FDW254P_08 [FAIRCHILD]

P-Channel 1.8V Specified PowerTrench MOSFET; P沟道1.8V指定的PowerTrench MOSFET
FDW254P_08
型号: FDW254P_08
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

P-Channel 1.8V Specified PowerTrench MOSFET
P沟道1.8V指定的PowerTrench MOSFET

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中文:  中文翻译
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June 2008  
FDW254P  
P-Channel 1.8V Specified PowerTrench® MOSFET  
General Description  
Features  
This P-Channel 1.8V specified MOSFET is a rugged  
gate version of Fairchild Semiconductor’s advanced  
PowerTrench process. It has been optimized for power  
management applications with a wide range of gate  
drive voltage (1.8V – 8V).  
–9.2 A, –20 V.  
RDS(ON) = 12 m@ VGS = –4.5 V  
RDS(ON) = 15 m@ VGS = –2.5 V  
RDS(ON) = 21.5 m@ VGS = –1.8 V  
Rds ratings for use with 1.8 V logic  
Low gate charge  
Applications  
Load switch  
High performance trench technology for extremely  
low RDS(ON)  
Motor drive  
DC/DC conversion  
Power management  
Low profile TSSOP-8 package  
D
S
S
5
6
7
8
4
3
2
1
D
G
S
S
D
TSSOP-8  
Pin 1  
Absolute Maximum Ratings TA=25oC unless otherwise noted  
Symbol  
Parameter  
Ratings  
Units  
VDSS  
Drain-Source Voltage  
V
20  
8
VGSS  
ID  
Gate-Source Voltage  
Drain Current – Continuous  
– Pulsed  
V
A
(Note 1)  
9.2  
50  
PD  
Power Dissipation  
(Note 1a)  
(Note 1b)  
1.3  
W
0.6  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
°C  
55 to +150  
Thermal Characteristics  
Thermal Resistance, Junction-to-Ambient  
(Note 1a)  
(Note 1b)  
96  
RθJA  
°C/W  
208  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
Quantity  
254P  
FDW254P  
13’’  
12mm  
2500 units  
FDW254P Rev D1 (W)  
©2008 Fairchild Semiconductor Corporation  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Off Characteristics  
BVDSS  
Drain–Source Breakdown Voltage  
–20  
V
VGS = 0 V, ID = –250 µA  
BVDSS  
TJ  
Breakdown Voltage Temperature  
Coefficient  
Zero Gate Voltage Drain Current  
Gate–Body Leakage, Forward  
Gate–Body Leakage, Reverse  
–11  
ID = –250 µA, Referenced to 25°C  
mV/°C  
IDSS  
VDS = –16 V, VGS = 0 V  
–1  
µA  
nA  
nA  
IGSSF  
IGSSR  
VGS = –8 V,  
VGS = 8 V  
VDS = 0 V  
VDS = 0 V  
–100  
100  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
–0.4  
–50  
–0.6  
2
–1.5  
V
VDS = VGS, ID = –250 µA  
VGS(th)  
TJ  
RDS(on)  
Gate Threshold Voltage  
Temperature Coefficient  
Static Drain–Source  
On–Resistance  
ID = –250 µA, Referenced to 25°C  
mV/°C  
mΩ  
VGS = –4.5 V,  
ID = –9.2 A  
ID = –7.9 A  
ID = –6.5 A  
9
12  
15  
21.5  
18  
V
V
V
GS = –2.5 V,  
GS = –1.8 V,  
11  
14  
12  
GS=–4.5 V, ID =–9.2 A, TJ=125°C  
ID(on)  
gFS  
On–State Drain Current  
VGS = –4.5 V,  
VDS = –5 V,  
VDS = –5 V  
ID = –9.2 A  
A
S
Forward Transconductance  
54  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
5878  
994  
pF  
pF  
pF  
VDS = –10 V,  
f = 1.0 MHz  
V GS = 0 V,  
Output Capacitance  
Reverse Transfer Capacitance  
559  
Switching Characteristics (Note 2)  
td(on)  
Tr  
Turn–On Delay Time  
Turn–On Rise Time  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
15  
15  
27  
27  
ns  
ns  
V
DD = –10 V,  
ID = –1 A,  
VGS = –4.5 V,  
RGEN = 6 Ω  
Td(off)  
tf  
210  
100  
60  
336  
160  
96  
ns  
ns  
Qg  
nC  
nC  
nC  
V
V
DS = –10 V,  
GS = –4.5 V  
ID = –9.2 A,  
Qgs  
Qgd  
7
13  
Drain–Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain–Source Diode Forward Current  
–1.2  
–1.2  
A
V
VSD  
Drain–Source Diode Forward  
Voltage  
VGS = 0 V, IS = –1.2 A (Note 2)  
–0.5  
Notes:  
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of  
the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.  
a) RθJA is 96°C/W (steady state) when mounted on a 1 inch² copper pad on FR-4.  
b) RθJA is 208°C/W (steady state) when mounted on a minimum copper pad on FR-4.  
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%  
FDW254P Rev. D1 (W)  
Typical Characteristics  
50  
2
1.8  
1.6  
1.4  
1.2  
1
VGS = -4.5V  
VGS = -1.5V  
-2.0V  
-3.0V  
40  
-1.5V  
-2.5V  
30  
-2.0V  
20  
10  
0
-2.5V  
-3.0V  
30  
-3.5V  
-4.5V  
0.8  
0
0.5  
1
1.5  
2
0
10  
20  
40  
50  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
-ID, DRAIN CURRENT (A)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
0.035  
1.5  
1.4  
1.3  
1.2  
1.1  
1
ID = -4.6A  
ID = -9.2A  
VGS = -4.5V  
0.03  
0.025  
0.02  
TA = 125oC  
0.015  
0.01  
0.9  
0.8  
0.7  
TA = 25oC  
0.005  
0
1
2
3
4
5
-50  
-25  
0
25  
50  
75  
100  
125  
150  
-VGS, GATE TO SOURCE VOLTAGE (V)  
TJ, JUNCTION TEMPERATURE (oC)  
Figure 3. On-Resistance Variation  
withTemperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
100  
50  
40  
30  
20  
10  
0
TA = -55oC  
VGS = 0V  
25oC  
125oC  
VDS = -5V  
10  
1
TA = 125oC  
25oC  
0.1  
-55oC  
0.01  
0.001  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
0.5  
1
1.5  
2
-VSD, BODY DIODE FORWARD VOLTAGE (V)  
-VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
FDW254P Rev. D1 (W)  
Typical Characteristics  
5
10000  
8000  
6000  
4000  
2000  
0
VDS = -6V  
f = 1 MHz  
VGS = 0 V  
ID = -9.2A  
-8V  
4
3
2
1
0
-10V  
CISS  
COSS  
CRSS  
0
10  
20  
30  
40  
50  
60  
70  
0
5
10  
15  
20  
Qg, GATE CHARGE (nC)  
-VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
100  
50  
40  
30  
20  
10  
0
FDW254P Rev D1 (W)  
SINGLE PULSE  
RθJA = 208°C/W  
A = 25°C  
©2008 Fairchild Semiconductor Corporation  
µ
100  
10ms  
100ms  
s
RDS(ON) LIMIT  
10  
T
1s  
10s  
1
DC  
VGS = -4.5V  
SINGLE PULSE  
RθJA = 208oC/W  
TA = 25oC  
0.1  
0.01  
0.01  
0.1  
1
10  
100  
0.01  
0.1  
1
10  
100  
1000  
-VDS, DRAIN-SOURCE VOLTAGE (V)  
t1, TIME (sec)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
RθJA(t) = r(t) + Rθ  
JA  
0.2  
RθJA = 208 °C/W  
0.1  
0.1  
0.05  
0.02  
P(pk)  
t1  
0.01  
0.01  
t2  
T
J - TA = P * RθJA(t)  
SINGLE PULSE  
Duty Cycle, D = t1 / t2  
0.001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100 1000  
t1, TIME (sec)  
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1b.  
Transient thermal response will change depending on the circuit board design.  
FDW254P Rev. D1 (W)  
TRADEMARKS  
The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidianries, and is  
not intended to be an exhaustive list of all such trademarks.  
®
Build it Now™  
CorePLUS™  
FPS™  
PDP SPM™  
The Power Franchise  
F-PFS™  
Power-SPM™  
®
®
CorePOWER™  
CROSSVOLT™  
CTL™  
FRFET  
PowerTrench  
TinyBoost™  
TinyBuck™  
SM  
Global Power Resource  
Green FPS™  
Programmable Active Droop™  
®
QFET  
Current Transfer Logic™  
Green FPS™ e-Series™  
GTO™  
QS™  
®
TinyLogic  
®
EcoSPARK  
Quiet Series™  
TINYOPTO™  
TinyPower™  
TinyPWM™  
TinyWire™  
EfficentMax™  
EZSWITCH™ *  
IntelliMAX™  
RapidConfigure™  
Saving our world, 1mW at a time™  
SmartMax™  
ISOPLANAR™  
MegaBuck™  
MICROCOUPLER™  
MicroFET™  
SMART START™  
®
SPM  
®
MicroPak™  
STEALTH™  
SuperFET™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SuperMOS™  
SyncFET™  
®
®
®
Fairchild  
MillerDrive™  
UHC  
®
Fairchild Semiconductor  
FACT Quiet Series™  
MotionMax™  
Motion-SPM™  
Ultra FRFET™  
UniFET™  
®
®
®
FACT  
OPTOLOGIC  
VCX™  
®
FAST  
OPTOPLANAR  
VisualMax™  
®
FastvCore™  
®
FlashWriter  
*
tm  
®
* EZSWITCH™ and FlashWriter are trademarks of System General Corporation, used under license by Fairchild Semiconductor.  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE  
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY  
PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.  
THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY  
THEREIN, WHICH COVERS THESE PRODUCTS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE  
EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or systems which, (a) are  
intended for surgical implant into the body or (b) support or sustain life,  
and (c) whose failure to perform when properly used in accordance with  
instructions for use provided in the labeling, can be reasonably  
expected to result in a significant injury of the user.  
2. A critical component in any component of a life support, device, or  
system whose failure to perform can be reasonably expected to cause  
the failure of the life support device or system, or to affect its safety or  
effectiveness.  
ANTI-COUNTERFEITING POLICY  
Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Farichild’s Anti-Counterfeiting Policy is also stated on our external website,  
www.fairchildsemi.com, under Sales Support.  
Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of their  
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application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the  
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committed to committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized  
distributors.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Datasheet contains the design specifications for product development. Specifications  
may change in any manner without notice.  
Advance Information  
Formative / In Design  
Datasheet contains preliminary data; supplementary data will be published at a later  
date. Fairchild Semiconductor reserves the right to make changes at any time without  
notice to improve design.  
Preliminary  
First Production  
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to  
make changes at any time without notice to improve the design.  
No Identification Needed  
Obsolete  
Full Production  
Datasheet contains specifications on a product that is discontinued by Fairchild  
Semiconductor. The datasheet is for reference information only.  
Not In Production  
Rev. I35  
FDW254P Rev. D1 (W)  

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