FDMD8260L [ONSEMI]

60 V 双 N 沟道 PowerTrench® MOSFET;
FDMD8260L
型号: FDMD8260L
厂家: ONSEMI    ONSEMI
描述:

60 V 双 N 沟道 PowerTrench® MOSFET

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June 2015  
FDMD8260L  
Dual N-Channel Power Trench® MOSFET  
60 V, 5.8 mΩ  
Features  
General Description  
Max rDS(on) = 5.8 mΩ at VGS = 10 V, ID = 15 A  
Max rDS(on) = 8.7 mΩ at VGS = 4.5 V, ID = 12 A  
Ideal for Flexible Layout in Primary Side of Bridge Topology  
100% UIL Tested  
This device includes two 60V N-Channel MOSFETs in a dual  
Power (3.3 mm X 5 mm) package. HS source and LS Drain  
internally connected for half/full bridge, low source inductance  
package, low rDS(on)/Qg FOM silicon.  
Applications  
Kelvin High Side MOSFET Drive Pin-out Capability  
Termination is Lead-free and RoHS Compliant  
Synchronous Buck : Primary Switch of Half / Full bridge  
Converter for Telecom  
Motor Bridge : Primary Switch of Half / Full bridge Converter  
for BLDC Motor  
MV POL : 48V Synchronous Buck Switch  
Pin 1  
1
2
3
4
5
6
12  
11  
10  
9
D1  
D1  
D1  
G2  
S2  
S2  
G1  
Pin 1  
G1R  
D2/S1  
D2/S1  
8
D2/S1  
D2/S1  
7
Power 3.3 x 5  
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted.  
Symbol  
VDS  
VGS  
Parameter  
Ratings  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current -Continuous  
-Continuous  
60  
±20  
V
V
TC = 25 °C  
TC = 100 °C  
TA = 25 °C  
(Note 5)  
(Note 5)  
(Note 1a)  
(Note 4)  
(Note 3)  
64  
40  
ID  
A
-Continuous  
15  
-Pulsed  
293  
EAS  
Single Pulse Avalanche Energy  
Power Dissipation  
Power Dissipation  
Power Dissipation  
181  
mJ  
W
TC = 25 °C  
TA = 25 °C  
TA = 25 °C  
37  
PD  
(Note 1a)  
(Note 1b)  
2.1  
1.0  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
-55 to +150  
°C  
Thermal Characteristics  
RθJC  
RθJA  
RθJA  
Thermal Resistance, Junction to Case  
3.4  
60  
Thermal Resistance, Junction to Ambient  
Thermal Resistance, Junction to Ambient  
(Note 1a)  
(Note 1b)  
°C/W  
130  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
13 ’’  
Tape Width  
12 mm  
Quantity  
8260L  
FDMD8260L  
Power 3.3 x 5  
3000 units  
1
©2015 Fairchild Semiconductor Corporation  
FDMD8260L Rev.1.0  
www.fairchildsemi.com  
Electrical Characteristics TJ = 25 °C unless otherwise noted.  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Units  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = 250 μA, VGS = 0 V  
60  
V
ΔBVDSS  
ΔTJ  
Breakdown Voltage Temperature  
Coefficient  
I
D = 250 μA, referenced to 25 °C  
33  
mV/°C  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
VDS = 48 V, VGS = 0 V  
VGS = ±20 V, VDS = 0 V  
1
μA  
±100  
nA  
On Characteristics  
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = 250 μA  
1.0  
1.5  
-6  
3.0  
V
ΔVGS(th)  
ΔTJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
I
D = 250 μA, referenced to 25 °C  
mV/°C  
V
GS = 10 V, ID = 15 A  
4.5  
6.6  
5.9  
56  
5.8  
8.7  
7.8  
rDS(on)  
gFS  
Static Drain to Source On Resistance  
Forward Transconductance  
VGS = 4.5 V, ID = 12 A  
mΩ  
VGS = 10 V, ID = 15 A, TJ = 125 °C  
VDD = 5 V, ID = 15 A  
S
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
3745  
558  
22  
5245  
785  
50  
pF  
pF  
pF  
Ω
VDS = 30 V, VGS = 0 V  
f = 1 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
0.1  
3.0  
6.0  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
12  
10  
47  
11  
21  
20  
74  
20  
68  
35  
ns  
ns  
VDD = 30 V, ID = 15 A  
V
GS = 10 V, RGEN = 6 Ω  
Turn-Off Delay Time  
Fall Time  
ns  
ns  
Total Gate Charge  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain “Miller” Charge  
VGS = 0 V to 10 V  
VGS = 0 V to 5 V  
49  
25  
8.6  
5.2  
nC  
nC  
nC  
nC  
Qg(TOT)  
VDD = 30 V  
D = 15 A  
I
Qgs  
Qgd  
Drain-Source Diode Characteristics  
V
GS = 0 V, IS = 15 A  
(Note 2)  
(Note 2)  
0.8  
0.7  
36  
1.3  
1.2  
58  
V
VSD  
Source to Drain Diode Forward Voltage  
VGS = 0 V, IS = 1.6 A  
trr  
Reverse Recovery Time  
ns  
IF = 15 A, di/dt = 100 A/μs  
Qrr  
Reverse Recovery Charge  
17  
30  
nC  
NOTES:  
2
1. R  
is determined with the device mounted on a 1 in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R  
is determined by  
θJA  
θJC  
θCA  
the user's board design.  
b. 130 °C/W when mounted on  
a minimum pad of 2 oz copper  
a. 60 °C/W when mounted on  
a 1 in padof 2oz copper  
2
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %.  
o
3. E of 181 mJ is based on starting T = 25 C, L = 3 mH, I = 11 A, V = 60 V, V = 10 V. 100% tested at L = 0.1 mH, I = 36 A.  
AS  
J
AS  
DD  
GS  
AS  
4. Pulsed Id please refer to Fig 11 SOA graph for more details.  
5. Computed continuous current limited to Max Junction Temperature only, actual continuous current will be limited by thermal & electro-mechanical application board design.  
2
www.fairchildsemi.com  
©2015 Fairchild Semiconductor Corporation  
FDMD8260L Rev.1.0  
Typical Characteristics TJ = 25 °C unless otherwise noted.  
200  
6.0  
4.5  
3.0  
1.5  
0.0  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 10 V  
150  
VGS = 6 V  
VGS = 4 V  
VGS = 3.5 V  
VGS = 4.5 V  
100  
VGS = 4 V  
50  
VGS = 3.5 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 10 V  
VGS = 6 V  
VGS = 4.5 V  
0
0
1
2
3
4
5
0
40  
80  
120  
160  
200  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
ID, DRAIN CURRENT (A)  
Figure 1. On-Region Characteristics  
Figure2. NormalizedOn-Resistance  
vs. Drain Current and Gate Voltage  
1.8  
30  
PULSE DURATION = 80 μs  
ID = 15 A  
DUTY CYCLE = 0.5% MAX  
VGS = 10 V  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
24  
18  
12  
6
ID = 15 A  
TJ = 125 o  
C
TJ = 25 o  
C
4
0
-75 -50 -25  
0
25 50 75 100 125 150  
2
3
5
6
7
8
9
10  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure3. Normalized On Resistance  
vs. Junction Temperature  
Figure4. On Resistance vs. Gate to  
Source Voltage  
200  
200  
100  
10  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
150  
100  
50  
VGS = 0 V  
VDS = 5 V  
1
TJ = 150 o  
C
TJ = 150 o  
C
0.1  
TJ = 25 o  
C
TJ = 25 o  
C
0.01  
TJ = -55 o  
C
TJ = -55 o  
C
0
0.001  
1
2
3
4
5
6
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
VGS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs. Source Current  
3
www.fairchildsemi.com  
©2015 Fairchild Semiconductor Corporation  
FDMD8260L Rev.1.0  
Typical Characteristics TJ = 25 °C unless otherwise noted.  
10  
10000  
1000  
100  
10  
ID = 15 A  
Ciss  
8
VDD = 30 V  
Coss  
6
VDD = 20 V  
VDD = 40 V  
4
2
0
Crss  
f = 1 MHz  
GS = 0 V  
V
1
0.1  
0
10  
20  
30  
40  
50  
1
10  
60  
150  
1
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE (nC)  
Figure7. GateChargeCharacteristics  
Figure8. Capacitancevs.Drain  
to Source Voltage  
80  
60  
40  
20  
0
100  
TJ = 25 oC  
VGS = 10 V  
10  
VGS = 4.5 V  
TJ = 125 o  
C
RθJC = 3.4 oC/W  
1
0.001  
0.01  
0.1  
1
10  
100  
25  
50  
75  
100  
125  
TC, CASE TEMPERATURE (oC)  
tAV, TIME IN AVALANCHE (ms)  
Figure 9. Unclamped Inductive  
Switching Capability  
Figure10.MaximumContinuousDrain  
Current vs. Case Temperature  
500  
10000  
1000  
100  
SINGLE PULSE  
RθJC = 3.4 oC/W  
C = 25 oC  
100  
10  
T
10 μs  
100 μs  
THIS AREA IS  
1
LIMITED BY rDS(on)  
1 ms  
10 ms  
DC  
SINGLE PULSE  
TJ = MAX RATED  
0.1  
0.01  
RθJC = 3.4 oC/W  
CURVE BENT TO  
MEASURED DATA  
T
C = 25 oC  
10  
10-5  
10-4  
10-3  
t, PULSE WIDTH (sec)  
10-2  
10-1  
0.01  
0.1  
1
10  
100200  
VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure11. ForwardBiasSafe  
Operating Area  
Figure12. Single PulseMaximum  
Power Dissipation  
4
www.fairchildsemi.com  
©2015 Fairchild Semiconductor Corporation  
FDMD8260L Rev.1.0  
Typical Characteristics TJ = 25 °C unless otherwise noted.  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
P
0.1  
DM  
0.05  
0.1  
0.02  
0.01  
t
1
t
2
NOTES:  
(t) = r(t) x R  
SINGLE PULSE  
0.01  
Z
θJC  
θJC  
o
R
= 3.4 C/W  
θJC  
Peak T = P  
x Z (t) + T  
θJC C  
J
DM  
Duty Cycle, D = t / t  
1
2
0.001  
10-5  
10-4  
10-3  
t, RECTANGULAR PULSE DURATION (sec)  
10-2  
10-1  
1
Figure 13. Junction-to-Case Transient Thermal Response Curve  
5
www.fairchildsemi.com  
©2015 Fairchild Semiconductor Corporation  
FDMD8260L Rev.1.0  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized  
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This  
literature is subject to all applicable copyright laws and is not for resale in any manner.  
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