SMG2334NE_12 [SECOS]

3.5A , 30V , RDS(ON) 58 m N-Channel Enhancement MOSFET; 3.5A , 30V , RDS ( ON )58 M N沟道增强型MOSFET
SMG2334NE_12
型号: SMG2334NE_12
厂家: SECOS HALBLEITERTECHNOLOGIE GMBH    SECOS HALBLEITERTECHNOLOGIE GMBH
描述:

3.5A , 30V , RDS(ON) 58 m N-Channel Enhancement MOSFET
3.5A , 30V , RDS ( ON )58 M N沟道增强型MOSFET

文件: 总4页 (文件大小:297K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SMG2334NE  
3.5A , 30V , RDS(ON) 58 m  
N-Channel Enhancement MOSFET  
Elektronische Bauelemente  
RoHS Compliant Product  
A suffix of “-C” specifies halogen & lead-free  
SC-59  
DESCRIPTION  
These miniature surface mount MOSFETs utilize a high  
cell density trench process to provide low RDS(on) and to  
ensure minimal power loss and heat dissipation.  
A
L
3
3
Top View  
C B  
1
1
2
FEATURES  
2
K
F
E
Low RDS(on) provides higher efficiency and extends battery life.  
Low thermal impedance copper leadframe SC-59 saves board  
space.  
D
H
J
G
Fast switching speed.  
High performance trench technology.  
Millimeter  
Min. Max.  
Millimeter  
REF.  
REF.  
Min.  
0.10 REF.  
0.40 REF.  
Max.  
A
B
C
D
2.70  
2.25  
1.30  
1.00  
3.10  
3.00  
1.70  
1.40  
G
H
J
APPLICATION  
0.10  
0.45  
0.85  
0.20  
0.55  
1.15  
DC-DC converters and power management in  
portable and battery-powered products such as computers, printers,  
PCMCIA cards, cellular and cordless telephones.  
K
E
F
1.70  
0.35  
2.30  
0.50  
L
PACKAGE INFORMATION  
Package  
MPQ  
Leader Size  
SC-59  
3K  
7 inch  
ABSOLUTE MAXIMUM RATINGS (TA=25°C unless otherwise specified)  
Parameter  
Symbol  
VDS  
Rating  
30  
Unit  
V
Drain-Source Voltage  
Gate-Source Voltage  
VGS  
±12  
3.5  
V
TA=25°C  
TA=70°C  
Continuous Drain Current 1  
ID  
A
2.8  
Pulsed Drain Current 2  
IDM  
IS  
20  
A
A
Continuous Source Current (Diode Conduction) 1  
TA=25°C  
TA=70°C  
Operating Junction and Storage Temperature Range  
1.9  
1.3  
Power Dissipation 1  
PD  
W
0.8  
TJ, TSTG  
-55 ~ 150  
°C  
Thermal Resistance Rating  
t10 sec  
RθJA  
Steady-State  
100  
166  
Maximum Junction to Ambient 1  
°C / W  
Notes  
1. Surface Mounted on 1” x 1” FR4 Board.  
2. Pulse width limited by maximum junction temperature.  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
10-Jan-2011 Rev. B  
Page 1 of 4  
SMG2334NE  
3.5A , 30V , RDS(ON) 58 m  
N-Channel Enhancement MOSFET  
Elektronische Bauelemente  
ELECTRICAL CHARACTERISTICS (TA=25°C unless otherwise specified)  
Parameter  
Symbol  
Min. Typ. Max. Unit  
Static  
Teat Conditions  
Gate-Threshold Voltage  
Gate-Body Leakage  
VGS(th)  
IGSS  
1
-
-
-
±10  
1
V
VDS = VGS, ID = 250μA  
VDS =0, VGS= ±12V  
VDS =16V, VGS=0  
-
nA  
-
-
Zero Gate Voltage Drain Current  
On-State Drain Current 1  
IDSS  
ID(ON)  
μA  
A
-
-
25  
-
VDS =16V, VGS=0, TJ=55°C  
VDS =5V, VGS=4.5V  
VGS=4.5V, ID =2.8A  
VGS=2.5V, ID =2.4A  
VDS=10V,,ID =2.8A  
IS=1A, VGS=0  
7
-
-
-
58  
82  
-
Drain-Source On-Resistance 1  
RDS(ON)  
mΩ  
-
-
Forward Transconductance 1  
Diode Forward Voltage  
gFS  
-
10  
S
V
VSD  
-
0.69  
-
Dynamic 2  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
Turn-On Delay Time  
Rise Time  
Ciss  
Coss  
Crss  
Qg  
413  
VDS=15 V,  
VGS=0,  
f=1 MHz  
pF  
nC  
76  
67  
6
-
-
-
-
-
-
-
-
-
-
-
-
-
-
ID=2.8A  
V
V
DS=10V  
GS=4.5V  
Qgs  
0.9  
1.9  
8
Qgd  
Td(ON)  
Tr  
ID=2.8A,  
VDS=10V  
21  
49  
26  
nS  
VGEN=4.5V  
Turn-Off Delay Time  
Fall Time  
Td(OFF)  
Tf  
RL=3.6,  
GEN=6Ω  
R
Notes  
1. Pulse testPW300 us duty cycle2%.  
2. Guaranteed by design, not subject to production testing.  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
10-Jan-2011 Rev. B  
Page 2 of 4  
SMG2334NE  
3.5A , 30V , RDS(ON) 58 m  
N-Channel Enhancement MOSFET  
Elektronische Bauelemente  
CHARACTERISTIC CURVE  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
10-Jan-2011 Rev. B  
Page 3 of 4  
SMG2334NE  
3.5A , 30V , RDS(ON) 58 m  
N-Channel Enhancement MOSFET  
Elektronische Bauelemente  
CHARACTERISTIC CURVE  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
10-Jan-2011 Rev. B  
Page 4 of 4  

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