AOD412 [AOS]

N-Channel Enhancement Mode Field Effect Transistor; N沟道增强型网络场效晶体管
AOD412
型号: AOD412
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

N-Channel Enhancement Mode Field Effect Transistor
N沟道增强型网络场效晶体管

晶体 晶体管
文件: 总5页 (文件大小:116K)
中文:  中文翻译
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AOD412  
N-Channel Enhancement Mode Field Effect Transistor  
General Description  
Features  
The AOD412 uses advanced trench technology to  
provide excellent RDS(ON), low gate chargeand low  
gate resistance. This device is ideally suited for use  
as a high side switch in CPU core power conversion.  
Standard Product AOD412 is Pb-free (meets ROHS  
& Sony 259 specifications). AOD412L is a Green  
Product ordering option. AOD412 and AOD412L are  
electrically identical.  
VDS (V) = 30V  
ID = 85A (VGS = 10V)  
R
DS(ON) < 7.0m(VGS = 10V)  
DS(ON) < 10.5m(VGS = 4.5V)  
R
TO-252  
D-PAK  
D
S
Top View  
Drain Connected  
to Tab  
G
G
D
S
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
Maximum  
Units  
VDS  
Drain-Source Voltage  
30  
V
VGS  
Gate-Source Voltage  
Continuous Drain  
Current B,G  
±20  
85  
V
A
TC=25°C G  
TC=100°C B  
ID  
65  
IDM  
IAR  
EAR  
Pulsed Drain Current  
Avalanche Current C  
200  
30  
A
Repetitive avalanche energy L=0.1mH C  
120  
100  
50  
mJ  
TC=25°C  
PD  
W
Power Dissipation B  
TC=100°C  
TA=25°C  
2.5  
PDSM  
W
Power Dissipation A  
TA=70°C  
1.6  
TJ, TSTG  
Junction and Storage Temperature Range  
-55 to 175  
°C  
Thermal Characteristics  
Parameter  
Maximum Junction-to-Ambient A  
Maximum Junction-to-Ambient A  
Maximum Junction-to-Lead C  
Symbol  
Typ  
14.2  
39  
Max  
20  
Units  
°C/W  
°C/W  
°C/W  
t 10s  
RθJA  
Steady-State  
Steady-State  
50  
RθJL  
0.8  
1.5  
Alpha & Omega Semiconductor, Ltd.  
AOD412  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Parameter  
Conditions  
Symbol  
Min  
Typ  
Max  
Units  
STATIC PARAMETERS  
BVDSS  
Drain-Source Breakdown Voltage  
ID=250µA, VGS=0V  
30  
V
V
DS=24V, VGS=0V  
0.005  
1
5
IDSS  
Zero Gate Voltage Drain Current  
µA  
TJ=55°C  
IGSS  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
V
DS=0V, VGS= ±20V  
100  
2.5  
nA  
V
VGS(th)  
ID(ON)  
VDS=VGS ID=250µA  
1.5  
85  
2.15  
VGS=10V, VDS=5V  
A
V
GS=10V, ID=20A  
5.5  
8.8  
7
mΩ  
RDS(ON)  
TJ=125°C  
Static Drain-Source On-Resistance  
11  
mΩ  
S
VGS=4.5V, ID=20A  
VDS=5V, ID=20A  
IS=1A,VGS=0V  
8.25  
60  
10.5  
gFS  
VSD  
IS  
Forward Transconductance  
Diode Forward Voltage  
0.72  
1
V
Maximum Body-Diode Continuous Current  
85  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
1320  
533  
1600  
1.2  
pF  
pF  
pF  
V
V
GS=0V, VDS=15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
154  
GS=0V, VDS=0V, f=1MHz  
0.95  
SWITCHING PARAMETERS  
Qg(10V)  
Total Gate Charge  
Total Gate Charge  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
Turn-Off Fall Time  
26  
13.3  
3.2  
6.6  
7.2  
12.5  
22  
32  
nC  
nC  
nC  
nC  
ns  
Qg(4.5V)  
16.2  
V
GS=4.5V, VDS=15V, ID=20A  
Qgs  
Qgd  
tD(on)  
tr  
10  
18  
33  
9
VGS=10V, VDS=15V, RL=0.75,  
GEN=3Ω  
ns  
R
tD(off)  
tf  
ns  
6
ns  
trr  
IF=20A, dI/dt=100A/µs  
IF=20A, dI/dt=100A/µs  
29.7  
29  
36  
36  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
ns  
Qrr  
nC  
A: The value of RθJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with T A =25°C. The Power  
dissipation PDSM is based on steady-state R θJA and the maximum allowed junction temperature of 150°C. The value in any given application depends on  
the user's specific board design, and the maximum temperature fo 175°C may be used if the PCB or heatsink allows it.  
B. The power dissipation PD is based on TJ(MAX)=175°C, using junction-to-case thermal resistance, and is more useful in setting the upper dissipation  
limit for cases where additional heatsinking is used. It is used to determine the current rating, when this rating falls below the package limit.  
C: Repetitive rating, pulse width limited by junction temperature TJ(MAX)=175°C.  
D. The R θJA is the sum of the thermal impedence from junction to case R θJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
F. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. The SOA curve  
provides a single pulse rating.  
G. The maximum current rating is limited by the package current capability.  
Rev 3 : July 2005  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Alpha & Omega Semiconductor, Ltd.  
AOD412  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
60  
50  
40  
30  
20  
10  
0
60  
50  
40  
30  
20  
10  
0
10V  
4.0V  
VDS=5V  
125°C  
3.5V  
25°C  
VGS=3V  
0
1
2
3
4
5
1.5  
2
2.5  
3
3.5  
4
4.5  
VDS (Volts)  
VGS(Volts)  
Fig 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
12  
11  
10  
9
1.8  
1.6  
1.4  
1.2  
1
ID=20A  
VGS=10V  
VGS=4.5V  
8
VGS=4.5V  
7
VGS=10V  
6
5
4
0.8  
0
10  
20  
30  
40  
50  
60  
0
25  
50  
75  
Temperature (°C)  
Figure 4: On-Resistance vs. Junction Temperature  
100  
125  
150  
175  
ID (A)  
Figure 3: On-Resistance vs. Drain Current and Gate  
Voltage  
20  
1.0E+02  
1.0E+01  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
125°C  
16  
12  
8
ID=20A  
25°C  
125°C  
25°C  
4
0.0  
0.2  
0.4  
0.6  
SD (Volts)  
Figure 6: Body-Diode Characteristics  
0.8  
1.0  
1.2  
2
4
6
8
10  
V
VGS (Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
Alpha & Omega Semiconductor, Ltd.  
AOD412  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
2400  
2000  
1600  
1200  
800  
400  
0
10  
VDS=15V  
ID=20A  
8
Ciss  
6
4
2
0
Coss  
Crss  
0
5
10  
15  
20  
25  
30  
0
5
10  
15  
VDS (Volts)  
20  
25  
30  
Q
g (nC)  
Figure 7: Gate-Charge Characteristics  
Figure 8: Capacitance Characteristics  
1000  
100  
10  
100  
TJ(Max)=150°C  
TA=25°C  
RDS(ON)  
limited  
10µs  
100µs  
80  
60  
40  
20  
0
1ms  
10ms  
0.1s  
1s  
10s  
TJ(Max)=150°C  
TA=25°C  
1
DC  
0.1  
0.01  
0.1  
1
10  
100  
1000  
0.1  
1
10  
100  
Pulse Width (s)  
VDS (Volts)  
Figure 10: Single Pulse Power Rating Junction-to-  
Ambient (Note F)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note F)  
10  
D=Ton/T  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
TJ,PK=TA+PDM.ZθJA.RθJA  
RθJA=50°C/W  
1
0.1  
PD  
0.01  
0.001  
Ton  
T
Single Pulse  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
Alpha & Omega Semiconductor, Ltd.  
AOD412  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
120  
120  
100  
80  
60  
40  
20  
0
TA=25°C  
100  
80  
60  
40  
20  
0
LID  
tA  
=
BV VDD  
0.00001  
0.0001  
Time in avalanche, tA (s)  
Figure 12: Single Pulse Avalanche capability  
0.001  
0.01  
0
25  
50  
75  
TCASE (°C)  
Figure 13: Power De-rating (Note B)  
100  
125  
150  
175  
100  
80  
60  
40  
20  
0
0
25  
50  
75  
TCASE (°C)  
Figure 14: Current De-rating (Note B)  
100  
125  
150  
175  
Alpha & Omega Semiconductor, Ltd.  

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