SSD25N10_15 [SECOS]

N-Ch Enhancement Elektronische Bauelemente Mode Power MOSFET;
SSD25N10_15
型号: SSD25N10_15
厂家: SECOS HALBLEITERTECHNOLOGIE GMBH    SECOS HALBLEITERTECHNOLOGIE GMBH
描述:

N-Ch Enhancement Elektronische Bauelemente Mode Power MOSFET

文件: 总4页 (文件大小:417K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SSD25N10  
25A , 100V , RDS(ON) 48m  
N-Ch Enhancement Mode Power MOSFET  
Elektronische Bauelemente  
RoHS Compliant Product  
A suffix of “-C” specifies halogen free  
TO-252(D-Pack)  
DESCRIPTION  
The SSD25N10 is the highest performance trench  
N-ch MOSFETs with extreme high cell density , which provide  
excellent RDS(on) and gate charge for most of the synchronous  
buck converter applications .  
A
B
FEATURES  
C
D
Advanced high cell density Trench technology  
Super Low Gate Charge  
Excellent CdV/dt effect decline  
100% EAS Guaranteed  
G E  
Green Device Available  
K
H F  
N
O
P
2
Drain  
M
J
MARKING  
Millimeter  
Millimeter  
REF.  
REF.  
Min.  
Max.  
Min.  
Max.  
25N10  
1
Gate  
A
B
C
D
E
F
6.35  
5.20  
2.15  
0.45  
6.8  
2.40  
5.40  
0.64  
6.80  
5.50  
2.40  
0.58  
7.5  
3.0  
6.25  
1.20  
J
K
M
N
O
P
2.30 REF.  
Date Code  
ꢀꢀꢀꢀ  
0.64  
0.50  
0.9  
0.90  
1.1  
1.65  
0.15  
0.58  
0
0.43  
PACKAGE INFORMATION  
G
H
3
Source  
Package  
MPQ  
Leader Size  
TO-252  
2.5K  
13 inch  
ABSOLUTE MAXIMUM RATINGS (TA=25°C unless otherwise specified)  
Parameter  
Symbol  
VDS  
Rating  
Unit  
V
Drain-Source Voltage  
Gate-Source Voltage  
100  
±20  
25  
VGS  
V
A
TC=25°C  
TC=70°C  
Continuous Drain Current @VGS=10V 1  
ID  
16  
A
Pulsed Drain Current 2  
IDM  
P D  
45  
A
Total Power Dissipation 4  
TC=25°C  
52  
W
mJ  
A
Single Pulse Avalanche Energy 3  
EAS  
26.6  
20  
Single Pulse Avalanche Current  
IAS  
Operating Junction and Storage Temperature Range  
TJ, TSTG  
-55~150  
°C  
Thermal Resistance Rating  
Maximum Thermal Resistance Junction-Ambient 1  
Maximum Thermal Resistance Junction-Case 1  
RθJA  
RθJC  
110  
2.4  
°C / W  
°C / W  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
24-Oct-2012 Rev. A  
Page 1 of 4  
SSD25N10  
25A , 100V , RDS(ON) 48m  
N-Ch Enhancement Mode Power MOSFET  
Elektronische Bauelemente  
ELECTRICAL CHARACTERISTICS (TJ=25°C unless otherwise specified)  
Parameter  
Symbol  
Min.  
Static  
Typ.  
Max.  
Unit  
Teat Conditions  
Drain-Source Breakdown Voltage  
Gate-Threshold Voltage  
BVDSS  
VGS(th)  
IGSS  
100  
-
1.7  
-
-
V
V
VGS=0, ID= 250µA  
1
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
2.5  
VDS=VGS, ID=250µA  
VGS= ±20V  
Gate-Source Leakage Current  
±100  
nA  
TJ=25°C  
TJ=55°C  
-
1
VDS=80V, VGS=0  
V DS=80V, VGS=0  
VGS=10V, ID=25A  
VGS=4.5V, ID=15A  
Drain-Source Leakage Current  
IDSS  
µA  
-
100  
43  
45  
60  
9.7  
11.8  
10.4  
46  
54  
10  
3848  
137  
82  
1.6  
48  
50  
-
Static Drain-Source On-Resistance 2  
RDS(ON)  
mΩ  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain (“Miller”) Change  
Turn-on Delay Time 2  
Rise Time  
Qg  
Qgs  
Qgd  
Td(on)  
Tr  
ID=20A  
VDS=80V  
VGS=10V  
-
nC  
nS  
-
-
VDD=50V  
ID=20A  
VGS=10V  
-
Turn-off Delay Time  
Fall Time  
Td(off)  
Tf  
-
RG=3.3 Ω  
-
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
Ciss  
Coss  
Crss  
Rg  
-
VGS =0  
VDS=15V  
f =1.0MHz  
-
pF  
-
-
f=1MHz  
Guaranteed Avalanche Characteristics  
Single Pulse Avalanche Energy 5  
EAS  
6
-
-
mJ  
VDD=25V, L=0.1mH, IAS=10A  
Source-Drain Diode  
Diode Forward Voltage 2  
Continuous Source Current 1,6  
Pulsed Source Current 2,6  
Reverse Recovery Time  
VSD  
IS  
-
-
-
-
-
-
-
1.2  
25  
45  
-
V
A
IS=1A, VGS=0, TJ=25°C  
VD=VG=0, Force Current  
ISM  
Trr  
-
A
30  
37  
nS  
nC  
IF=20A, dI/dt=100A/µs ,  
TJ=25°C  
Reverse Recovery Charge  
Notes:  
Qrr  
-
1. The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.  
2. The data tested by pulsed , pulse width 300µs , duty cycle 2%  
3. The EAS data shows Max. rating . The test condition is VDD=25V,VGS=10V,L=0.1mH,IAS=20A  
4. The power dissipation is limited by 150°C, junction temperature  
5. The Min. value is 100% EAS tested guarantee.  
6. The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation.  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
24-Oct-2012 Rev. A  
Page 2 of 4  
SSD25N10  
25A , 100V , RDS(ON) 48m  
N-Ch Enhancement Mode Power MOSFET  
Elektronische Bauelemente  
CHARACTERISTIC CURVES  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
24-Oct-2012 Rev. A  
Page 3 of 4  
SSD25N10  
25A , 100V , RDS(ON) 48m  
N-Ch Enhancement Mode Power MOSFET  
Elektronische Bauelemente  
CHARACTERISTIC CURVES  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
24-Oct-2012 Rev. A  
Page 4 of 4  

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