AOL1444_08 [AOS]

N-Channel Enhancement Mode Field Effect Transistor; N沟道增强型网络场效晶体管
AOL1444_08
型号: AOL1444_08
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

N-Channel Enhancement Mode Field Effect Transistor
N沟道增强型网络场效晶体管

晶体 晶体管
文件: 总6页 (文件大小:214K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
AOL1444  
N-Channel Enhancement Mode Field Effect Transistor  
General Description  
Features  
The AOL1444 uses advanced trench technology to  
provide excellent RDS(ON), shoot-through immunity and  
body diode characteristics. This device is ideally  
suited for use as a low side switch in CPU core power  
conversion.  
VDS (V) = 30V  
ID = 85A (VGS = 10V)  
RDS(ON) < 4.3m(VGS = 10V)  
RDS(ON) < 6.3m(VGS = 4.5V)  
UIS Tested  
Rg,Ciss,Coss,Crss Tested  
-RoHS Compliant  
-Halogen and Antimony Free Green Device*  
Ultra SO-8TM Top View  
D
D
Bottom tab  
connected to  
G
S
drain  
S
G
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
Maximum  
Units  
VDS  
Drain-Source Voltage  
30  
V
VGS  
Gate-Source Voltage  
Continuous Drain  
Current B,G  
±20  
85  
V
A
TC=25°C G  
TC=100°C B  
ID  
73  
IDM  
Pulsed Drain Current  
Continuous Drain  
Current G  
200  
17  
TA=25°C  
TA=70°C  
A
IDSM  
IAR  
14  
C
Avalanche Current  
30  
A
C
Repetitive avalanche energy L=0.1mH  
EAR  
45  
mJ  
TC=25°C  
100  
50  
PD  
W
B
Power Dissipation  
Power Dissipation  
TC=100°C  
TA=25°C  
TA=70°C  
2.1  
PDSM  
W
A
1.3  
TJ, TSTG  
Junction and Storage Temperature Range  
-55 to 175  
°C  
Thermal Characteristics  
Parameter  
Maximum Junction-to-Ambient  
Symbol  
Typ  
19.6  
48  
Max  
25  
60  
Units  
°C/W  
°C/W  
°C/W  
A
t 10s  
Steady-State  
Steady-State  
RθJA  
A
Maximum Junction-to-Ambient  
C
RθJC  
1
1.5  
Maximum Junction-to-Case  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1444  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
ID=250µA, VGS=0V  
BVDSS  
Drain-Source Breakdown Voltage  
30  
V
V
DS=24V, VGS=0V  
0.005  
1
IDSS  
Zero Gate Voltage Drain Current  
µA  
5
TJ=55°C  
V
DS=0V, VGS= ±20V  
IGSS  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
100  
3
nA  
V
VDS=VGS ID=250µA  
VGS(th)  
ID(ON)  
1.45  
200  
1.8  
VGS=10V, VDS=5V  
A
V
GS=10V, ID=20A  
3.2  
4.3  
4.9  
85  
4.3  
5.2  
6.3  
mΩ  
RDS(ON)  
Static Drain-Source On-Resistance  
TJ=125°C  
V
GS=4.5V, ID=20A  
mΩ  
S
VDS=5V, ID=20A  
IS=1A,VGS=0V  
gFS  
VSD  
IS  
Forward Transconductance  
Diode Forward Voltage  
0.7  
1
V
Maximum Body-Diode Continuous Current  
85  
A
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
6070 7000  
pF  
pF  
pF  
VGS=0V, VDS=15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
638  
375  
VGS=0V, VDS=0V, f=1MHz  
0.45  
0.6  
SWITCHING PARAMETERS  
Qg(10V) Total Gate Charge  
Qg(4.5V) Total Gate Charge  
96.4  
46.4  
13.6  
15.6  
15.7  
14.2  
55.5  
14  
115  
55  
nC  
nC  
nC  
nC  
ns  
VGS=4.5V, VDS=15V, ID=20A  
Qgs  
Qgd  
tD(on)  
tr  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
Turn-Off Fall Time  
21  
21  
75  
21  
38  
29  
V
GS=10V, VDS=15V, RL=0.75,  
ns  
RGEN=3Ω  
tD(off)  
tf  
ns  
ns  
trr  
IF=20A, dI/dt=100A/µs  
IF=20A, dI/dt=100A/µs  
31  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
ns  
Qrr  
24  
nC  
A: The value of RθJA is measured with the device in a still air environment with T A =25°C.  
B. The power dissipation PD is based on TJ(MAX)=175°C, using junction-to-case thermal resistance, and is more useful in setting the upper  
dissipation limit for cases where additional heatsinking is used.  
C: Repetitive rating, pulse width limited by junction temperature T J(MAX)=175°C.  
D. The RθJA is the sum of the thermal impedence from junction to case R θJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming  
a maximum junction temperature of TJ(MAX)=175°C.  
G. Surface mounted on a 1 in 2 FR-4 board with 2oz. Copper.  
H. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. The SOA  
curve provides a single pulse rating. Rev1. July 2008  
* This device is guaranteed green after date code 8P11 (June 1ST 2008)  
Revision 2: June 2008  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1444  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
60  
50  
40  
30  
20  
10  
0
60  
50  
40  
30  
20  
10  
0
VDS=5V  
10V  
4.5V  
3.5V  
125°C  
VGS=3V  
25°C  
0
1
2
3
4
5
1
1.5  
2
2.5  
VGS(Volts)  
3
3.5  
4
VDS (Volts)  
Figure 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
6.0  
5.5  
5.0  
4.5  
4.0  
3.5  
3.0  
2.5  
2.0  
1.8  
1.6  
1.4  
1.2  
1
VGS=4.5V  
ID=20A  
VGS=4.5V  
VGS=10V  
VGS=10V  
0.8  
0
20  
40  
60  
80  
100  
0
25  
50  
75  
100  
125  
150  
175  
ID (A)  
Temperature (°C)  
Figure 3: On-Resistance vs. Drain Current and  
Gate Voltage  
Figure 4: On-Resistance vs. Junction  
Temperature  
14  
12  
10  
8
1.0E+02  
1.0E+01  
1.0E+00  
1.0E-01  
1.0E-02  
ID=20A  
125°C  
125°C  
25°C  
6
1.0E-03  
25°C  
4
1.0E-04  
1.0E-05  
2
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
2
4
6
8
10  
VSD (Volts)  
V
GS (Volts)  
Figure 6: Body-Diode Characteristics  
Figure 5: On-Resistance vs. Gate-Source Voltage  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1444  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
8000  
10  
8
VDS=15V  
ID=20A  
Ciss  
7000  
6000  
5000  
4000  
3000  
2000  
1000  
0
6
4
Coss  
Crss  
2
0
0
20  
40  
60  
80  
100  
0
5
10  
15  
20  
25  
30  
Qg (nC)  
Figure 7: Gate-Charge Characteristics  
VDS (Volts)  
Figure 8: Capacitance Characteristics  
1000  
100  
10  
1000  
TJ(Max)=175°C  
TC=25°C  
10
µ
s  
800  
600  
400  
200  
0
100µs  
1ms  
10ms  
RDS(ON)  
limited  
DC  
TJ(Max)=175°C  
TC=25°C  
1
0.1  
0.1  
1
10  
100  
0.0001 0.001  
0.01  
Pulse Width (s)  
0.1  
1
10  
100  
V
DS (Volts)  
Figure 9: Maximum Forward Biased Safe  
Figure 10: Single Pulse Power Rating Junction-to-  
Case (Note F)  
Operating Area (Note F)  
10  
D=Ton/T  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
TJ,PK=TA+PDM.ZθJC.RθJC  
RθJC=1.5°C/W  
1
PD  
0.1  
Ton  
T
Single Pulse  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1444  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
120  
100  
80  
60  
40  
20  
0
100  
80  
60  
40  
20  
0
TA=25°C  
0.00001  
0.0001  
Time in avalanche, tA (s)  
Figure 12: Single Pulse Avalanche capability  
0.001  
0.01  
0
25  
50  
75  
TCASE (°C)  
Figure 13: Power De-rating (Note B)  
100  
125  
150  
175  
100  
80  
60  
40  
20  
0
100  
80  
60  
40  
20  
0
0
25  
50  
75  
100  
125  
150  
175  
0.01  
0.1  
1
10  
100  
1000  
T
CASE (°C)  
Pulse Width (s)  
Figure 14: Current De-rating (Note B)  
Figure 15: Single Pulse Power Rating Junction-to-  
Ambient (Note H)  
10  
1
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
0.1  
PD  
D=Ton/T  
TJ,PK=TA+PDM.ZθJA.RθJA  
0.01  
Ton  
T
Single Pulse  
0.0001  
RθJA=60°C/W  
0.001  
0.00001  
0.001  
0.01  
0.1  
Pulse Width (s)  
Figure 16: Normalized Maximum Transient Thermal Impedance (Note H)  
1
10  
100  
1000  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOL1444  
Gate Charge Test Circuit &Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Vds  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
t d(on)  
t
r
t d(off)  
t
f
t on  
toff  
Unclamped Inductive Switching (UIS) Test Circuit& Waveforms  
L
2
EAR=1/2LI  
AR  
BVDSS  
Vds  
Id  
Vds  
+
Vgs  
Vdd  
IAR  
Vgs  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode RecoveryTestCircuit &Waveforms  
Qrr =- Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
Isd  
trr  
L
IF  
Isd  
dI/dt  
+
IRM  
Vdd  
Vgs  
VDC  
Vdd  
-
Vds  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  

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