SMG2314NE [SECOS]

N-Channel Enhancement Mode Mos.FET; N沟道增强模式Mos.FET
SMG2314NE
型号: SMG2314NE
厂家: SECOS HALBLEITERTECHNOLOGIE GMBH    SECOS HALBLEITERTECHNOLOGIE GMBH
描述:

N-Channel Enhancement Mode Mos.FET
N沟道增强模式Mos.FET

文件: 总2页 (文件大小:145K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SMG2314NE  
4 A, 20 V, RDS(ON) 32 m  
N-Channel Enhancement Mode Mos.FET  
Elektronische Bauelemente  
RoHS Compliant Product  
A suffix of “-C” specifies halogen and lead-free  
DESCRIPTION  
SC-59  
These miniature surface mount MOSFETs utilize High Cell  
Density process. Low RDS(on) assures minimal power loss and  
conserves energy, making this device ideal for use in power  
management circuitry. Typical applications are PWMDC-DC  
converters, power management in portable and battery-powered  
products such as computers, printers, battery charger,  
A
L
3
3
Top View  
C B  
1
1
2
2
K
F
E
telecommunication power system, and telephones power system.  
D
FEATURES  
H
J
G
Low RDS(on) provides higher efficiency and extends  
battery life.  
Miniature SC-59 surface mount package saves  
board space.  
Millimeter  
Millimeter  
Min. Max.  
0.10 REF.  
0.40 REF.  
High power and current handling capability.  
MLow side high current DC-DC Converter applications  
REF.  
REF.  
Min.  
Max.  
3.10  
3.00  
1.70  
1.40  
A
B
C
D
2.70  
2.25  
1.30  
1.00  
G
H
J
0.10  
0.45  
0.20  
0.55  
K
E
F
1.70  
0.35  
2.30  
0.50  
L
0.85  
1.15  
PACKAGE INFORMATION  
Package  
MPQ  
3K  
LeaderSize  
SC-59  
7’ inch  
ESD  
Protection Diode  
2KV  
ABSOLUTE MAXIMUM RATINGS(TA=25°C UNLESS OTHERWISE NOTED)  
Ratings  
Maximum  
20  
Parameter  
Symbol  
Unit  
Drain-Source Voltage  
Gate-Source Voltage  
VDS  
VGS  
V
V
±12  
ID @ TA=25°C  
ID @ TA=70°C  
4.0  
3.1  
±20  
1.6  
A
Continuous Drain Current 1  
ID  
A
Pulsed Drain Current 2  
Continuous Source Current (Diode Conduction) 1  
Power Dissipation 1  
IDM  
IS  
A
A
PD @ TA=25°C  
PD @ TA=70°C  
1.3  
0.8  
-55 ~ 150  
W
W
°C  
PD  
Operating Junction and Storage Temperature Range  
Tj, Tstg  
THERMAL RESISTANCE RATINGS  
Symbol  
Parameter  
Maximum  
Unit  
t 5 sec  
RJA  
100  
166  
Maximum Junction to Ambient 1  
°C / W  
Steady State  
Notes  
1
2
Surface Mounted on 1” x 1” FR4 Board.  
Pulse width limited by maximum junction temperature.  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
27-Jan-2011 Rev. A  
Page 1 of 2  
SMG2314NE  
4 A, 20 V, RDS(ON) 32 m  
N-Channel Enhancement Mode Mos.FET  
Elektronische Bauelemente  
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise specified)  
Parameter  
Gate-Threshold Voltage  
Gate-Body Leakage  
Symbol Min. Typ. Max. Unit  
Test Conditions  
VGS(th)  
IGSS  
0.7  
-
-
±100  
1
V
VDS=VGS, ID= 250uA  
-
-
-
nA VDS= 0V, VGS= ±8V  
-
VDS= 16V, VGS= 0V  
uA  
Zero Gate Voltage Drain Current  
On-State Drain Current 1  
IDSS  
-
-
10  
-
VDS= 16V, VGS= 0V, TJ= 55°C  
ID(on)  
10  
-
-
-
A
VDS = 5V, VGS= 4.5V  
VGS= 4.5V, ID= 4.6A  
VGS= 2.5V, ID= 3.9A  
VDS= 10V, ID= 4.0A  
IS= 1.6A, VGS= 0V  
32  
44  
-
Drain-Source On-Resistance 1  
RDS(ON)  
m  
-
-
Forward Transconductance 1  
Diode Forward Voltage  
gfs  
-
11.3  
0.75  
S
V
VSD  
-
-
Dynamic 2  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
Turn-on Delay Time  
Rise Time  
Qg  
Qgs  
Qgd  
Td(on)  
Tr  
-
-
-
-
-
-
-
13.4  
0.9  
2.0  
8
-
-
-
-
-
-
-
VDS= 10V, VGS= 4.5V,  
ID= 4.0A  
nC  
24  
VDD= 10V, VGEN= 4.5V,  
RL= 15, ID= 1A  
Turn-off Delay Time  
Fall Time  
Td(off)  
Tf  
35  
nS  
10  
Source-Ddrain Reverse  
Recovery Time  
Trr  
-
40  
-
IF=1.6A, di/dt =100 A/uS  
Notes  
1
2
Pulse testPW 300 us duty cycle 2%.  
Guaranteed by design, not subject to production testing.  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
27-Jan-2011 Rev. A  
Page 2 of 2  

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