AOL1446_08 [AOS]

N-Channel Enhancement Mode Field Effect Transistor; N沟道增强型网络场效晶体管
AOL1446_08
型号: AOL1446_08
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

N-Channel Enhancement Mode Field Effect Transistor
N沟道增强型网络场效晶体管

晶体 晶体管
文件: 总6页 (文件大小:231K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
AOL1446  
N-Channel Enhancement Mode Field Effect Transistor  
General Description  
Features  
The AOL1446 uses advanced trench technology to  
provide excellent RDS(ON), low gate chargeand low  
gate resistance. This device is ideally suited for use  
as a high side switch in CPU core power conversion.  
VDS (V) = 30V  
ID = 85A (VGS = 10V)  
RDS(ON) < 7m(VGS = 10V)  
R
DS(ON) < 11m(VGS = 4.5V)  
-RoHS Compliant  
-Halogen and Antimony Free Green Device*  
UIS Tested  
Rg,Ciss,Coss,Crss Tested  
Ultra SO-8TM Top View  
D
D
Bottom tab  
connected to  
G
S
drain  
S
G
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
Maximum  
Units  
Drain-Source Voltage  
VDS  
30  
V
Gate-Source Voltage  
Continuous Drain  
Current B  
VGS  
±20  
85  
V
A
TC=25°C G  
TC=100°C  
ID  
70  
Pulsed Drain Current  
Continuous Drain  
Current G  
IDM  
200  
14  
TA=25°C  
TA=70°C  
A
IDSM  
IAR  
11  
Avalanche Current C  
30  
A
Repetitive avalanche energy L=0.3mH C  
EAR  
135  
100  
50  
mJ  
TC=25°C  
Power Dissipation B  
TC=100°C  
PD  
W
TA=25°C  
2.1  
PDSM  
W
Power Dissipation A  
1.3  
TA=70°C  
Junction and Storage Temperature Range  
TJ, TSTG  
-55 to 175  
°C  
Thermal Characteristics  
Parameter  
Symbol  
Typ  
19.5  
48  
Max  
25  
Units  
°C/W  
°C/W  
°C/W  
Maximum Junction-to-Ambient A  
t ≤ 10s  
RθJA  
Maximum Junction-to-Ambient A  
Maximum Junction-to-CaseC  
Steady-State  
Steady-State  
60  
RθJC  
1
1.5  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1446  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
STATIC PARAMETERS  
ID=250µA, VGS=0V  
BVDSS  
Drain-Source Breakdown Voltage  
30  
V
V
DS=24V, VGS=0V  
0.005  
1
5
IDSS  
Zero Gate Voltage Drain Current  
µA  
TJ=55°C  
VDS=0V, VGS= ±20V  
IGSS  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
100  
3
nA  
V
VDS=VGS ID=250µA  
VGS(th)  
ID(ON)  
1
2.3  
V
GS=10V, VDS=5V  
100  
A
VGS=10V, ID=20A  
5
7
mΩ  
RDS(ON)  
Static Drain-Source On-Resistance  
TJ=125°C  
6.7  
8.4  
60  
8.1  
11  
VGS=4.5V, ID=20A  
mΩ  
S
V
DS=5V, ID=20A  
gFS  
VSD  
IS  
Forward Transconductance  
Diode Forward Voltage  
IS=1A,VGS=0V  
0.72  
1
V
Maximum Body-Diode Continuous Current  
85  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
1325  
535  
1600  
1.5  
pF  
pF  
pF  
VGS=0V, VDS=15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
155  
VGS=0V, VDS=0V, f=1MHz  
0.95  
SWITCHING PARAMETERS  
Qg(10V) Total Gate Charge  
26  
13.5  
3.2  
6.6  
7.2  
12.5  
22  
32  
18  
nC  
nC  
nC  
nC  
ns  
Qg(4.5V) Total Gate Charge  
V
GS=4.5V, VDS=15V, ID=20A  
Qgs  
Qgd  
tD(on)  
tr  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
10  
18  
33  
36  
VGS=10V, VDS=15V, RL=0.75,  
RGEN=3Ω  
ns  
tD(off)  
Qrr  
ns  
IF=20A, dI/dt=100A/µs  
29  
nC  
Body Diode Reverse Recovery Charge  
A: The value of R θJA is measured with the device in a still air environment with T A =25°C.  
B. The power dissipation PD is based on TJ(MAX)=175°C, using junction-to-case thermal resistance, and is more useful in setting the upper  
dissipation limit for cases where additional heatsinking is used.  
C: Repetitive rating, pulse width limited by junction temperature T J(MAX)=175°C.  
D. The RθJA is the sum of the thermal impedence from junction to case R θJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a  
maximum junction temperature of T J(MAX)=175°C.  
G. Surface mounted on a 1 in 2 FR-4 board with 2oz. Copper.  
H. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. The SOA  
curve provides a single pulse rating.  
* This device is guaranteed green after date code 8P11 (June 1 ST 2008)  
Revision 2: June 2008  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1446  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
60  
50  
40  
30  
20  
10  
0
60  
50  
40  
30  
20  
10  
0
10V  
4.0V  
VDS=5V  
125°C  
3.5V  
25°C  
VGS=3V  
0
1
2
3
4
5
1.5  
2
2.5  
3
3.5  
4
4.5  
V
DS (Volts)  
VGS(Volts)  
Fig 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
10  
9
1.8  
1.6  
1.4  
1.2  
1
VGS=4.5V  
ID=20A  
VGS=10V  
8
7
VGS=4.5V  
6
5
VGS=10V  
50  
4
0.8  
0
10  
20  
30  
40  
60  
0
25  
50  
75  
Temperature (°C)  
Figure 4: On-Resistance vs. Junction Temperature  
100  
125  
150  
175  
ID (A)  
Figure 3: On-Resistance vs. Drain Current and Gate  
Voltage  
20  
1.0E+02  
1.0E+01  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
125°C  
16  
12  
8
ID=20A  
25°C  
125°C  
25°C  
4
0.0  
0.2  
0.4  
0.6  
VSD (Volts)  
Figure 6: Body-Diode Characteristics  
0.8  
1.0  
1.2  
2
4
6
8
10  
VGS (Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1446  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
2400  
10  
8
VDS=15V  
ID=20A  
2000  
1600  
1200  
800  
400  
0
Ciss  
6
4
Coss  
2
Crss  
0
0
5
10  
15  
20  
25  
30  
0
5
10  
15  
DS (Volts)  
20  
25  
30  
Qg (nC)  
V
Figure 7: Gate-Charge Characteristics  
Figure 8: Capacitance Characteristics  
1000  
100  
10  
400  
RDS(ON)  
limited  
TJ(Max)=175°C  
TA=25°C  
10µs  
300  
200  
100  
0
1ms  
100
µ
s  
DC  
TJ(Max)=175°C  
TA=25°C  
1
0.1  
0.0001 0.001  
0.01  
0.1  
1
10  
100  
0.1  
1
10  
100  
Pulse Width (s)  
V
DS (Volts)  
Figure 10: Single Pulse Power Rating Junction-to-  
Case (Note F)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note H)  
10  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
D=Ton/T  
TJ,PK=TA+PDM.ZθJA.RθJA  
RθJC=1.5°C/W  
1
0.1  
PD  
Ton  
T
Single Pulse  
0.01  
0.00001  
0.0001  
0.001  
0.01  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
0.1  
1
10  
100  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1446  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
120  
90  
60  
30  
0
100  
80  
60  
40  
20  
0
TA=25°C  
0.00001  
0.0001  
Time in avalanche, tA (s)  
Figure 12: Single Pulse Avalanche capability  
0.001  
0.01  
0
25  
50  
75  
TCASE (°C)  
Figure 13: Power De-rating (Note B)  
100  
125  
150  
175  
100  
80  
60  
40  
20  
0
100  
80  
60  
40  
20  
0
0
25  
50  
75  
100  
125  
150  
175  
0.01  
0.1  
1
10  
100  
1000  
TCASE (°C)  
Pulse Width (s)  
Figure 14: Current De-rating (Note B)  
Figure 15: Single Pulse Power Rating Junction-to-  
Ambient (Note H)  
10  
1
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
0.1  
PD  
D=Ton/T  
0.01  
TJ,PK=TA+PDM.ZθJA.RθJA  
RθJA=60 °C/W  
Ton  
T
0.001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 16: Normalized Maximum Transient Thermal Impedance (Note H)  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1446  
Gate Charge Test Circuit &Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Vds  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
t d(on)  
t
r
t d(off)  
t
f
t on  
toff  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
2
EAR=1/2LI  
AR  
BVDSS  
Vds  
Id  
Vds  
+
Vgs  
Vdd  
IAR  
Vgs  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode RecoveryTestCircuit &Waveforms  
Qrr=- Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
Isd  
trr  
L
IF  
Isd  
dI/dt  
+
IRM  
Vdd  
Vgs  
VDC  
Vdd  
-
Vds  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  

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