NXH450B100H4Q2F2SG [ONSEMI]

Si/SiC Hybrid Modules, 3 Channel Symmetric Boost 1000 V, 150 A IGBT, 1200 V, 30 A SiC Diode;
NXH450B100H4Q2F2SG
型号: NXH450B100H4Q2F2SG
厂家: ONSEMI    ONSEMI
描述:

Si/SiC Hybrid Modules, 3 Channel Symmetric Boost 1000 V, 150 A IGBT, 1200 V, 30 A SiC Diode

双极性晶体管
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中文:  中文翻译
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DATA SHEET  
www.onsemi.com  
Si/SiC Hybrid Module –  
EliteSiC, 3 Channel  
Symmetric Boost 1000 V,  
150 A IGBT, 1200 V, 30 A SiC  
Diode, Q2 Package  
NXH450B100H4Q2F2,  
NXH450B100H4Q2F2PG-R  
Q2BOOST 3CHANNEL PRESS FIT PINS  
CASE 180BG  
Description  
The NXH450B100H4Q2 is a Si/SiC Hybrid three channel  
symmetric boost module. Each channel contains two 1000 V, 150 A  
IGBTs, two 1200 V, 30 A SiC diodes and two 1600 V, 30 A bypass  
diodes. The module contains an NTC thermistor.  
Features  
Silicon/SiC Hybrid Technology Maximizes Power Density  
Low Switching Loss Reduces System Power Dissipation  
Low Inductive Layout  
Pressfit and Solder Pin Options  
Q2BOOST 3CHANNEL SOLDER PINS  
CASE 180BR  
This Device is PbFree, Halogen Free and is RoHS Compliant  
Typical Applications  
Solar Inverter  
Uninterruptible Power Supplies  
MARKING DIAGRAM  
NXH450B100H4Q2F2PG/PGR/SG  
ATYYWW  
G
= PbFree Package  
AT  
= Assembly & Test Site Code  
YYWW  
NXH450B100H4Q2F2PG/PGR/SG  
= Specific Device Code  
= Year and Work Week Code  
PIN CONNECTIONS  
See details pin connections on page 2 of this data sheet.  
ORDERING INFORMATION  
See detailed ordering and shipping information on page 5 of  
this data sheet.  
Figure 1. NXH450B100H4Q2F2PG/PGR/SG Schematic Diagram  
© Semiconductor Components Industries, LLC, 2019  
1
Publication Order Number:  
NXH450B100H4Q2F2/D  
March, 2023 Rev. 2  
NXH450B100H4Q2F2, NXH450B100H4Q2F2PGR  
Figure 2. Pins Assignments  
ABSOLUTE MAXIMUM RATINGS (Note 1) (T = 25°C unless otherwise noted)  
j
Rating  
Symbol  
Value  
Unit  
IGBT (Tx1, Tx2)  
CollectorEmitter Voltage  
1000  
V
V
V
CES  
GateEmitter Voltage  
20  
30  
V
GE  
Positive Transient GateEmitter Voltage (Tpulse = 5 μs, D < 0.10)  
Continuous Collector Current (@ V = 20 V, T = 80°C)  
I
C
101  
303  
234  
40  
150  
A
A
GE  
c
Pulsed Peak Collector Current @ Tc = 80°C (T = 150°C)  
I
J
C(Pulse)  
Power Dissipation (T = 80°C, T = 150°C)  
W
°C  
°C  
P
C
J
tot  
Minimum Operating Junction Temperature  
T
JMIN  
Maximum Operating Junction Temperature (Note 2)  
IGBT INVERSE DIODE (DX1, DX2) AND BYPASS DIODE (DX5, DX6)  
Peak Repetitive Reverse Voltage  
T
JMAX  
1600  
36  
V
A
A
V
I
RRM  
Continuous Forward Current @ T = 80°C  
I
F
C
Repetitive Peak Forward Current (T = 150°C, T limited by T )  
Jmax  
108  
J
J
FRM  
Maximum Power Dissipation @ T = 80°C (T = 150°C)  
79  
W
°C  
°C  
P
C
J
tot  
Minimum Operating Junction Temperature  
40  
150  
T
JMIN  
Maximum Operating Junction Temperature  
T
JMAX  
SILICON CARBIDE SCHOTTKY DIODE (DX3, DX4)  
Peak Repetitive Reverse Voltage  
1200  
36  
V
A
V
RRM  
Continuous Forward Current @ T = 80°C  
I
F
C
Repetitive Peak Forward Current (T = 150°C, T limited by T )  
Jmax  
108  
104  
40  
175  
A
I
J
J
FRM  
Maximum Power Dissipation @ T = 80°C (T = 150 °C)  
W
°C  
°C  
P
C
J
tot  
Minimum Operating Junction Temperature  
T
JMIN  
Maximum Operating Junction Temperature  
T
JMAX  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. Refer to ELECTRICAL CHARACTERISTICS, RECOMMENDED OPERATING RANGES and/or APPLICATION INFORMATION for Safe  
Operating parameters.  
2. Qualification at 175°C per discrete TO247.  
www.onsemi.com  
2
 
NXH450B100H4Q2F2, NXH450B100H4Q2F2PGR  
THERMAL AND INSULATION PROPERTIES (Note 3) (T = 25°C unless otherwise noted)  
j
Rating  
Symbol  
Value  
Unit  
THERMAL PROPERTIES  
Operating Temperature under Switching Condition  
Storage Temperature Range  
40 to (Tjmax – 25)  
40 to 125  
°C  
°C  
T
VJOP  
T
stg  
THERMAL PROPERTIES  
Isolation Test Voltage, t = 2 sec, 50 Hz (Note 4)  
4000  
12.7  
V
is  
V
RMS  
Creepage Distance  
Mm  
Comparative Tracking Index  
>600  
CTI  
3. Refer to ELECTRICAL CHARACTERISTICS, RECOMMENDED OPERATING RANGES and/or APPLICATION INFORMATION for Safe  
Operating parameters.  
4. 4000 VAC  
for 1 second duration is equivalent to 3333 VAC  
for 1 minute duration.  
RMS  
RMS  
www.onsemi.com  
3
 
NXH450B100H4Q2F2, NXH450B100H4Q2F2PGR  
ELECTRICAL CHARACTERISTICS (Note 5) (T = 25°C unless otherwise noted)  
J
Parameter  
Test Conditions  
Symbol  
Min  
Typ  
Max  
Unit  
IGBT (TX1, TX2)  
CollectorEmitter Breakdown Voltage  
CollectorEmitter Saturation Voltage  
V
= 0 V, I =2 mA  
V
(BR)CES  
1000  
V
V
GE  
C
V
= 15 V, I = 150 A,  
V
CESAT  
1.70  
2.25  
GE  
C
T
= 25°C  
C
V
C
= 15 V, I = 150 A,  
2.03  
4.66  
GE  
C
T
= 150°C  
GateEmitter Threshold Voltage  
V
GE  
= V , I = 150 mA  
V
4.1  
5.7  
V
CE  
C
GE(TH)  
CollectorEmitter Cutoff Current  
Gate Leakage Current  
V
V
= 0 V, V = 1000 V  
I
600  
800  
A  
nA  
ns  
GE  
CE  
CES  
=
20 V, V = 0 V  
I
GE  
CE  
GES  
T = 25°C  
TurnOn Delay Time  
j
28  
t
d(on)  
V
V
= 600 V, I = 50 A  
CE  
GE  
C
= 8 V, +15 V, R = 4 ꢁ  
G
Rise Time  
10  
157  
22  
t
r
TurnOff Delay Time  
Fall time  
t
d(off)  
t
f
Turn on Switching Loss  
Turn off Switching Loss  
TurnOn Delay Time  
Rise Time  
403  
1651  
27  
J
E
on  
off  
E
T = 125°C  
ns  
j
t
t
d(on)  
V
CE  
V
GE  
= 600 V, I = 50 A  
C
= 8 V, +15 V, R = 4 ꢁ  
G
12  
t
r
TurnOff Delay Time  
Fall time  
192  
32  
d(off)  
t
f
Turn on Switching Loss  
Turn off Switching Loss  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Charge  
594  
2138  
9342  
328  
52  
J
E
E
on  
off  
V
CE  
= 20 V, V = 0 V,  
pF  
GE  
C
ies  
oes  
f = 1 MHz  
C
C
res  
V
C
= 600 V, V = 15 V,  
252  
nC  
CE  
GE  
Q
g
I
= 75 A  
Thermal grease,  
Thickness = 2.1 Mil 2%  
= 2.9 W/mK  
R
R
0.45  
0.30  
K/W  
K/W  
Thermal Resistance Chipto−Heatsink  
Thermal Resistance Chipto−Case  
thJH  
thJC  
IGBT INVERSE DIODE (DX1, DX2) AND BYPASS DIODE (DX5, DX6)  
Diode Forward Voltage  
V
F
1.04  
0.94  
1.7  
V
I = 30 A, T = 25°C  
F
J
I = 30 A, T = 150°C  
F
J
Thermal grease,  
Thickness = 2.1 Mil 2%  
= 2.9 W/mK  
Thermal Resistance Chipto−Heatsink  
Thermal Resistance Chipto−Case  
R
1.09  
0.89  
K/W  
K/W  
thJH  
thJC  
R
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4
NXH450B100H4Q2F2, NXH450B100H4Q2F2PGR  
ELECTRICAL CHARACTERISTICS (Note 5) (T = 25°C unless otherwise noted) (continued)  
J
Parameter  
SIC DIODE (DX3, DX4)  
Test Conditions  
Symbol  
Min  
Typ  
Max  
Unit  
Diode Reverse Leakage Current  
Diode Forward Voltage  
V
= 1200 V, T = 25°C  
I
600  
1.7  
A
R
J
R
I = 30 A, T = 25°C  
F
V
1.42  
1.85  
V
J
F
I = 30 A, T = 150°C  
F
J
Reverse Recovery Time  
T = 25°C  
20  
88  
ns  
nC  
A
t
J
rr  
V
DS  
V
GE  
= 600 V, I = 50 A  
C
= 8 V, 15 V, R = 4 ꢁ  
Reverse Recovery Charge  
Q
rr  
RRM  
G
Peak Reverse Recovery Current  
Peak Rate of Fall of Recovery Current  
Reverse Recovery Energy  
10  
I
di/dt  
4200  
38  
A/s  
J  
E
t
rr  
Reverse Recovery Time  
T = 125°C  
19  
ns  
J
rr  
V
DS  
V
GE  
= 600 V, I = 50 A  
C
= 8 V, 15 V, R = 4 ꢁ  
Reverse Recovery Charge  
87  
nC  
A
Q
rr  
RRM  
G
Peak Reverse Recovery Current  
Peak Rate of Fall of Recovery Current  
Reverse Recovery Energy  
9
I
di/dt  
3154  
35  
A/s  
J  
E
rr  
Thermal grease,  
Thickness = 2.1 Mil 2%  
= 2.9 W/mK  
Thermal Resistance Chipto−Heatsink  
R
0.97  
0.67  
K/W  
K/W  
thJH  
Thermal Resistance Chipto−Case  
THERMISTOR CHARACTERISTICS  
Nominal Resistance  
Rt  
hJC  
22  
1486  
5
R
kꢁ  
25  
Nominal Resistance  
Deviation of R25  
Power Dissipation  
Power Dissipation Constant  
BValue  
T = 100°C  
R
100  
5  
%
R
/
R
P
200  
2
mW  
mW/K  
K
D
B (25/50), tolerance 3%  
B (25/100), tolerance 3%  
3950  
3998  
BValue  
K
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
5. Refer to ELECTRICAL CHARACTERISTICS, RECOMMENDED OPERATING RANGES and/or APPLICATION INFORMATION for Safe  
Operating parameters.  
PACKAGE MARKING AND ORDERING INFORMATION  
Orderable Part Number  
Marking  
Package  
Shipping  
NXH450B100H4Q2F2PG,  
NXH450B100H4Q2F2PGR  
PRESS FIT PINS  
NXH450B100H4Q2F2PG,  
NXH450B100H4Q2F2PGR  
Q2BOOST Case 180BG  
(PbFree and HalideFree Press Fit Pins)  
12 Units / Blister Tray  
NXH450B100H4Q2F2SG  
SOLDER PINS  
NXH450B100H4Q2F2SG  
Q2BOOST Case 180BR  
(PbFree and HalideFree Solder Pins)  
12 Units / Blister Tray  
www.onsemi.com  
5
 
NXH450B100H4Q2F2, NXH450B100H4Q2F2PGR  
TYPICAL CHARACTERISTICS IGBT, INVERSE DIODE AND BOOST DIODE  
V , Collector Emitter Voltage (V)  
CE  
V , Collector Emitter Voltage (V)  
CE  
Figure 3. Typical Output Characteristics  
Figure 4. Typical Output Characteristics  
V , GateEmitter Voltage (V)  
GE  
V , CollectorEmitter Voltage (V)  
CE  
Figure 5. Transfer Characteristics  
Figure 6. Typical Saturation Voltage  
Characteristics  
V , Forward Voltage (V)  
F
V , Forward Voltage (V)  
F
Figure 7. Inverse Diode Forward  
Characteristics  
Figure 8. Boost Diode Forward  
Characteristics  
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6
NXH450B100H4Q2F2, NXH450B100H4Q2F2PGR  
TYPICAL CHARACTERISTICS IGBT, INVERSE DIODE AND BOOST DIODE (CONTINUED)  
I
C
(A)  
R ()  
g
Figure 9. Typical Turn On Loss vs. IC  
Figure 10. Typical Turn Off Loss vs. IC  
R ()  
g
R ()  
g
Figure 11. Typical Turn On Loss vs. RG  
Figure 12. Typical Turn Off Loss vs. RG  
I
C
(A)  
R ()  
g
Figure 13. Typical Reverse Recovery  
Energy Loss vs. IC  
Figure 14. Typical Reverse Recovery  
Energy Loss vs. RG  
www.onsemi.com  
7
NXH450B100H4Q2F2, NXH450B100H4Q2F2PGR  
TYPICAL CHARACTERISTICS IGBT, INVERSE DIODE AND BOOST DIODE (CONTINUED)  
I , Collector Current (A)  
C
I , Collector Current (A)  
C
Figure 15. Typical TurnOn  
Figure 16. Typical TurnOff  
Switching Time vs. IC  
Switching Time vs. IC  
R , Gate Resistor ()  
g
R , Gate Resistor ()  
g
Figure 18. Typical TurnOff  
Switching Time vs. RG  
Figure 17. Typical TurnOn  
Switching Time vs. RG  
I , Collector Current (A)  
C
R , Gate Resistor ()  
g
Figure 19. Typical Reverse Recovery  
Energy Loss vs. IC  
Figure 20. Typical Reverse Recovery  
Energy Loss vs. RG  
www.onsemi.com  
8
NXH450B100H4Q2F2, NXH450B100H4Q2F2PGR  
TYPICAL CHARACTERISTICS IGBT, INVERSE DIODE AND BOOST DIODE (CONTINUED)  
I , Collector Current (A)  
C
R , Gate Resistor ()  
g
Figure 21. Typical Reverse  
Recovery Charge vs. IC  
Figure 22. Typical Reverse  
Recovery Charge vs. RG  
I , Collector Current (A)  
C
R , Gate Resistor ()  
g
Figure 24. Typical Reverse  
Recovery Peak Current vs. RG  
Figure 23. Typical Reverse  
Recovery Peak Current vs. IC  
I , Collector Current (A)  
C
R , Gate Resistor ()  
g
Figure 25. Typical di/dt Current  
Slope vs. IC  
Figure 26. Typical di/dt Current  
Slope vs. RG  
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9
NXH450B100H4Q2F2, NXH450B100H4Q2F2PGR  
TYPICAL CHARACTERISTICS IGBT, INVERSE DIODE AND BOOST DIODE (CONTINUED)  
Pulse on Time (s)  
Figure 27. Transient Thermal Impedance IGBT  
Pulse on Time (s)  
Figure 28. Transient Thermal Impedance Inverse Diode  
Pulse on Time (s)  
Figure 29. Transient Thermal Impedance Boost Diode  
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10  
NXH450B100H4Q2F2, NXH450B100H4Q2F2PGR  
TYPICAL CHARACTERISTICS IGBT, INVERSE DIODE AND BOOST DIODE (CONTINUED)  
V , CollectorEmitter Voltage (V)  
CE  
V , CollectorEmitter Voltage (V)  
CE  
Figure 30. Forward Safe  
Operating Area  
Figure 31. Reverse Safe  
Operating Area  
100000  
10000  
1000  
100  
10  
1
0.1  
0.1  
10  
1000  
Qg (nC)  
V , Collector to Emitter Voltage (V)  
CE  
Figure 33. Capacitance Charge  
Figure 32. Gate Voltage vs. Gate Charge  
Temperature (°C)  
Figure 34. NTC Characteristics  
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11  
MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
PIM56, 93x47 (PRESSFIT)  
CASE 180BG  
ISSUE O  
DATE 31 JUL 2019  
GENERIC  
MARKING DIAGRAM*  
XXXXXXXXXXXXXXXXXXXXXG  
ATYYWW  
XXXXX = Specific Device Code  
G
= PbFree Package  
AT  
= Assembly & Test Site Code  
YYWW= Year and Work Week Code  
*This information is generic. Please refer to device data  
sheet for actual part marking. PbFree indicator, “G” or  
microdot G”, may or may not be present. Some products  
may not follow the Generic Marking.  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON09950H  
PIM56 93X47 (PRESS FIT)  
PAGE 1 OF 1  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
© Semiconductor Components Industries, LLC, 2019  
www.onsemi.com  
MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
PIM56, 93x47 (SOLDER PIN)  
CASE 180BR  
ISSUE O  
DATE 03 DEC 2019  
GENERIC  
MARKING DIAGRAM*  
XXXXXXXXXXXXXXXXXXXXXG  
ATYYWW  
XXXXX = Specific Device Code  
G
= PbFree Package  
AT  
= Assembly & Test Site Code  
YYWW= Year and Work Week Code  
*This information is generic. Please refer to device data  
sheet for actual part marking. PbFree indicator, “G” or  
microdot G”, may or may not be present. Some products  
may not follow the Generic Marking.  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON15231H  
PIM56 93X47 (SOLDER PIN)  
PAGE 1 OF 1  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
© Semiconductor Components Industries, LLC, 2019  
www.onsemi.com  
onsemi,  
, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates  
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