SSM6E01TU [TOSHIBA]

Load Switch Applications; 负载开关应用
SSM6E01TU
型号: SSM6E01TU
厂家: TOSHIBA    TOSHIBA
描述:

Load Switch Applications
负载开关应用

晶体 开关 小信号场效应晶体管 光电二极管
文件: 总9页 (文件大小:180K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
                                                              
                                                              
                                                              
                                                              
                                                                                        
                                                                                        
SSM6E01TU  
TOSHIBA Multi-Chip Device  
Silicon P-Channel MOS Type (U-MOS II) + N-Channel MOS Type (Planer)  
SSM6E01TU  
Load Switch Applications  
Unit: mm  
·
·
P-channel MOSFET and N-channel MOSFET incorporated into one  
package.  
Low power dissipation due to P-channel MOSFET that features low  
R
and low-voltage operation  
DS (ON)  
Q1 Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-Source voltage  
Symbol  
Rating  
Unit  
V
-12  
±12  
V
V
DS  
Gate-Source voltage  
V
GSS  
DC  
I
-1.0  
-2.0  
D
Drain current  
A
Pulse  
I
(Note 2)  
DP  
Q2 Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-Source voltage  
Symbol  
Rating  
Unit  
JEDEC  
V
20  
10  
V
V
DS  
JEITA  
Gate-Source voltage  
V
GSS  
TOSHIBA  
DC  
I
0.05  
0.2  
D
Drain current  
A
Weight: 7.0 mg (typ.)  
Pulse  
I
(Note 2)  
DP  
Maximum Ratings (Q1, Q2 common) (Ta = 25°C)  
Characteristics  
Symbol  
(Note 1)  
Rating  
Unit  
Drain power dissipation  
Channel temperature  
P
0.5  
150  
W
°C  
°C  
D
T
ch  
Storage temperature range  
T
-55~150  
stg  
Note 1: Mounted on an FR4 board (25.4 mm ´ 25.4 mm ´ 1.6 t, Cu pad: 645 mm2)  
Note 2: Pulse width limited by maximum channel temperature.  
Marking  
Equivalent Circuit (top view)  
6
5
4
3
6
5
4
Q1  
Q2  
KTA  
1
2
1
2
3
1
2003-01-16  
SSM6E01TU  
Handling Precaution  
This product has a MOS structure and is sensitive to electrostatic discharge. When handling individual devices  
(that have not yet been mounted on a PCB), ensure that the environment is protected against static electricity.  
Operators should wear anti-static clothing, containers and other objects which may come into direct contact with  
devices should be made of anti-static materials.  
Thermal resistance R  
and drain power dissipation PD vary depending on board material, board area, board  
th (j-a)  
thickness and pad area. When using this device, please take heat dissipation into consideration.  
2
2003-01-16  
                                                                          
                                                                           
                                                                          
                                                                           
SSM6E01TU  
Q1 Electrical Characteristics (Ta = 25°C)  
Characteristics  
Forward voltage (diode)  
Symbol  
Test Condition  
= 1.0 A, V = 0 V  
Min  
Typ.  
Max  
Unit  
V
I
¾
¾
¾
¾
1.2  
±1  
V
mA  
V
DSF  
DR  
GS  
Gate leakage current  
I
V
= ±10 V, V = 0  
GS DS  
GSS  
Drain-Source breakdown voltage  
Drain cut-off current  
V
I
= -1 mA, V = 0  
GS  
-12  
¾
¾
¾
(BR) DSS  
D
I
V
V
V
= -12 V, V = 0  
GS  
¾
-1  
mA  
V
DSS  
DS  
DS  
DS  
Gate threshold voltage  
Forward transfer admittance  
V
= -3 V, I = -0.1 mA  
-0.4  
1.3  
¾
¾
-1.1  
¾
th  
D
|Y |  
fs  
= -3 V, I = -0.5 A  
(Note 3)  
(Note 3)  
2.5  
125  
180  
310  
S
D
I
I
= -0.5 A, V  
= -4 V  
160  
240  
¾
D
D
GS  
GS  
Drain-Source ON resistance  
R
mW  
DS (ON)  
= -0.5 A, V  
= -2.5 V (Note 3)  
= 0, f = 1 MHz  
¾
Input capacitance  
C
iss  
V
= -10 V, V  
¾
pF  
DS  
GS  
Note 3: Pulse test  
Q2 Electrical Characteristics (Ta = 25°C)  
Characteristics  
Gate leakage current  
Symbol  
Test Condition  
= 10 V, V = 0  
Min  
Typ.  
Max  
Unit  
I
V
¾
20  
¾
¾
¾
¾
¾
50  
4
15  
¾
1
mA  
V
GSS  
GS  
DS  
Drain-Source breakdown voltage  
Drain cut-off current  
V
I
= 0.1 mA, V  
= 0  
= 0  
(BR) DSS  
D
GS  
GS  
I
V
V
V
= 20 V, V  
mA  
V
DSS  
DS  
DS  
DS  
Gate threshold voltage  
Forward transfer admittance  
Drain-Source ON resistance  
Input capacitance  
V
= 3 V, I = 0.1 mA  
0.7  
25  
¾
1.3  
¾
10  
¾
1.3  
th  
D
|Y |  
fs  
= 3 V, I = 10 mA  
(Note 3)  
(Note 3)  
mS  
W
D
R
I
= 10 mA, V  
= 2.5 V  
GS  
DS (ON)  
D
C
iss  
V
V
= 3 V, V = 0, f = 1 MHz  
GS  
¾
11  
1.0  
pF  
MW  
DS  
GS  
Gate-Source resistance  
R
GS  
= 0~10 V  
0.7  
Note 3: Pulse test  
Precaution  
V
can be expressed as voltage between gate and source when low operating current value is I = ±100 mA for  
D
th  
this product. For normal switching operation, V  
requires higher voltage than V and V  
th GS (off)  
requires lower  
GS (on)  
voltage than V . (Relationship can be established as follows: V  
< V < V )  
th GS (on)  
th  
GS (off)  
Please take this into consideration for using the device. 2.5 V or higher is recommended for V  
on the N-channel MOSFET of this product.  
voltage to turn  
GS  
3
2003-01-16  
                                                             
                                                             
                                                                                           
                                                                                           
SSM6E01TU  
Load Switch Application  
Pch  
+Vdrop-  
Vin  
R1  
Vout  
IN  
OUT  
ON/OFF  
ON/OFF  
Nch  
1 MW  
Load Switch Ratings (Ta = 25°C)  
Characteristics  
Input voltage  
Symbol  
Rating  
Unit  
V
2.5~12  
2.5~10  
1
V
V
in  
ON/OFF voltage  
V
on/off  
Load current (DC)  
Load current (pulse)  
Channel temperature  
I
A
L
I
(Note 4)  
2
A
LP  
T
150  
°C  
ch  
Note 4: Pulse width limited by maximum channel temperature.  
Load Switch Electrical Characteristics (Ta = 25°C)  
Characteristics  
Leakage current  
Symbol  
Test Condition  
= 8 V, V = 0  
Min  
¾
Typ.  
¾
Max  
1
Unit  
I
V
V
mA  
FL  
in  
in  
ON/OFF  
= 3.0 V, V  
= 2.5 V,  
ON/OFF  
V
V
¾
0.09  
0.12  
DROP (1)  
DROP (2)  
I
= 0.5 A  
L
P-channel drop voltage  
N-channel drive voltage  
V
V
V
= 5.0 V, V  
= 2.5 V,  
in  
ON/OFF  
¾
0.13  
0.16  
1.3  
I
= 1.0 A  
L
V
V
= 3 V, I = 0.1 mA  
0.7  
¾
on/off  
DS  
D
4
2003-01-16  
SSM6E01TU  
Q1 (Pch MOSFET)  
I
– V  
I – V  
D GS  
D
DS  
-2  
-10000  
-1000  
-100  
-10  
-4 V  
Common source  
= -3 V  
-2.0 V  
V
DS  
-10 V  
-1.8 V  
-1.7 V  
-1.5  
-1  
Ta = 25°C  
-25°C  
100°C  
-1  
-0.5  
0
-0.1  
Common source  
Ta = 25°C  
-0.01  
0
-0.5  
-1  
-1.5  
-2  
0
-0.5  
-1  
-1.5  
-2  
-2.5  
Drain-Source voltage  
V
(V)  
Gate-Source voltage  
V
(V)  
DS  
GS  
R
– I  
R
– V  
DS (ON)  
D
DS (ON) GS  
0.5  
0.4  
0.3  
0.2  
0.1  
0
1
0.8  
0.6  
0.4  
0.2  
0
Common source  
Ta = 25°C  
Common source  
= -0.5 A  
I
D
-2.5 V  
25°C  
-4.0 V  
-1.5  
Ta = 100°C  
-8  
-25°C  
0
-0.5  
-1.0  
-2.0  
0
-2  
-4  
-6  
-10  
(V)  
-12  
Drain current  
I
D
(A)  
Gate-Source voltage  
V
GS  
R
Ta  
V
Ta  
th  
DS (ON)  
0.5  
0.4  
0.3  
0.2  
0.1  
0
-1  
-0.8  
-0.6  
-0.4  
-0.2  
0
Common source  
= -3 V  
Common source  
V
DS  
= -0.1 mA  
I
= -0.5 A  
D
I
D
-2.5 V  
-4 V  
-25  
0
25  
50  
75  
100  
125  
150  
-25  
0
25  
50  
75  
100  
125  
150  
Ambient temperature Ta (°C)  
Ambient temperature Ta (°C)  
5
2003-01-16  
SSM6E01TU  
Q1 (Pch MOSFET)  
ïY ï – I  
fs  
C – V  
DS  
D
10  
1
1000  
100  
10  
C
iss  
C
oss  
0.1  
0.01  
C
rss  
Common source  
= 0  
V
GS  
f = 1 MHz  
Ta = 25°C  
-0.1  
-1  
Drain-Source voltage  
-10  
-100  
-1  
-10  
-100  
-1000  
(mA)  
-10000  
Drain current  
I
D
V
(V)  
DS  
Dynamic input characteristics  
t – I  
D
-10  
500  
100  
Common source  
Common source  
= -1.0 A  
Ta = 25°C  
V
V
R
= -10 V  
= 0 to -2.5 V  
= 4.7 W  
DD  
GS  
G
I
D
-8  
-6  
-4  
-2  
0
Ta = 25°C  
t
off  
V
DD  
= -10 V  
t
f
t
on  
10  
5
0
2
4
6
8
t
r
Total gate charge Qg (nC)  
-0.01  
-0.1  
Drain current  
-1  
I
D
(A)  
I
– V  
DS  
DR  
-2  
-1.6  
-1.2  
-0.8  
-0.4  
0
Common source  
V
GS  
= 0 V  
D
Ta = 25°C  
G
S
0
0.2  
0.4  
0.6  
0.8  
1
Drain-Source voltage  
V
(V)  
DS  
6
2003-01-16  
SSM6E01TU  
Q2 (Nch MOSFET)  
I
– V  
I
– V (low-voltage area)  
D
DS  
D
DS  
100  
100  
80  
2.5  
2.0  
2.0  
4.0  
2.5  
2.2  
Common source  
Ta = 25°C  
80  
1.9  
Common source  
Ta = 25°C  
60  
40  
60  
40  
20  
0
1.8  
1.8  
1.6  
1.7  
1.6  
20  
0
V
= 1.4 V  
GS  
V
= 1.4 V  
GS  
0
2
4
6
8
10  
0
0.2  
0.4  
0.6  
0.8  
1.0  
Drain-Source voltage  
V
(V)  
Drain-Source voltage  
V
(V)  
DS  
DS  
I
– V  
I – V  
D GS  
DR  
DS  
100  
1000  
100  
10  
Common source  
= 0  
Common source  
V
GS  
V
DS  
= 3 V  
Ta = 25°C  
D
10  
1
G
I
DR  
Ta = 100°C  
1
0.1  
25°C  
S
-25°C  
0.1  
0.01  
0.01  
-0.2  
-0.4  
-0.6  
-0.8  
-1.0  
(V)  
-1.2  
0
0.5  
1
1.5  
2
2.5  
(V)  
3
0
Drain-Source voltage  
V
Gate-Source voltage  
V
GS  
DS  
ïY ï – I  
fs  
D
300  
100  
C – V  
DS  
Common source  
100  
V
= 3 V  
DS  
Ta = 25°C  
Common source  
= 0  
f = 1 MHz  
V
GS  
50  
30  
Ta = 25°C  
50  
30  
C
iss  
10  
C
oss  
5
3
10  
5
C
rss  
1
1
3
5
10  
30  
(mA)  
50  
100  
0.1  
0.3  
1
3
10  
30  
Drain current  
I
D
Drain-Source voltage  
V
(V)  
DS  
7
2003-01-16  
SSM6E01TU  
Q2 (Nch MOSFET)  
R
– I  
t – I  
D
DS (ON)  
D
10  
8
10000  
Common source  
Common source  
Ta = 25°C  
V
V
= 3 V  
= 0~2.5 V  
DD  
GS  
5000  
3000  
Ta = 25°C  
t
off  
1000  
6
4
2
0
t
f
500  
300  
2.5  
t
on  
100  
V
= 4 V  
GS  
t
r
50  
30  
0.1  
0.3  
1
3
10  
(mA)  
30  
100  
0
20  
40  
60  
80  
100  
Drain current  
I
D
Drain current  
I
D
(mA)  
R
Ta  
DS (ON)  
10  
8
Common source  
I
= 10 mA  
D
6
2.5  
4
V
GS  
= 4 V  
2
0
0
25  
50  
75  
100  
125  
150  
-25  
Ambient temperature Ta (°C)  
8
2003-01-16  
SSM6E01TU  
RESTRICTIONS ON PRODUCT USE  
000707EAA  
· TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc..  
· The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this  
document shall be made at the customer’s own risk.  
· The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other  
rights of the third parties which may result from its use. No license is granted by implication or otherwise under  
any intellectual property or other rights of TOSHIBA CORPORATION or others.  
· The information contained herein is subject to change without notice.  
9
2003-01-16  

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