AOL1700 [FREESCALE]

N-Channel Enhancement Mode Field; N沟道增强型场
AOL1700
型号: AOL1700
厂家: Freescale    Freescale
描述:

N-Channel Enhancement Mode Field
N沟道增强型场

文件: 总6页 (文件大小:617K)
中文:  中文翻译
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AOL1700  
N-Channel Enhancement Mode Field  
Effect Transistor  
General Description  
SRFETTM AOL1700 uses advanced trench  
technology with a monolithically integrated Schottky  
diode to provide excellent RDS(ON),and low gate  
charge. This device is suitable for use as a low side  
FET in SMPS, load switching and general purpose applications.  
Features  
VDS (V) = 30V  
ID =85A (VGS = 10V)  
RDS(ON) < 4.2m(VGS = 10V)  
RDS(ON) < 6.0m(VGS = 4.5V)  
Ultra SO-8TM Top View  
D
SRFETTM  
Soft Recovery MOSFET:  
Integrated Schottky Diode  
D
Bottom tab  
connected to  
drain  
G
S
S
G
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
Maximum  
Units  
Drain-Source Voltage  
VDS  
30  
V
Gate-Source Voltage  
VGS  
±20  
85  
V
A
TC=25°C H  
TC=100°C  
Continuous Drain  
Current B  
Pulsed Drain Current C  
ID  
81  
200  
17  
IDM  
TA=25°C  
TA=70°C  
Continuous Drain  
Current A  
Avalanche Current C  
A
IDSM  
IAR  
13  
30  
A
Repetitive avalanche energy L=0.3mH C  
EAR  
135  
100  
50  
mJ  
TC=25°C  
Power Dissipation B  
TC=100°C  
PD  
W
TA=25°C  
2.1  
PDSM  
W
Power Dissipation A  
1.3  
TA=70°C  
Junction and Storage Temperature Range TJ, TSTG  
-55 to 175  
°C  
Thermal Characteristics  
Parameter  
Symbol  
Typ  
19.6  
50  
Max  
25  
Units  
°C/W  
°C/W  
°C/W  
Maximum Junction-to-Ambient A  
t ≤ 10s  
RθJA  
Maximum Junction-to-Ambient A  
Steady-State  
Maximum Junction-to-Case D  
60  
Steady-State  
RθJC  
1
1.5  
1/6  
www.freescale.net.cn  
AOL1700  
N-Channel Enhancement Mode Field  
Effect Transistor  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
ID=1mA, VGS=0V  
VDS=30V, VGS=0V  
BVDSS  
Drain-Source Breakdown Voltage  
30  
V
0.1  
mA  
20  
IDSS  
Zero Gate Voltage Drain Current  
TJ=125°C  
TJ=125°C  
VDS=0V, VGS= ±20V  
IGSS  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
0.1  
2.2  
µA  
V
VGS(th)  
ID(ON)  
VDS=VGS ID=250µA  
1.2  
1.5  
VGS=10V, VDS=5V  
200  
A
VGS=10V, ID=20A  
3.4  
5.2  
4.8  
90  
4.2  
6.5  
6.0  
mΩ  
RDS(ON)  
Static Drain-Source On-Resistance  
V
GS=4.5V, ID=20A  
DS=5V, ID=20A  
mΩ  
S
V
gFS  
VSD  
IS  
Forward Transconductance  
Diode Forward Voltage  
IS=1A,VGS=0V  
0.36  
0.5  
85  
V
Maximum Body-Diode + Schottky Diode Continuous Current H  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
3760 4512  
682  
pF  
pF  
pF  
VGS=0V, VDS=15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
314  
VGS=0V, VDS=0V, f=1MHz  
0.75  
1.5  
SWITCHING PARAMETERS  
Qg(10V) Total Gate Charge  
62  
29  
12  
12  
9.5  
8.5  
34  
9
74  
35  
nC  
nC  
nC  
nC  
ns  
Qg(4.5V) Total Gate Charge  
V
GS=10V, VDS=15V, ID=20A  
Qgs  
Qgd  
tD(on)  
tr  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
Turn-Off Fall Time  
VGS=10V, VDS=15V, RL=0.75,  
GEN=3Ω  
ns  
R
tD(off)  
tf  
ns  
ns  
trr  
IF=20A, dI/dt=300A/µs  
IF=20A, dI/dt=300A/µs  
18  
22  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
27  
ns  
Qrr  
nC  
A: The value of RθJA is measured with the device in a still air environment with T A =25°C. The power dissipation PDSM and current rating IDSM  
are based on TJ(MAX)=150°C, using steady-state junction-to-ambient thermal resistance.  
B. The power dissipation PD is based on TJ(MAX)=175°C, using junction-to-case thermal resistance, and is more useful in setting the upper  
dissipation limit for cases where additional heatsinking is used.  
C: Repetitive rating, pulse width limited by junction temperature T J(MAX)=175°C.  
D. The RθJA is the sum of the thermal impedence from junction to case R θJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 us pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink,  
assuming a maximum junction temperature of T J(MAX)=175°C. The SOA curve provides a single pulse rating.  
G. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T A=25°C.  
H. The maximum current rating is limited by bond-wires.  
* This device is guaranteed green after date code 8P11 (June 1 ST 2008)  
Rev3: Dec 2008  
2/6  
www.freescale.net.cn  
AOL1700  
N-Channel Enhancement Mode Field  
Effect Transistor  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
200  
30  
10V  
5V  
VDS=5V  
175  
150  
125  
100  
75  
25  
20  
15  
10  
5
7V  
6V  
4.5V  
4.0V  
125°  
3.5V  
VGS=3.0V  
3
25°C  
50  
25  
0
0
0
1
2
4
5
1
1.5  
2
2.5  
3
3.5  
4
VDS (Volts)  
V
GS(Volts)  
Figure 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
7
6
5
4
3
2
2
ID=20A  
1.8  
1.6  
1.4  
1.2  
1
VGS=10V  
VGS=4.5V  
VGS=4.5V  
VGS=10V  
0.8  
0
5
10  
15  
20  
25  
30  
0
30  
60  
90  
120  
150  
180  
210  
I
D (A)  
Temperature (°C)  
Figure 4: On-Resistance vs. Junction  
Temperature  
Figure 3: On-Resistance vs. Drain Current and  
Gate Voltage  
8
7
6
5
4
3
2
1.0E+02  
1.0E+01  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
ID=20A  
125°C  
25°C  
125°C  
25°C  
2
4
6
8
10  
0.0  
0.2  
0.4  
VSD (Volts)  
Figure 6: Body-Diode Characteristics  
0.6  
0.8  
1.0  
V
GS (Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
3/6  
www.freescale.net.cn  
AOL1700  
N-Channel Enhancement Mode Field  
Effect Transistor  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
6.00E-09  
5.00E-09  
10  
8
VDS=15V  
ID=20A  
Ciss  
4.00E-09  
3.00E-09  
2.00E-09  
1.00E-09  
0.00E+00  
6
4
Coss  
2
Crss  
0
0
10  
20  
30  
40  
g (nC)  
50  
60  
70  
0
5
10  
15  
VDS (Volts)  
20  
25  
30  
Q
Figure 7: Gate-Charge Characteristics  
Figure 8: Capacitance Characteristics  
200  
1000.0  
100.0  
10.0  
1.0  
10µs  
180  
160  
140  
120  
100  
80  
TJ(Max)=175°C  
TC=25°C  
100µ  
1ms  
RDS(ON)  
limited  
DC  
10ms  
100ms  
TJ(Max)=175°C  
TC=25°C  
0.1  
0.0  
0.01  
0.1  
1
10  
100  
0.01  
0.1  
1
10  
100  
VDS (Volts)  
Pulse Width (s)  
Figure 10: Single Pulse Power Rating Junction-to-  
Case (Note F)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note F)  
10  
D=Ton/T  
In descending order  
TJ,PK=TC+PDM.ZθJc.RθJc  
RθJC=1.5°C/W  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
1
0.1  
PD  
Single Pulse  
Ton  
T
0.01  
0.00001  
0.0001  
0.001  
0.01  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
0.1  
1
10  
100  
4/6  
www.freescale.net.cn  
AOL1700  
N-Channel Enhancement Mode Field  
Effect Transistor  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
120  
100  
80  
60  
40  
20  
0
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
TC=25°C  
TC=150°C  
0
25  
50  
75  
100 125 150 175  
1.0E-07  
1.0E-06  
Time in avalanche, tA (s)  
Figure 12: Single Pulse Avalanche capability  
1.0E-05  
1.0E-04  
1.0E-03  
T
CASE (°C)  
Figure 13: Power De-rating (Note B)  
100  
80  
60  
40  
20  
0
100  
80  
60  
40  
20  
0
TJ(Max)=150°C  
TA=25°C  
0
25  
50  
75  
100  
125  
150  
175  
0.001  
0.01  
0.1  
1
10  
100  
1000  
T
CASE (°C)  
Pulse Width (s)  
Figure 14: Current De-rating (Note B)  
Figure15: Single Pulse Power Rating Junction-to-  
Ambient (Note G)  
10  
1
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
0.1  
PD  
D=Ton/T  
TJ,PK=TA+PDM.ZθJA.RθJA  
0.01  
Single Pulse  
0.001  
Ton  
T
RθJA=60°C/W  
0.001  
0.00001  
0.0001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 16: Normalized Maximum Transient Thermal Impedance (Note G)  
5/6  
www.freescale.net.cn  
AOL1700  
N-Channel Enhancement Mode Field  
Effect Transistor  
Gate Charge Test Circuit &Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Vds  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
t d(on)  
t
r
t d(off)  
t
f
t on  
toff  
Unclamped Inductive Switching (UIS) Test Circuit& Waveforms  
L
2
EAR=1/2 LI  
AR  
BVDSS  
Vds  
Id  
Vds  
+
Vgs  
Vdd  
IAR  
Vgs  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode RecoveryTestCircuit &Waveforms  
Qrr=- Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
Isd  
trr  
L
IF  
Isd  
dI/dt  
+
IRM  
Vdd  
Vgs  
VDC  
Vdd  
-
Vds  
6/6  
www.freescale.net.cn  

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