MRF6S9160HSR3 [FREESCALE]

RF Power Field Effect Transistors (N-Channel Enhancement-Mode Lateral MOSFETs); 射频功率场效应晶体管( N沟道增强模式横向的MOSFET )
MRF6S9160HSR3
型号: MRF6S9160HSR3
厂家: Freescale    Freescale
描述:

RF Power Field Effect Transistors (N-Channel Enhancement-Mode Lateral MOSFETs)
射频功率场效应晶体管( N沟道增强模式横向的MOSFET )

晶体 晶体管 功率场效应晶体管 射频 CD 放大器
文件: 总12页 (文件大小:537K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Document Number: MRF6S9160H  
Rev. 1, 5/2006  
Freescale Semiconductor  
Technical Data  
RF Power Field Effect Transistors  
N-Channel Enhancement-Mode Lateral MOSFETs  
Designed for N-CDMA, GSM and GSM EDGE base station applications  
with frequencies from 865 to 960 MHz. Suitable for multicarrier amplifier  
applications.  
MRF6S9160HR3  
MRF6S9160HSR3  
Typical Single-Carrier N-CDMA Performance @ 880 MHz: VDD = 28 Volts,  
IDQ = 1200 mA, Pout = 35 Watts Avg., IS-95 CDMA (Pilot, Sync, Paging,  
Traffic Codes 8 Through 13) Channel Bandwidth = 1.2288 MHz. PAR =  
9.8 dB @ 0.01% Probability on CCDF.  
Power Gain — 20.9 dB  
Drain Efficiency — 30.5%  
ACPR @ 750 kHz Offset — -46.8 dBc in 30 kHz Bandwidth  
880 MHz, 35 W AVG., 28 V  
SINGLE N-CDMA  
LATERAL N-CHANNEL  
RF POWER MOSFETs  
GSM EDGE Application  
Typical GSM EDGE Performance: VDD = 28 Volts, IDQ = 1200 mA,  
Pout = 76 Watts Avg., Full Frequency Band (865-895 MHz)  
Power Gain — 20 dB  
Drain Efficiency — 45%  
Spectral Regrowth @ 400 kHz Offset = -66 dBc  
Spectral Regrowth @ 600 kHz Offset = -75 dBc  
EVM — 2% rms  
GSM Application  
Typical GSM Performance: VDD = 28 Volts, IDQ = 1200 mA, Pout  
160 Watts, Full Frequency Band (921-960 MHz)  
Power Gain — 20 dB  
=
CASE 465-06, STYLE 1  
NI-780  
MRF6S9160HR3  
Drain Efficiency — 58%  
Capable of Handling 10:1 VSWR, @ 28 Vdc, 880 MHz, 160 Watts CW  
Output Power  
Features  
CASE 465A-06, STYLE 1  
NI-780S  
Characterized with Series Equivalent Large-Signal Impedance Parameters  
Internally Matched for Ease of Use  
MRF6S9160HSR3  
Qualified Up to a Maximum of 32 VDD Operation  
Integrated ESD Protection  
Lower Thermal Resistance Package  
Low Gold Plating Thickness on Leads, 40μNominal.  
RoHS Compliant  
In Tape and Reel. R3 Suffix = 250 Units per 56 mm, 13 inch Reel.  
Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
Unit  
Vdc  
Vdc  
Drain-Source Voltage  
Gate-Source Voltage  
V
DSS  
-0.5, +68  
-0.5, +12  
V
GS  
Total Device Dissipation @ T = 25°C  
Derate above 25°C  
P
D
565  
3.2  
W
W/°C  
C
Storage Temperature Range  
Case Operating Temperature  
Operating Junction Temperature  
T
- 65 to +150  
150  
°C  
°C  
°C  
stg  
T
C
T
200  
J
© Freescale Semiconductor, Inc., 2006. All rights reserved.  
Table 2. Thermal Characteristics  
(1,2)  
Characteristic  
Symbol  
Value  
Unit  
Thermal Resistance, Junction to Case  
Case Temperature 81°C, 160 W CW  
Case Temperature 73°C, 35 W CW  
R
°C/W  
θ
JC  
0.31  
0.33  
Table 3. ESD Protection Characteristics  
Test Methodology  
Class  
Human Body Model (per JESD22-A114)  
Machine Model (per EIA/JESD22-A115)  
Charge Device Model (per JESD22-C101)  
1A (Minimum)  
A (Minimum)  
IV (Minimum)  
Table 4. Electrical Characteristics (T = 25°C unless otherwise noted)  
C
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
Off Characteristics  
Zero Gate Voltage Drain Leakage Current  
I
I
10  
1
μAdc  
μAdc  
μAdc  
DSS  
DSS  
GSS  
(V = 68 Vdc, V = 0 Vdc)  
DS  
GS  
Zero Gate Voltage Drain Leakage Current  
(V = 28 Vdc, V = 0 Vdc)  
DS  
GS  
Gate-Source Leakage Current  
I
1
(V = 5 Vdc, V = 0 Vdc)  
GS  
DS  
On Characteristics  
Gate Threshold Voltage  
(V = 10 Vdc, I = 525 μAdc)  
V
V
1
2
2
3
4
Vdc  
Vdc  
Vdc  
S
GS(th)  
GS(Q)  
DS(on)  
DS  
D
Gate Quiescent Voltage  
(V = 28 Vdc, I = 1200 mAdc, Measured in Functional Test)  
3
DS  
D
Drain-Source On-Voltage  
(V = 10 Vdc, I = 3.6 Adc)  
V
0.1  
0.2  
9.7  
0.3  
GS  
D
Forward Transconductance  
(V = 10 Vdc, I = 8 Adc)  
g
fs  
DS  
D
(3)  
Dynamic Characteristics  
Output Capacitance  
(V = 28 Vdc 30 mV(rms)ac @ 1 MHz, V = 0 Vdc)  
DS  
C
80.2  
2.2  
pF  
pF  
oss  
GS  
Reverse Transfer Capacitance  
C
rss  
(V = 28 Vdc 30 mV(rms)ac @ 1 MHz, V = 0 Vdc)  
DS  
GS  
Functional Tests (In Freescale Test Fixture, 50 ohm system) V = 28 Vdc, I = 1200 mA, P = 35 W Avg. N-CDMA,  
DD  
DQ  
out  
f = 880 MHz, Single-Carrier N-CDMA, 1.2288 MHz Channel Bandwidth Carrier. ACPR measured in 30 kHz Channel Bandwidth @ 750 kHz  
Offset. PAR = 9.8 dB @ 0.01% Probability on CCDF  
Power Gain  
G
20  
29  
20.9  
30.5  
-46.8  
-17  
23  
dB  
%
ps  
Drain Efficiency  
η
D
Adjacent Channel Power Ratio  
Input Return Loss  
ACPR  
IRL  
-45  
-9  
dBc  
dB  
1. MTTF calculator available at http://www.freescale.com/rf. Select Tools/Software/Application Software/Calculators to  
access the MTTF calculators by product.  
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.  
Select Documentation/Application Notes - AN1955.  
3. Part is internally matched on input.  
(continued)  
MRF6S9160HR3 MRF6S9160HSR3  
RF Device Data  
Freescale Semiconductor  
2
Table 4. Electrical Characteristics (T = 25°C unless otherwise noted) (continued)  
C
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
Typical GSM EDGE Performances (In Freescale GSM EDGE Test Fixture, 50 οhm system) V = 28 Vdc, I = 1200 mA,  
DD  
DQ  
P
out  
= 76 W Avg., 865 MHz<Frequency<895 MHz  
Power Gain  
G
20  
45  
2
dB  
%
ps  
Drain Efficiency  
η
D
Error Vector Magnitude  
Spectral Regrowth at 400 kHz Offset  
Spectral Regrowth at 600 kHz Offset  
EVM  
SR1  
SR2  
% rms  
dBc  
dBc  
-66  
-75  
Typical CW Performances (In Freescale GSM Test Fixture, 50 οhm system) V = 28 Vdc, I = 1200 mA, P = 160 W,  
DD  
DQ  
out  
921 MHz<Frequency<960 MHz  
Power Gain  
G
20  
dB  
%
ps  
Drain Efficiency  
η
58  
D
Input Return Loss  
IRL  
-12  
160  
dB  
W
P
out  
@ 1 dB Compression Point, CW  
P1dB  
(f = 940 MHz)  
MRF6S9160HR3 MRF6S9160HSR3  
RF Device Data  
Freescale Semiconductor  
3
B2  
V
V
BIAS  
SUPPLY  
B1  
R2  
+
+
C21  
C22  
C24  
C23  
C20  
R1  
L2  
C16 C17 C18  
C19  
RF  
OUTPUT  
C7  
C8  
C9  
L1  
Z9  
Z10  
Z11 Z12 Z13 Z14 Z15 Z16 Z17 Z18  
Z19  
RF  
INPUT  
C5  
C6  
C2  
Z1  
Z2  
Z3 Z4  
Z5  
Z6 Z7  
Z8  
C10  
C11 C12  
C15  
C13 C14  
C1  
DUT  
C3  
C4  
Z1  
Z2  
Z3  
Z4  
Z5  
Z6  
Z7  
Z8  
Z9  
Z10  
0.426x 0.080Microstrip  
0.813x 0.080Microstrip  
0.471x 0.080Microstrip  
0.319x 0.220Microstrip  
0.171x 0.220Microstrip  
0.200x 0.425x 0.630Taper  
0.742x 0.630Microstrip  
0.233x 0.630Microstrip  
0.128x 0.630Microstrip  
0.134x 0.630Microstrip  
Z11  
Z12  
Z13  
Z14  
Z15  
Z16  
Z17  
Z18  
Z19  
0.066x 0.630Microstrip  
0.630x 0.425x 0.220Taper  
0.120x 0.220Microstrip  
0.292x 0.220Microstrip  
0.023x 0.220Microstrip  
0.030x 0.220Microstrip  
0.846x 0.080Microstrip  
0.440x 0.080Microstrip  
0.434x 0.080Microstrip  
PCB Arlon GX-0300-55-22, 0.030, ε = 2.55  
r
Figure 1. MRF6S9160HR3(SR3) Test Circuit Schematic  
Table 5. MRF6S9160HR3(SR3) Test Circuit Component Designations and Values  
Part  
Description  
Ferrite Beads, Small  
Part Number  
2743019447  
Manufacturer  
Fair Rite  
B1, B2  
C1, C2, C19  
C3, C11  
C4  
47 pF Chip Capacitors  
100B470JP500X  
27291SL  
ATC  
0.8-8.0 pF Variable Capacitors, Gigatrim  
2.7 pF Chip Capacitor  
Johanson  
ATC  
100B2R7JP500X  
100B150JP500X  
100B120JP500X  
100B4R3JP500X  
100B8R2JP500X  
100B3R9JP500X  
27271SL  
C5, C6  
C7, C8  
C9, C10  
C12  
15 pF Chip Capacitors  
ATC  
12 pF Chip Capacitors  
ATC  
4.3 pF Chip Capacitors  
ATC  
8.2 pF Chip Capacitor  
ATC  
C13, C14  
C15  
3.9 pF Chip Capacitors  
ATC  
0.6-4.5 pF Variable Capacitor, Gigatrim  
22 pF Chip Capacitor  
Johanson  
ATC  
C16  
100B220JP500X  
T491C105K0J0AS  
CDR353P203AK0S  
100B181JP500X  
GRM55DR61H106KA88B  
KME63VB471M12x25LL  
0603HC  
C17  
1 μF, 50 V Tantalum Capacitor  
20K pF Chip Capacitor  
Kemit  
C18  
Kemit  
C20  
180 pF Chip Capacitor  
ATC  
C21, C22, C23  
10 μF, 50 V Chip Capacitors (2220)  
470 μF, 63 V Electrolytic Capacitor  
10 nH Inductors  
Murata  
United Chemi-Con  
Coilcraft  
C24  
L1, L2  
R1  
180 Ω Chip Resistor  
R2  
10 Ω Chip Resistor  
MRF6S9160HR3 MRF6S9160HSR3  
RF Device Data  
Freescale Semiconductor  
4
C24  
C16  
B1  
B2  
900 MHz  
Rev. 2  
C18  
C19  
C22 C23  
C21  
C20  
R2  
C17  
R1  
L1  
L2  
C7 C9  
C5  
C6  
C14  
C1  
C2  
C15  
C13  
C4  
C3  
C12  
C11  
C8  
C10  
Figure 2. MRF6S9160HR3(SR3) Test Circuit Component Layout  
MRF6S9160HR3 MRF6S9160HSR3  
RF Device Data  
Freescale Semiconductor  
5
TYPICAL CHARACTERISTICS  
20.9  
32  
30  
28  
26  
24  
η
D
20.6  
20.3  
20  
G
ps  
19.7  
19.4  
19.1  
18.8  
18.5  
18.2  
17.9  
V
= 28 Vdc, P = 35 W (Avg.)  
out  
= 1200 mA, N−CDMA IS−95 (Pilot, Sync,  
DD  
I
DQ  
−40  
−45  
−50  
−5  
Paging, Traffic Codes 8 Through 13)  
−8  
−11  
ACPR  
ALT1  
−55  
−60  
−65  
−14  
−17  
IRL  
−20  
840  
850  
860  
870  
880  
890  
900  
910  
920  
f, FREQUENCY (MHz)  
Figure 3. Single-Carrier N-CDMA Broadband Performance  
@ Pout = 35 Watts Avg.  
20.3  
44  
η
20  
19.7  
19.4  
19.1  
18.8  
18.5  
18.2  
17.9  
17.6  
17.3  
D
42  
40  
38  
36  
G
ps  
V
DD  
= 28 Vdc, P = 70 W (Avg.)  
out  
= 1200 mA, N−CDMA IS−95 (Pilot, Sync,  
I
DQ  
−30  
−36  
−42  
−48  
−3  
−6  
−9  
Paging, Traffic Codes 8 Through 13)  
ACPR  
IRL  
−12  
−15  
ALT1  
850  
−54  
−60  
−18  
840  
860  
870  
880  
890  
900  
910  
920  
f, FREQUENCY (MHz)  
Figure 4. Single-Carrier N-CDMA Broadband Performance  
@ Pout = 70 Watts Avg.  
23  
−10  
V
= 28 Vdc, f1 = 880 MHz, f2 = 880.1 MHz  
Two−Tone Measurements, 100 kHz Tone Spacing  
DD  
22  
21  
20  
19  
18  
17  
I
= 1800 mA  
−20  
−30  
−40  
−50  
1500 mA  
DQ  
I
= 600 mA  
1200 mA  
900 mA  
DQ  
900 mA  
1500 mA  
1800 mA  
600 mA  
1200 mA  
−60  
−70  
V
= 28 Vdc, f1 = 880 MHz, f2 = 880.1 MHz  
Two−Tone Measurements, 100 kHz Tone Spacing  
16  
15  
DD  
1
10  
100  
400  
1
10  
P , OUTPUT POWER (WATTS) PEP  
out  
100  
400  
P
out  
, OUTPUT POWER (WATTS) PEP  
Figure 5. Two-Tone Power Gain versus  
Output Power  
Figure 6. Third Order Intermodulation Distortion  
versus Output Power  
MRF6S9160HR3 MRF6S9160HSR3  
RF Device Data  
Freescale Semiconductor  
6
TYPICAL CHARACTERISTICS  
−10  
−20  
−30  
−40  
−50  
−60  
−70  
−80  
0
V
= 28 Vdc, I = 1200 mA  
DQ  
V
= 28 Vdc, P = 70 W (Avg.)  
out  
= 1200 mA, Two−Tone Measurements  
DD  
DD  
f1 = 880 MHz, f2 = 880.1 MHz  
Two−Tone Measurements  
I
DQ  
−10  
−20  
(f1 + f2)/2 = Center Frequency of 880 MHz  
−30 3rd Order  
3rd Order  
−40  
5th Order  
−50  
5th Order  
7th Order  
7th Order  
−60  
0.1  
1
10  
100  
400  
1
10  
100  
P , OUTPUT POWER (WATTS) PEP  
out  
TWO−TONE SPACING (MHz)  
Figure 7. Intermodulation Distortion Products  
versus Output Power  
Figure 8. Intermodulation Distortion Products  
versus Tone Spacing  
Ideal  
61  
59  
P6dB = 54.7 dBm (294.78 W)  
P3dB = 53.98 dBm (249.98 W)  
P1dB = 53.02 dBm (200.36 W)  
57  
55  
53  
51  
49  
47  
Actual  
V
DD  
= 28 Vdc, I = 1200 mA  
DQ  
Pulsed CW, 8 μsec(on), 1 msec(off)  
f = 880 MHz  
26  
28  
30  
32  
34  
36  
38  
40  
P , INPUT POWER (dBm)  
in  
Figure 9. Pulse CW Output Power versus  
Input Power  
60  
−20  
V
= 28 Vdc, I = 1200 mA  
DQ  
T = −30_C  
DD  
C
25_C  
f = 880 MHz, N−CDMA IS−95  
(Pilot, Sync, Paging, Traffic Codes  
8 Through 13)  
50  
40  
30  
20  
−30  
−40  
−50  
−60  
85_C  
25_C  
−30_C  
85_C  
ACPR  
−30_C  
G
ps  
η
D
85_C  
10  
0
−70  
−80  
25_C  
ALT1  
1
10  
, OUTPUT POWER (WATTS) AVG.  
100  
300  
P
out  
Figure 10. Single-Carrier N-CDMA ACPR, ALT1, Power Gain  
and Drain Efficiency versus Output Power  
MRF6S9160HR3 MRF6S9160HSR3  
RF Device Data  
Freescale Semiconductor  
7
TYPICAL CHARACTERISTICS  
23  
70  
60  
−30_C  
85_C  
22  
21  
20  
19  
18  
G
ps  
T = −30_C  
C
50  
40  
30  
20  
10  
0
25_C  
85_C  
η
D
V
DD  
= 28 Vdc  
= 1200 mA  
17  
16  
I
DQ  
f = 880 MHz  
1
10  
, OUTPUT POWER (WATTS) CW  
100  
300  
P
out  
Figure 11. Power Gain and Drain Efficiency  
versus CW Output Power  
21  
20  
19  
18  
17  
16  
32 V  
28 V  
20 V  
24 V  
16 V  
= 12 V  
I = 1200 mA  
DQ  
f = 880 MHz  
V
DD  
0
50  
100  
150  
200  
250  
300  
P , OUTPUT POWER (WATTS) CW  
out  
Figure 12. Power Gain versus Output Power  
10  
10  
9
10  
8
10  
10  
7
90 100 110 120 130 140 150 160 170 180 190 200 210  
T , JUNCTION TEMPERATURE (°C)  
J
2
This above graph displays calculated MTTF in hours x ampere  
drain current. Life tests at elevated temperatures have correlated to  
better than 10% of the theoretical prediction for metal failure. Divide  
2
MTTF factor by I for MTTF in a particular application.  
D
Figure 13. MTTF Factor versus Junction Temperature  
MRF6S9160HR3 MRF6S9160HSR3  
RF Device Data  
Freescale Semiconductor  
8
N-CDMA TEST SIGNAL  
100  
10  
−10  
−20  
−30  
1.2288 MHz  
Channel BW  
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..  
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1
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−40  
−50  
−60  
−70  
−80  
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.
.
−ALT1 in 30 kHz  
Integrated BW  
+ALT1 in 30 kHz  
Integrated BW  
.
.
.
0.1  
0.01  
.
.
.
..  
IS−95 CDMA (Pilot, Sync, Paging, Traffic Codes 8  
Through 13) 1.2288 MHz Channel Bandwidth  
Carriers. ACPR Measured in 30 kHz Bandwidth @  
750 kHz Offset. ALT1 Measured in 30 kHz  
Bandwidth @ 1.98 MHz Offset. PAR = 9.8 dB @  
0.01% Probability on CCDF.  
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0.001  
..  
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−ACPR in 30 kHz  
Integrated BW  
+ACPR in 30 kHz  
Integrated BW  
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.....  
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−90 .  
.
0.0001  
0
2
4
6
8
10  
−100  
PEAK−TO−AVERAGE (dB)  
−110  
Figure 14. Single-Carrier CCDF N-CDMA  
−3.6 −2.9 −2.2 −1.5 −0.7  
0
0.7 1.5  
2.2 2.9 3.6  
f, FREQUENCY (MHz)  
Figure 15. Single-Carrier N-CDMA Spectrum  
MRF6S9160HR3 MRF6S9160HSR3  
RF Device Data  
Freescale Semiconductor  
9
f = 910 MHz  
f = 850 MHz  
Z
load  
Z = 2 Ω  
o
f = 910 MHz  
Z
source  
f = 850 MHz  
V
DD  
= 28 Vdc, I = 1200 mA, P = 35 W Avg.  
DQ out  
f
Z
Z
load  
source  
MHz  
Ω
Ω
850  
865  
880  
895  
910  
0.61 - j1.27  
0.66 - j1.15  
0.64 - j1.05  
0.55 - j0.90  
0.48 - j0.74  
1.20 + j0.03  
1.26 + j0.15  
1.31 + j0.22  
1.32 + j0.28  
1.26 + j0.32  
Z
Z
=
=
Test circuit impedance as measured from  
gate to ground.  
source  
Test circuit impedance as measured  
from drain to ground.  
load  
Output  
Matching  
Network  
Device  
Under  
Test  
Input  
Matching  
Network  
Z
Z
source  
load  
Figure 16. Series Equivalent Source and Load Impedance  
MRF6S9160HR3 MRF6S9160HSR3  
10  
RF Device Data  
Freescale Semiconductor  
PACKAGE DIMENSIONS  
B
G
2X  
Q
1
M
M
M
B
bbb  
T A  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M−1994.  
3
2. CONTROLLING DIMENSION: INCH.  
3. DELETED  
4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY  
FROM PACKAGE BODY.  
K
B
2
(FLANGE)  
D
INCHES  
DIM MIN MAX  
MILLIMETERS  
M
M
M
bbb  
T A  
B
MIN  
33.91  
9.65  
MAX  
34.16  
9.91  
A
B
1.335  
0.380  
0.125  
0.495  
0.035  
0.003  
1.345  
0.390  
0.170  
0.505  
0.045  
0.006  
C
3.18  
4.32  
(LID)  
R
(INSULATOR)  
M
N
D
12.57  
0.89  
0.08  
12.83  
1.14  
0.15  
E
M
M
M
M
M
M
M
bbb  
T A  
B
ccc  
T A  
T A  
B
F
G
1.100 BSC  
27.94 BSC  
(INSULATOR)  
S
(LID)  
H
0.057  
0.170  
0.774  
0.772  
.118  
0.067  
0.210  
0.786  
0.788  
.138  
1.45  
4.32  
1.70  
5.33  
K
M
M
M
M
M
B
aaa  
B
ccc  
T A  
M
19.66  
19.60  
3.00  
19.96  
20.00  
3.51  
H
N
Q
R
0.365  
0.365  
0.375  
0.375  
9.27  
9.27  
9.53  
9.52  
C
S
aaa  
bbb  
ccc  
0.005 REF  
0.010 REF  
0.015 REF  
0.127 REF  
0.254 REF  
0.381 REF  
F
SEATING  
PLANE  
E
A
T
STYLE 1:  
A
CASE 465-06  
ISSUE G  
PIN 1. DRAIN  
2. GATE  
3. SOURCE  
(FLANGE)  
NI-780  
MRF6S9160HR3  
4X U  
(FLANGE)  
4X Z  
(LID)  
B
1
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M−1994.  
2. CONTROLLING DIMENSION: INCH.  
3. DELETED  
4. DIMENSION H IS MEASURED 0.030 (0.762) AWAY  
FROM PACKAGE BODY.  
2X K  
2
B
(FLANGE)  
D
INCHES  
DIM MIN MAX  
MILLIMETERS  
M
M
M
bbb  
T A  
B
MIN  
20.45  
9.65  
3.18  
12.57  
0.89  
0.08  
1.45  
4.32  
19.61  
19.61  
9.27  
9.27  
−−−  
MAX  
20.70  
9.91  
4.32  
12.83  
1.14  
0.15  
1.70  
5.33  
20.02  
20.02  
9.53  
9.52  
1.02  
0.76  
A
B
0.805  
0.380  
0.125  
0.495  
0.035  
0.003  
0.057  
0.170  
0.774  
0.772  
0.365  
0.365  
−−−  
0.815  
0.390  
0.170  
0.505  
0.045  
0.006  
0.067  
0.210  
0.786  
0.788  
0.375  
0.375  
0.040  
0.030  
(LID)  
C
N
(LID)  
R
D
M
M
M
ccc  
T A  
B
M
M
M
M
E
ccc  
T A  
T A  
B
F
(INSULATOR)  
S
H
(INSULATOR)  
M
K
M
M
M
M
M
aaa  
B
bbb  
T A  
B
M
N
H
R
S
C
U
3
Z
−−−  
−−−  
F
aaa  
bbb  
ccc  
0.005 REF  
0.010 REF  
0.015 REF  
0.127 REF  
0.254 REF  
0.381 REF  
SEATING  
PLANE  
E
A
T
CASE 465A-06  
ISSUE H  
A
STYLE 1:  
(FLANGE)  
PIN 1. DRAIN  
2. GATE  
5. SOURCE  
NI-780S  
MRF6S9160HSR3  
MRF6S9160HR3 MRF6S9160HSR3  
RF Device Data  
Freescale Semiconductor  
11  
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Document Number: MRF6S9160H  
Rev. 1, 5/2006  

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