 10 A
C
C
4
0
0
0
0
8
12
16
20
4
8
12
16
20
Gate-emitter voltage
V
GE
(V)
Gate-emitter voltage
V
GE
(V)
I
C
– V
V – Tc
CE (sat)
GE
100
80
60
40
20
0
5
4
3
2
1
0
Common emitter
CE
Common emitter
V = 15 V
GE
V
= 5 V
100
70
50
30
I
= 10 A
C
Tc = 125°C
−40
25
4
0
8
12
16
20
−60
−20
20
60
100
140
Gate-emitter voltage
V
GE
(V)
Case temperature Tc (°C)
3
2006-11-01
GT50J121
Switching time
t
, t , t
r
– R
Switching time
t
, t , t
r
– I
C
on
d (on)
G
on
d (on)
10
10
Common emitter
Common emitter
V
V
= 300 V
= 15 V
CC
V
V
= 300 V
= 15 V
CC
GG
GG
R
G
= 13 Ω
3
1
3
1
I
= 50 A
C
: Tc = 25°C
: Tc = 125°C
: Tc = 25°C
: Tc = 125°C
(Note 1)
(Note 1)
t
on
0.3
0.1
0.3
0.1
t
on
t
d (on)
t
d (on)
t
r
0.03
0.01
t
0.03
0.01
r
1
3
10
30
100
300
1000
0
10
20
30
40
50
Gate resistance
R
G
(Ω)
Collector current
I
C
(A)
Switching time
t
, t , t
– R
Switching time
t
, t , t
f
– I
C
off
f
d (off)
G
off
d (off)
10
10
Common emitter
Common emitter
V
V
= 300 V
CC
GG
V
V
= 300 V
= 15 V
= 50 A
CC
GG
= 15 V
R
= 13 Ω
G
3
1
3
1
I
C
: Tc = 25°C
: Tc = 125°C
: Tc = 25°C
: Tc = 125°C
(Note 1)
(Note 1)
t
off
t
off
t
d (off)
0.3
0.1
0.3
0.1
t
d (off)
t
f
t
f
0.03
0.01
0.03
0.01
1
3
10
30
100
300
1000
0
10
20
30
40
50
Gate resistance
R
G
(Ω)
Collector current
I
C
(A)
Switching loss
E
, E – R
on off
Switching loss
E
, E – I
on off
G
C
30
10
10
Common emitter
Common emitter
V
V
= 300 V
= 15 V
V
V
= 300 V
= 15 V
CC
CC
GG
GG
I
= 50 A
R
G
= 13 Ω
C
: Tc = 25°C
: Tc = 125°C
(Note 2)
: Tc = 25°C
: Tc = 125°C
3
1
(Note 2)
E
on
3
1
E
on
E
off
E
off
0.3
0.1
0.3
0.1
1
3
10
30
100
300
1000
0
10
20
30
I
40
50
Gate resistance
R
(Ω)
Collector current
(A)
G
C
4
2006-11-01
GT50J121
C – V
V
, V
– Q
CE
CE GE G
30000
10000
500
400
300
200
100
0
20
16
12
8
Common emitter
= 6 Ω
Tc = 25°C
R
L
C
ies
3000
1000
300
300
100
30
C
oes
200
V
= 100 V
CE
C
res
Common emitter
= 0
f = 1 MHz
4
V
GE
Tc = 25°C
10
0.1
0
400
0.3
1
3
10
30
100
300 1000
0
100
200
300
Collector-emitter voltage
V
(V)
Gate charge
Q
G
(nC)
CE
Safe operating area
Reverse bias SOA
300
100
300
100
I
max (pulse)*
C
50 μs*
I
max (continuous)
DC operation
C
30
10
30
10
100 μs*
1 ms*
3
1
3
1
*: Single pulse
Tc = 25°C
10 ms*
Curves must be
derated linearly with
increase in
<
0.3
0.1
0.3
0.1
T
V
R
125°C
= 15 V
= 13 Ω
j
GE
G
temperature.
1
3
10
30
100
300
(V)
1000
1
3
10
30
100
V
300
(V)
1000
Collector-emitter voltage
V
Collector-emitter voltage
CE
CE
r
th
(t) – t
w
2
1
0
10
10
10
Tc = 25°C
1
−
10
10
10
10
2
3
4
−
−
−
5
4
3
2
1
−
0
1
2
−
−
−
−
10
10
10
10
10
10
10
10
Pulse width
t
(s)
w
5
2006-11-01
GT50J121
RESTRICTIONS ON PRODUCT USE
20070701-EN
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
6
2006-11-01
相关型号:
GT50J322
N CHANNEL MOS TYPE (THE 4TH CENERATION CURRENT RESONACE INVERTER SWITHCING APPLICATIONS)
TOSHIBA
GT50J327
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT Current Resonance Inverter Switching Application
TOSHIBA
GT50J341
TRANSISTOR 50 A, 600 V, N-CHANNEL IGBT, ROHS COMPLIANT, 2-16C1S, TO-3P(N), 3 PIN, Insulated Gate BIP Transistor
TOSHIBA
©2020 ICPDF网 联系我们和版权申明