IAUC120N06S5L032 [INFINEON]

The new OptiMOS™ 5 technology for 60V MOSFET in the industry standard SSO8 (5x6mm2) small footprint package with leading performance providing low RDSon, QG and Gate capacitance and minimizing conduction and switching losses.;
IAUC120N06S5L032
型号: IAUC120N06S5L032
厂家: Infineon    Infineon
描述:

The new OptiMOS™ 5 technology for 60V MOSFET in the industry standard SSO8 (5x6mm2) small footprint package with leading performance providing low RDSon, QG and Gate capacitance and minimizing conduction and switching losses.

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IAUC120N06S5L032  
OptiMOS-5 Power Transistor  
Product Summary  
VDS  
60  
3.2  
120  
V
RDS(on),max  
ID  
mW  
A
Features  
• OptiMOS™ power MOSFET for automotive applications  
• N-channel - Enhancement mode - Logic level  
• MSL1 up to 260°C peak reflow  
• 175 °C operating temperature  
• Green product (RoHS compliant)  
• 100% Avalanche tested  
PG-TDSON-8-34  
Type  
Package  
Marking  
IAUC120N06S5L032  
PG-TDSON-8-34 5N06L032  
Maximum ratings, at T j=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol  
Conditions  
Unit  
VGS=10 V, Chip  
limitation1,2)  
I D  
Drain current  
129  
A
VGS=10V, DC  
current3)  
T a=85 °C, VGS=10 V,  
R thJA on 2s2p2,4)  
120  
21  
Pulsed drain current2)  
I D,pulse  
EAS  
T C=25 °C, t p= 100 µs  
364  
92  
Avalanche energy, single pulse2)  
Avalanche current, single pulse  
Gate source voltage  
I D=60 A  
mJ  
A
I AS  
-
100  
VGS  
-
±16  
V
Ptot  
T C=25 °C  
Power dissipation  
94  
W
°C  
T j, T stg  
Operating and storage temperature  
-
-55 ... +175  
Rev. 1.0  
page 1  
2020-05-05  
IAUC120N06S5L032  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Thermal characteristics2)  
R thJC  
Thermal resistance, junction - case  
-
-
-
-
-
1.6  
-
K/W  
Thermal resistance, junction -  
ambient4)  
R thJA  
24.2  
Electrical characteristics, at T j=25 °C, unless otherwise specified  
Static characteristics  
V(BR)DSS VGS=0V, I D=1mA  
VGS(th) VDS=VGS, I D=44µA  
Drain-source breakdown voltage  
Gate threshold voltage  
60  
-
-
V
1.2  
1.7  
2.2  
VDS=60V, VGS=0V,  
T j=25°C  
I DSS  
Zero gate voltage drain current  
-
-
-
-
1
µA  
VDS=60V, VGS=0V,  
T j=125°C1)  
100  
I GSS  
VGS=16V, VDS=0V  
Gate-source leakage current  
-
-
-
-
-
100 nA  
R DS(on) VGS=4.5V, I D=60A  
VGS=10V, I D=60A  
Drain-source on-state resistance  
3.6  
2.5  
1.2  
4.4  
3.2  
-
mW  
Gate resistance2)  
R G  
-
W
Rev. 1.0  
page 2  
2020-05-05  
IAUC120N06S5L032  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Dynamic characteristics2)  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Turn-off delay time  
Rise time  
C iss  
C oss  
Crss  
t d(on)  
t d(off)  
t r  
-
-
-
-
-
-
-
2941  
557  
24  
3823 pF  
725  
VGS=0V, VDS=30V,  
f =1MHz  
36  
3.6  
-
-
-
-
ns  
20.0  
1.0  
VDD=30V, VGS=10V,  
I D=60A, R G,ext=3.5W  
t f  
Fall time  
8.0  
Gate Charge Characteristics2)  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q gs  
-
-
-
-
9.5  
6.1  
12.4 nC  
9.2  
Q gd  
VDD=30V, I D=60A,  
VGS=0 to 10V  
Q g  
39.6  
3.2  
51.5  
Vplateau  
Gate plateau voltage  
-
V
A
Reverse Diode  
Diode continous forward current2)  
Diode pulse current2)  
I S  
T C=25°C  
-
-
-
-
120  
364  
I S,pulse  
T C=25 °C, t p= 100 µs  
VGS=0V, I F=60A,  
T j=25°C  
VSD  
Diode forward voltage  
-
0.8  
1.1  
V
Reverse recovery time2)  
t rr  
-
-
40  
38  
-
-
ns  
VR=30V, I F=50A,  
diF/dt =100A/µs  
Reverse recovery charge2)  
Q rr  
nC  
1) Practically the current is limited by the overall system design including the customer-specific PCB.  
2) The parameter is not subject to production test - verified by design/characterization.  
3) The product can operate at a specified current based on best practice to minimze electromigration at the solder  
joint. For rare events and inrush currents, the value may be exceeded.  
4) Device on a four-layer 2s2p FR4 PCB defined in accordance with JEDEC standards (JESD51-5-7). PCB is vertical  
in still air.  
Rev. 1.0  
page 3  
2020-05-05  
IAUC120N06S5L032  
1 Power dissipation  
2 Drain current  
Ptot = f(T C); VGS = 10 V  
I D = f(T C); VGS = 10 V  
100  
80  
60  
40  
20  
0
140  
120  
100  
80  
60  
40  
20  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
TC [°C]  
TC [°C]  
3 Safe operating area  
4 Max. transient thermal impedance  
Z thJC = f(t p)  
I D = f(VDS); T C = 25 °C; D = 0  
parameter: t p  
parameter: D =t p/T  
101  
1000  
100  
10  
1 µs  
100  
10 µs  
0.5  
100 µs  
150 µs  
0.1  
10-1  
0.05  
0.01  
single pulse  
10-2  
10-3  
1
0.1  
1
10  
100  
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
VDS [V]  
tp [s]  
Rev. 1.0  
page 4  
2020-05-05  
IAUC120N06S5L032  
5 Typ. output characteristics  
I D = f(VDS); T j = 25 °C  
parameter: VGS  
6 Typ. drain-source on-state resistance  
R DS(on) = f(I D); T j = 25 °C  
parameter: VGS  
6
5.5  
5
480  
440  
6 V  
5 V  
400  
10 V  
360  
320  
4 V  
4.5  
4
4.5 V  
280  
4.5 V  
240  
200  
3.5  
3
5 V  
4 V  
160  
6 V  
120  
80  
40  
0
10 V  
2.5  
2
0
1
2
3
4
5
6
0
40  
80  
120  
160  
200  
VDS [V]  
ID [A]  
7 Typ. transfer characteristics  
I D = f(VGS); VDS = 6V  
parameter: T j  
8 Typ. drain-source on-state resistance  
R DS(on) = f(T j);  
parameter: ID, VGS  
200  
180  
160  
140  
120  
100  
80  
7
-55 °C  
25 °C  
6
VGS=4.5V, ID=60A  
175 °C  
5
4
3
60  
VGS=10V, ID=60A  
40  
2
20  
0
1
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
-60  
-20  
20  
60  
100  
140  
180  
VGS [V]  
Tj [°C]  
Rev. 1.0  
page 5  
2020-05-05  
IAUC120N06S5L032  
9 Typ. gate threshold voltage  
VGS(th) = f(T j); VGS = VDS  
parameter: I D  
10 Typ. capacitances  
C = f(VDS); VGS = 0 V; f = 1 MHz  
104  
2.5  
Ciss  
2
440 µA  
103  
Coss  
1.5  
1
44 µA  
102  
Crss  
0.5  
0
101  
0
10  
20  
30  
40  
50  
60  
-60  
-20  
20  
60  
Tj [°C]  
100  
140  
180  
VDS [V]  
11 Typical forward diode characteristics  
12 Avalanche characteristics  
I AS= f(t AV  
IF = f(VSD)  
)
parameter: T j  
parameter: Tj(start)  
103  
1000  
102  
100  
25 °C  
100 °C  
150 °C  
25 °C  
175 °C  
101  
10  
100  
1
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
0.1  
1
10  
100  
1000  
VSD [V]  
tAV [µs]  
Rev. 1.0  
page 6  
2020-05-05  
IAUC120N06S5L032  
13 Avalanche energy  
EAS = f(T j)  
14 Drain-source breakdown voltage  
VBR(DSS) = f(T j); I D = 1 mA  
parameter: I D  
66  
200  
175  
64  
62  
60  
58  
56  
30 A  
150  
125  
100  
60 A  
75  
50  
100 A  
25  
0
-55  
-15  
25  
65  
105  
145  
25  
75  
125  
175  
Tj [°C]  
Tj [°C]  
15 Typ. gate charge  
16 Gate charge waveforms  
VGS = f(Q gate); I D = 60 A pulsed  
parameter: VDD  
10  
9
8
7
6
5
4
3
2
1
0
V GS  
12 V  
Qg  
30 V  
48V  
V gs(th)  
Qg(th)  
Qsw  
Qgd  
Qgate  
Qgs  
0
5
10  
15  
20  
25  
30  
35  
40  
Qgate [nC]  
Rev. 1.0  
page 7  
2020-05-05  
IAUC120N06S5L032  
Package Outline  
Footprint  
Packaging  
Rev. 1.0  
page 8  
2020-05-05  
IAUC120N06S5L032  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© Infineon Technologies AG 2020  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of conditions  
or characteristics. With respect to any examples or hints given herein, any typical values stated  
herein and/or any information regarding the application of the device, Infineon Technologies hereby  
disclaims any and all warranties and liabilities of any kind, including without limitation, warranties  
of non-infringement of intellectual property rights of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please contact  
the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances.  
For information on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with the  
express written approval of Infineon Technologies, if a failure of such components can reasonably be  
expected to cause the failure of that life-support device or system or to affect the safety or  
effectiveness of that device or system. Life support devices or systems are intended to be implanted  
in the human body or to support and/or maintain and sustain and/or protect human life.  
If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.  
Rev. 1.0  
page 9  
2020-05-05  
IAUC120N06S5L032  
Revision History  
Version  
Date  
Changes  
Final Data Sheet  
Revision 1.0  
05.05.2020  
Rev. 1.0  
page 10  
2020-05-05  

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