FDW256P-NL [FAIRCHILD]

Transistor;
FDW256P-NL
型号: FDW256P-NL
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Transistor

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中文:  中文翻译
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May 2001  
FDW256P  
30V P-Channel PowerTrenchÒ MOSFET  
General Description  
Features  
This P-Channel MOSFET is a rugged gate version of  
Fairchild Semiconductor’s advanced PowerTrench  
process. It has been optimized for power management  
applications requiring a wide range of gave drive  
voltage ratings (4.5V – 25V).  
· –8 A, –30 V RDS(ON) = 13.5 mW @ VGS = –10 V  
RDS(ON) = 20 mW @ VGS = –4.5 V  
· Extended VGSS range (±25V) for battery applications  
· High performance trench technology for extremely  
Applications  
low RDS(ON)  
· Battery protection  
· DC/DC conversion  
· Power management  
· Load switch  
· Low profile TSSOP-8 package  
5
6
7
8
4
3
2
1
TSSOP-8  
Pin 1  
Absolute Maximum Ratings TA=25oC unless otherwise noted  
Symbol  
Parameter  
Ratings  
Units  
VDSS  
Drain-Source Voltage  
–30  
V
VGSS  
ID  
Gate-Source Voltage  
± 25  
V
A
Drain Current – Continuous  
(Note 1)  
–8  
– Pulsed  
Power Dissipation  
–50  
1.3  
PD  
(Note 1a)  
(Note 1b)  
W
0.6  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
–55 to +150  
°C  
Thermal Characteristics  
RqJA  
Thermal Resistance, Junction-to-Ambient  
(Note 1a)  
(Note 1b)  
96  
°C/W  
208  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
Quantity  
256P  
FDW256P  
13’’  
16mm  
3000 units  
Ó2001 Fairchild Semiconductor Corporation  
FDW256P Rev C(W)  
Electrical Characteristics  
TA= 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Off Characteristics  
BVDSS  
Drain–Source Breakdown Voltage VGS = 0 V, ID = –250 mA  
–30  
V
Breakdown Voltage Temperature  
Coefficient  
DBVDSS  
DTJ  
ID = –250 mA, Referenced to 25°C  
–23  
mV/°C  
IDSS  
Zero Gate Voltage Drain Current  
Gate–Body Leakage, Forward  
Gate–Body Leakage, Reverse  
VDS = –24 V, VGS = 0 V  
VGS = 25 V, VDS = 0 V  
VGS = –25 V, VDS = 0 V  
–1  
mA  
nA  
nA  
IGSSF  
IGSSR  
100  
–100  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
Gate Threshold Voltage  
Temperature Coefficient  
VDS = VGS  
,
ID = –250 mA  
–1  
–1.7  
5
–3  
V
DVGS(th)  
DTJ  
RDS(on)  
ID = –250 mA, Referenced to 25°C  
mV/°C  
mW  
Static Drain–Source  
On–Resistance  
VGS = –10 V, ID = –8.0 A  
VGS = –4.5 V, ID = –6.5 A  
VGS=–10 V, ID =–8.0A, TJ=125°C  
11  
16  
15  
13.5  
20  
19  
ID(on)  
gFS  
On–State Drain Current  
VGS = –10 V, VDS = –5 V  
–50  
A
S
Forward Transconductance  
VDS = –5 V,  
ID = –8.0 A  
30  
Dynamic Characteristics  
C
Input Capacitance  
2267  
599  
pF  
pF  
pF  
iss  
VDS = –15 V, V GS = 0 V,  
f = 1.0 MHz  
Coss  
Output Capacitance  
C
rss  
Reverse Transfer Capacitance  
315  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn–On Delay Time  
Turn–On Rise Time  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
VDD = –15 V, ID = –1 A,  
VGS = –10 V, RGEN = 6 W  
15  
11  
78  
45  
28  
7
27  
35  
ns  
ns  
125  
72  
ns  
ns  
Qg  
VDS = –15 V, ID = –8.0 A,  
VGS = –5.0V  
38  
nC  
nC  
nC  
Qgs  
Qgd  
12  
Drain–Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain–Source Diode Forward Current  
–1.2  
–1.2  
A
V
Drain–Source Diode Forward  
VSD  
VGS = 0 V, IS = –1.2 A (Note 2)  
–0.7  
Voltage  
Notes:  
1. RqJAis the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of  
the drain pins. RqJCis guaranteed by design while RqCAis determined by the user's board design.  
a) RqJAis 96 °C/W (steady state) when mounted on a 1 inch² copper pad on FR-4.  
b) RqJAis 208 °C/W (steady state) when mounted on a minimum copper pad on FR-4.  
2. Pulse Test: Pulse Width < 300ms, Duty Cycle < 2.0%  
FDW256P Rev C(W)  
Typical Characteristics  
50  
VGS = -10V  
-4.5V  
2.2  
2
-6.0V  
-4.0V  
-3.5V  
VGS = -3.5V  
40  
1.8  
1.6  
1.4  
1.2  
1
30  
20  
10  
0
-4.0V  
-3.0V  
-4.5V  
-5.0V  
-6.0V  
-10V  
0.8  
0
0.5  
1
1.5  
2
2.5  
3
0
10  
20  
30  
40  
50  
-VDS , DRAIN TO SOURCE VOLTAGE (V)  
-ID, DRAIN CURRENT (A)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
1.6  
1.4  
1.2  
1
0.05  
ID = -8A  
VGS = -10V  
ID = -4.0A  
0.04  
0.03  
0.02  
0.01  
0
TA = 125oC  
TA = 25oC  
0.8  
0.6  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
2
4
6
8
10  
TJ, JUNCTION TEMPERATURE (oC)  
-VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation with  
Temperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
50  
40  
30  
20  
10  
0
100  
VGS = 0V  
TA = -55oC  
VDS = -5.0V  
25oC  
125oC  
10  
1
TA = 125oC  
25oC  
0.1  
-55oC  
0.01  
0.001  
0.0001  
1
1.5  
2
2.5  
3
3.5  
4
0
0.2  
-VSD  
0.4  
0.6  
0.8  
1
1.2  
1.4  
-VGS, GATE TO SOURCE VOLTAGE (V)  
,
BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
FDW256P Rev C(W)  
Typical Characteristics  
4000  
3200  
2400  
1600  
800  
10  
VDS = -10V  
f = 1 MHz  
VGS = 0 V  
ID = -8A  
-15V  
8
-20V  
CISS  
6
4
2
0
COSS  
CRSS  
0
0
10  
20  
30  
40  
50  
0
5
10  
15  
20  
25  
30  
Qg, GATE CHARGE (nC)  
-VDS , DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
100  
10  
50  
40  
30  
20  
10  
0
1ms  
SINGLE PULSE  
Rq = 208°C/W  
RDS(ON) LIMIT  
10ms  
JA  
TA = 25°C  
100ms  
1s  
10s  
1
DC  
VGS = -10V  
SINGLE PULSE  
RqJA = 208oC/W  
TA = 25oC  
0.1  
0.01  
0.01  
0.1  
1
10  
100  
0.01  
0.1  
1
10  
100  
-V DS, DRAIN-SOURCE VOLTAGE (V)  
t1, TIME (sec)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
RqJA(t) = r(t) + RqJA  
RqJA = 208oC/W  
0.2  
0.1  
0.1  
0.05  
0.02  
P(pk)  
t1  
0.01  
t2  
0.01  
TJ - TA = P * RqJA(t)  
Duty Cycle, D = t1 / t2  
100 1000  
SINGLE PULSE  
0.001  
0.0001  
0.001  
0.01  
0.1  
1
10  
t1, TIME (sec)  
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1b.  
Transient thermal response will change depending on the circuit board design.  
FDW256P Rev C(W)  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
OPTOPLANAR™  
PACMAN™  
POP™  
PowerTrench  
QFET™  
QS™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
TinyLogic™  
UHC™  
FAST  
FASTr™  
FRFET™  
GlobalOptoisolator™  
GTO™  
ACEx™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
DenseTrench™  
DOME™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MICROWIRE™  
OPTOLOGIC™  
QT Optoelectronics™  
Quiet Series™  
SILENT SWITCHER  
SMART START™  
Stealth™  
UltraFET  
VCX™  
EcoSPARK™  
E2CMOSTM  
EnSignaTM  
FACT™  
FACT Quiet Series™  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOTASSUMEANY LIABILITYARISING OUT OF THEAPPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H2  

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