FDP33N25 [FAIRCHILD]

250V N-Channel MOSFET; 250V N沟道MOSFET
FDP33N25
型号: FDP33N25
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

250V N-Channel MOSFET
250V N沟道MOSFET

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July 2006  
TM  
UniFET  
FDP33N25  
250V N-Channel MOSFET  
Features  
Description  
33A, 250V, RDS(on) = 0.094Ω @VGS = 10 V  
Low gate charge ( typical 36.8 nC)  
Low Crss ( typical 39 pF)  
These N-Channel enhancement mode power field effect  
transistors are produced using Fairchild’s proprietary, planar  
stripe, DMOS technology.  
This advanced technology has been especially tailored to  
minimize on-state resistance, provide superior switching  
performance, and withstand high energy pulse in the avalanche  
and commutation mode. These devices are well suited for high  
efficient switched mode power supplies and active power factor  
correction.  
Fast switching  
100% avalanche tested  
Improved dv/dt capability  
D
G
TO-220  
FDP Series  
G
D S  
S
Absolute Maximum Ratings  
Symbol  
Parameter  
FDP33N25  
Unit  
VDSS  
Drain-Source Voltage  
Drain Current  
250  
V
ID  
- Continuous (TC = 25°C)  
- Continuous (TC = 100°C)  
33  
20.4  
A
A
(Note 1)  
(Note 2)  
IDM  
Drain Current  
- Pulsed  
132  
±30  
918  
33  
A
V
VGSS  
EAS  
IAR  
Gate-Source voltage  
Single Pulsed Avalanche Energy  
Avalanche Current  
mJ  
A
(Note 1)  
(Note 1)  
(Note 3)  
EAR  
dv/dt  
PD  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
23.5  
4.5  
mJ  
V/ns  
Power Dissipation  
(TC = 25°C)  
235  
W
- Derate above 25°C  
1.89  
W/°C  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
-55 to +150  
300  
°C  
Maximum Lead Temperature for Soldering Purpose,  
1/8” from Case for 5 Seconds  
°C  
Thermal Characteristics  
Symbol  
Parameter  
Min.  
Max.  
0.53  
--  
Unit  
°C/W  
°C/W  
°C/W  
RθJC  
RθCS  
RθJA  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Case-to-Sink  
--  
0.5  
--  
Thermal Resistance, Junction-to-Ambient  
62.5  
©2006 Fairchild Semiconductor Corporation  
FDP33N25 Rev A  
1
www.fairchildsemi.com  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
Tape Width  
Quantity  
FDP33N25  
FDP33N25  
TO-220  
-
-
50  
Electrical Characteristics  
T
= 25°C unless otherwise noted  
C
Symbol  
Parameter  
Conditions  
Min. Typ. Max Units  
Off Characteristics  
BVDSS  
Drain-Source Breakdown Voltage  
VGS = 0V, ID = 250μA  
250  
--  
--  
--  
--  
V
ΔBVDSS  
Breakdown Voltage Temperature  
Coefficient  
ID = 250μA, Referenced to 25°C  
0.25  
V/°C  
/
ΔTJ  
IDSS  
Zero Gate Voltage Drain Current  
VDS = 250V, VGS = 0V  
VDS = 200V, TC = 125°C  
--  
--  
--  
--  
1
10  
μA  
μA  
IGSSF  
IGSSR  
Gate-Body Leakage Current, Forward  
Gate-Body Leakage Current, Reverse  
VGS = 30V, VDS = 0V  
VGS = -30V, VDS = 0V  
--  
--  
--  
--  
100  
nA  
nA  
-100  
On Characteristics  
VGS(th) Gate Threshold Voltage  
RDS(on)  
VDS = VGS, ID = 250μA  
VGS = 10V, ID = 16.5A  
VDS = 40V, ID =16.5A  
3.0  
--  
--  
5.0  
0.094  
--  
V
Ω
S
Static Drain-Source  
On-Resistance  
0.077  
26.6  
(Note 4)  
gFS  
Forward Transconductance  
--  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
VDS = 25V, VGS = 0V,  
f = 1.0MHz  
--  
--  
--  
1640  
330  
39  
2135  
430  
59  
pF  
pF  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics  
td(on) Turn-On Delay Time  
tr  
td(off)  
tf  
VDD = 125V, ID = 33A  
RG = 25Ω  
--  
--  
--  
--  
--  
--  
--  
35  
230  
75  
80  
470  
160  
250  
48  
ns  
ns  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
ns  
(Note 4, 5)  
(Note 4, 5)  
120  
36.8  
10  
ns  
Qg  
VDS = 200V, ID = 33A  
VGS = 10V  
nC  
nC  
nC  
Qgs  
Qgd  
--  
17  
--  
Drain-Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain-Source Diode Forward Current  
Maximum Pulsed Drain-Source Diode Forward Current  
--  
--  
--  
--  
--  
--  
--  
33  
132  
1.4  
--  
A
A
ISM  
VSD  
trr  
Drain-Source Diode Forward Voltage  
Reverse Recovery Time  
VGS = 0V, IS = 33A  
--  
V
VGS = 0V, IS = 33A  
220  
1.71  
ns  
μC  
dIF/dt =100A/μs  
(Note 4)  
Qrr  
Reverse Recovery Charge  
--  
NOTES:  
1. Repetitive Rating: Pulse width limited by maximum junction temperature  
2. L = 1.35mH, I = 33A, V = 50V, R = 25Ω, Starting T = 25°C  
AS  
DD  
G
J
3. I 33A, di/dt 200A/μs, V BV  
, Starting T = 25°C  
SD  
DD  
DSS  
J
4. Pulse Test: Pulse width 300μs, Duty Cycle 2%  
5. Essentially Independent of Operating Temperature Typical Characteristics  
2
www.fairchildsemi.com  
FDP33N25 Rev A  
Typical Performance Characteristics  
Figure 1. On-Region Characteristics  
Figure 2. Transfer Characteristics  
102  
101  
100  
102  
VGS  
Top :  
15.0 V  
10.0 V  
8.0 V  
7.0 V  
6.5 V  
6.0 V  
Bottom : 5.5 V  
101  
150oC  
25oC  
-55oC  
* Notes :  
1. VDS = 40V  
* Notes :  
1. 250μs Pulse Test  
2. TC = 25oC  
100  
2. 250μs Pulse Test  
10-1  
100  
101  
2
4
6
8
10  
12  
VGS, Gate-Source Voltage [V]  
VDS, Drain-Source Voltage [V]  
Figure 3. On-Resistance Variation vs.  
Drain Current and Gate Voltage  
Figure 4. Body Diode Forward Voltage  
Variation vs. Source Current  
and Temperatue  
0.25  
0.20  
102  
101  
100  
VGS = 10V  
0.15  
150oC  
25oC  
0.10  
VGS = 20V  
0.05  
* Notes :  
1. VGS = 0V  
* Note : TJ = 25oC  
2. 250μs Pulse Test  
0.00  
0
20  
40  
60  
80  
100  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
1.6  
ID, Drain Current [A]  
VSD, Source-Drain voltage [V]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
12  
10  
8
4000  
C
iss = Cgs + Cgd (Cds = shorted)  
Coss = Cds + Cgd  
rss = Cgd  
VDS = 50V  
VDS = 125V  
VDS = 200V  
C
3000  
2000  
1000  
0
Coss  
C
iss  
6
4
* Note ;  
1. VGS = 0 V  
C
rss  
2. f = 1 MHz  
2
* Note : ID = 33A  
0
10-1  
100  
101  
0
10  
20  
30  
40  
QG, Total Gate Charge [nC]  
VDS, Drain-Source Voltage [V]  
3
www.fairchildsemi.com  
FDP33N25 Rev A  
Typical Performance Characteristics (Continued)  
Figure 7. Breakdown Voltage Variation  
vs. Temperature  
Figure 8. On-Resistance Variation  
vs. Temperature  
3.0  
2.5  
2.0  
1.5  
1.2  
1.1  
1.0  
1.0  
* Notes :  
0.9  
1. VGS = 0 V  
* Notes :  
1. VGS = 10 V  
2. ID = 250 μA  
0.5  
2. ID = 16.5 A  
0.8  
-100  
0.0  
-100  
-50  
0
50  
100  
150  
200  
-50  
0
50  
100  
150  
200  
T, Junction Temperature [oC]  
TJ, Junction Temperature [oC]  
J
Figure 9. Maximum Safe Operating Area  
Figure 10. Maximum Drain Current  
vs. Case Temperature  
40  
30  
20  
10  
0
10 μs  
102  
100 μs  
1 ms  
10 ms  
100 ms  
101  
DC  
Operation in This Area  
is Limited by R DS(on)  
100  
* Notes :  
1. TC = 25 o  
2. TJ = 150 o  
C
C
3. Single Pulse  
-1  
10  
100  
101  
102  
25  
50  
75  
100  
125  
150  
TC, Case Temperature [oC]  
VDS, Drain-Source Voltage [V]  
Figure 11. Transient Thermal Response Curve  
100  
10-1  
10-2  
D=0.5  
0.2  
PDM  
0.1  
0.05  
t1  
t2  
0.02  
* Notes :  
1. ZθJC(t) = 0.53 oC/W Max.  
0.01  
single pulse  
2. Duty Factor, D=t1/t2  
3. TJM - TC = PDM * ZθJC(t)  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
t1, Square W ave Pulse Duration [sec]  
4
www.fairchildsemi.com  
FDP33N25 Rev A  
Gate Charge Test Circuit & Waveform  
Resistive Switching Test Circuit & Waveforms  
Unclamped Inductive Switching Test Circuit & Waveforms  
5
www.fairchildsemi.com  
FDP33N25 Rev A  
Peak Diode Recovery dv/dt Test Circuit & Waveforms  
6
www.fairchildsemi.com  
FDP33N25 Rev A  
Mechanical Dimensions  
TO-220  
Dimensions in Millimeters  
7
www.fairchildsemi.com  
FDP33N25 Rev A  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not  
intended to be an exhaustive list of all such trademarks.  
®
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PACMAN™  
POP™  
Power247™  
PowerEdge™  
PowerSaver™  
SILENT SWITCHER  
SMART START™  
SPM™  
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UltraFET  
VCX™  
®
ActiveArray™  
Bottomless™  
Build it Now™  
CoolFET™  
CROSSVOLT™  
DOME™  
®
HiSeC™  
Stealth™  
Wire™  
2
I C™  
SuperFET™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
TCM™  
TinyBoost™  
TinyBuck™  
i-Lo™  
ImpliedDisconnect™  
IntelliMAX™  
ISOPLANAR™  
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MICROCOUPLER™  
MicroFET™  
MicroPak™  
MICROWIRE™  
MSX™  
MSXPro™  
EcoSPARK™  
2
E CMOS™  
®
EnSigna™  
FACT™  
PowerTrench  
®
QFET  
®
FAST  
QS™  
FASTr™  
FPS™  
FRFET™  
QT Optoelectronics™  
Quiet Series™  
RapidConfigure™  
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®
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS  
HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE  
APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER  
ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S  
WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR  
SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or systems which,  
(a) are intended for surgical implant into the body, or (b) support or  
sustain life, or (c) whose failure to perform when properly used in  
accordance with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the user.  
2. A critical component is any component of a life support device or  
system whose failure to perform can be reasonably expected to  
cause the failure of the life support device or system, or to affect its  
safety or effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Advance Information  
Product Status  
Definition  
Formative or In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. I20  

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